Search

Your search keyword '"H. Higuchi"' showing total 25 results

Search Constraints

Start Over You searched for: Author "H. Higuchi" Remove constraint Author: "H. Higuchi" Publisher ieee Remove constraint Publisher: ieee
25 results on '"H. Higuchi"'

Search Results

1. Deep learning acceleration in 14nm CMOS compatible ReRAM array: device, material and algorithm co-optimization

2. Nation-wide RTK-GPS based on FKP method and applications for human navigation and location based services

3. Network based high accuracy realtime GPS positioning for GCP correction of high resolution satellite imagery

5. Rate-adaptive sub-band coding for high-fidelity compression of very high resolution images

6. Large-area CdS/CdTe solar cell with highly transparent sintered CdS layer

7. Reliability of 680-nm window laser diodes at 50-100 mW CW operation

8. High performance DFB laser diodes with monolithically integrated waveguide lens

9. Planar selective re-growth around a dry-etched mesa along the [11~0] direction by addition of HCl during MOCVD growth

10. A soft error immune 0.35 μm PD-SOI SRAM technology compatible with bulk CMOS

11. Selective-area MOCVD growth for novel 1.3 μm DFB laser diodes with graded grating

12. Ultra-low chirp EAM-DFB-LD for 2.5 Gbps-700 km penalty-free transmission

13. MOCVD growth of heavily p-type doped InGaAs using bismethylcyclopentadienyl-beryllium

14. A 2 ns access, 285 MHz, two-port cache macro using double global bit-line pairs

15. Highly efficient large area thin film CdS/CdTe sub-module [solar cells]

16. Analysis and suppression of hysteretic behaviors in PD-SOI CMOS circuits

17. Thin-film CdS/CdTe solar cell with 15.05% efficiency

18. Sub-band coding with improved permutation codes for high fidelity image compression

19. Secondary Slow Trapping - A New Moisture Induced Instability Phenomenon in Scaled Cmos Devices

20. A Paradoxical Relationship between Width/Spacing of Aluminum Electrodes and Aluminum Corrosion

21. A 6ns 4Kb bipolar RAM using switched load resistor memory cell

22. Temperature Accelerated Estimation of MNOS Memory Reliability

23. Improvement of Moisture Resistance by Ion-Exchange Process

25. A New Bond Failure Wire Crater in Surface Mount Device

Catalog

Books, media, physical & digital resources