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A new rotational angle sensor composed of two FBGs glued axially on a metal-rod surface driven bent by attraction of a magnetic disk is proposed. Whenever an external force is applied in the end of this sensor, these two FBGs undergo a strain caused by a shaft rotation to result in their central wavelength shifts respectively. This sensor can precisely to detect the random rotation angle in both static and dynamic conditions. The nice sensing performance including linear response, fine resolution, negligible hysteresis, and long-term stability are experimentally demonstrated.

This paper has successfully achieved a new type optomechanical rotational angle sensor which consists of two FBGs glued axially on a capillary surface that is driven bent by attraction of a magnetic disk. Whenever an input force exerts on the end of this sensor, these two FBGs undergo strain caused by shaft rotation and result in their central wavelength shifts respectively. This sensor can be used to accurately detect random rotation angle in both static and dynamic conditions except the maximum deviation of 0.876 deg from 195 deg. The excellent sensor characteristics including linear response, fine resolution, negligible hysteresis, and long-term stability are experimentally demonstrated.

A simple, small-size, compact and high-sensitivity refractive-index sensor composed of a short no-core fiber (NCF) about 20 mm in length sandwiched between two pieces of single-mode fibers is proposed in this paper. The index measurement is experimentally demonstrated with the sensitivity of 7792.85 nm/ RIU in the range from 1.440 to 1.454 and 227.14 nm/ RIU in the range from 1.300 to 1.430. This sensing mechanism is based on the induced multi-mode interfering wavelength shift in the no-core fiber when the reflective index of the fiber outside is changed.

A novel rotational-position sensor consists of two FBGs glued axially on a capillary surface and driven bent by attraction of a magnetic disk, which accurately detects random rotation angle in both static and dynamic conditions.

The interface operating based on MCU reading and writing TF card was analyzed, a new operating method of dual-TF card based on MCU reading and writing on information storing and acquisition equipment was proposed, the initial procedure of electric reset of TF card was introduced. SPI sync serial interface bus was used to connect the dual-TF card and information reading and writing of TF card. High reliability of information storing operating on information storing equipment was satisfied.

Parallelization of chemistry and drug discovery codes to leverage emerging High-Performance Computing (HPC) architectures is a difficult task. However, it is a task that is required for one to be able to simulate biologically important molecular systems which are not accessible with current technology. In addition to parallelizing existing chemistry and drug discovery codes, it is important to explore at the same time new methodologies that address limitations in methods currently being used for molecular simulations. In this study we combine speed and accuracy by parallelizing a new promising explicit polarization (X-Pol) method, which is a method that addresses several limitations in today's methodologies. The explicit polarization (X-Pol) method, also called the X-Pol potential, provides a method for treating both bonded and nonbonded interactions using electronic structure theory. Bonded interactions are treated by an iterative self-consistent field method, and nonbonded interactions are treated by electronic embedding. In this approach partial charges are obtained using electronic structure methods applied to the individual fragments. When the method is applied to a protein, the fragments are defined as peptide units. In our research we intend to use of peptide fragments as defined in the X-Pol method as the basic units for parallelization. The peptide fragments are mapped onto a HPC hybrid architecture where shared-memory processors are interconnected by a customized or standard network. In our method a pre-selected number of fragments are parallelized via shared-memory algorithms, while message-passing algorithms are used across processors for neighboring fragments.

A high-sensitivity refractive index sensor composed of a short piece of no-core fiber spliced between two single-mode fibers is experimentally demonstrated with the sensitivity of 7792.85 nm/RIU.

A novel optical-fiber sensor based on air-gap long-period fiber grating with a coated zinc-oxide thin-film is proposed for detecting the diallyl disulfide and thiol, which are the main volatile organic compounds ingredients of the pepper.

A circularly polarized (CP) patch antenna with gain enhancement is presented. This paper provides a technique to increase the CP gain of an antenna without changing its original configuration. A gain enhancement of 1.7 dBic is achieved by an additional suspended patch. First, we design a CP patch antenna, which works in the band of Wireless Local Area Network (WLAN) with an antenna gain of 10 dBic. Second, adding a suspended patch along the z-axis to the original antenna which the gain enhancement of the modified structure can be improved. The measured and simulated results are equivalent agreement, and they both show that the antenna gain is indeed improved about 1.7 dBic by adding a suspended patch.

This paper describes a study related to multiple ports remote debugger server. Multiple ports remote debugger server supports one parallel port and multiple serial ports. User could connect to target serial port and parallel port from one local workstation or multiple work-stations at the same time with serial cables or a parallel cable. All debugger communication ports could receive debug commands from hosts. When a remote debugger server returns data to host machine, it selects a port as a receiver to send out data automatically. If command comes from parallel port host, the parallel debug port will raise an interrupt to a remote debugger server. If a command comes from a serial port, the serial port will raise an interrupt to a remote debugger server. Multiple ports remote debug server is reliable, low cost, portable and efficient.

First failure data capture (FFDC) is a technology that is used to capture diagnostic information when errors occur. This information reduces the need to reproduce errors. FFDC involves all firmware components. The processes and techniques of FFDC are crucial to the success of an embedded system. With a good FFDC implementation, software engineers can collect diagnostic data quickly and fix defects without impacting customer's operation. One of the challengers with FFDC is collecting the useful data. There are cases where the volume of data collected is huge but only covers a short amount of time. In other cases, the collected data cover a long period time, but only gather a few variables or items. A new FFDC technique has been developed to capture useful data. This new FFDC technique captures very detail data for a short period of time and captures much less detail data for a long period of time. This paper first introduces three FFDC techniques. The three techniques are general dump, event trace and error log. Second, it analyzes the problems of current FFDC techniques. Third, it discusses a new FFDC technique. This new FFDC technique is low cost, efficient and good for data collection.

This paper introduces twelve defect detection techniques and describes a non-controlled experiment related to defect detection techniques to address the uncertainty of how to test an embedded software and find defects effectively. In this non-controlled experiment, three common testing techniques were applied to a large scale embedded system. This study is intended to evaluate different defect detection techniques that are actually used by software engineers using empirical software engineering method. The objective of empirical software engineering is to improve the software development processes and quality. This could be done by evaluating, comparing and controlling defect detection methods. This study is also intended to find a best method to reduce defects and increase the defect detection rate in a large scale embedded system, since defect detection is considered as one of the most costly development process in software development cycle