Search

This anthology contains contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The topics span from basic mechanisms for single-particle induced failures to applied tasks like developing websites to predict on-orbit single event failure rates using Monte Carlo radiation transport tools. [ABSTRACT FROM PUBLISHER]

The paper describes a novel detector for neutrons in the 1 to 20-MeV energy range with combined imaging and spectroscopic capabilities. The Fast Neutron Imaging Telescope (FNIT) was designed to detect solar neutrons from spacecraft deployed to the inner heliosphere. However, the potential application of this instrument to Special Nuclear Material (SNM) identification was also examined. In either case, neutron detection relies on double elastic neutron-proton (n-p) scattering in liquid scintillator. We optimized the design of FNIT through a combination of Monte Carlo simulations and lab measurements. We then assembled a scaled-down version of the full detector and assessed its performance by exposing it to a neutron beam and an SNM source. The results from these tests, which were used to characterize the response of the complete FNIT detector to fast neutrons, are presented herein. [ABSTRACT FROM AUTHOR]

Simulation of energy deposition in silicon by nuclear reactions is a crucial point for single event prediction tool development. In order to compare with the simulation of nuclear reactions, a silicon diode is irradiated by a 30 MeV and 63 MeV neutron beam and the energy deposited by each nuclear reaction is measured. Simulation of the ionizing energy deposition in the irradiated diode is performed by the Monte Carlo method using nuclear reaction databases. Neutron beam spectra and surrounding materials are taken into account. Experimental and simulated results are shown to be in good agreement. [ABSTRACT FROM PUBLISHER]

We describe SEMM-2, a new simulation system for the analysis of radiation-induced single event upsets which builds on the initial SEMM tool. Developed for the current and future CMOS technologies, SEMM-2 improves the generation of radian lion events. The atomic databases which describe ion energy loss with transport through device materials are generalized. Enhancements of the nuclear collision event generation include more accurate and efficient methods for generating elastic events and more. thorough treatment of inelastic processes. We present illustrative simulations where more accurately accounting for the metallization layers significantly impacts the simulated single event failure rate. [ABSTRACT FROM AUTHOR]

We report on a comparative study between two neutron facilities used for SEU studies, namely the Weapons Neutron Research facility at Los Alamos National Laboratory (a white neutron source), and the The Svedberg Laboratory in Sweden (a quasi- mono-energetic neutron source). The soft error rates generated from TSL are in excellent agreement with those from WNR. More- over, an increase of the SER for small process technologies was observed. [ABSTRACT FROM AUTHOR]

Presents information on a study that investigated the influence of the voltage scaling on complementary metal-oxide semiconductors (CMOS) static random access memory's (SRAM) soft error rate when irradiated by neutrons. Scaling in microprocessors; Model predictions; Experimental results and discussion.

Presents information on a study which measured the energy dependence of the neutron-induced single-event upset (NSEU) cross section for static random access memory. Experimental details; Experimental parameters for the SEU tests; Data analysis; Results.

Presents information on a study which focused on the in-flight measurements from static random access memories' (SRAM) single event upsets (SEU). In-depth look at the memory devices of the commerical airlines; Monitoring of the SEU, using a Component Upset Test Equipment; Methodology used to conduct the study; Results of the study.