5 results on '"Ha, Tae Jung"'
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2. Cu cone inserted CBRAM device fabrication and its improved switching reliability induced by field concentration effect
3. Breakthrough of selector technology for cross-point 25-nm ReRAM
4. Improvement of characteristics of NbO2 selector and full integration of 4F2 2x-nm tech 1S1R ReRAM
5. Structure of mesoporous Al2O3 thin film obtained by surfactant templating
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