Author: "Brockman, J. D." / Publisher: ieee - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Brockman, J. D."' showing total 1 results

Start Over Author "Brockman, J. D." Publisher ieee

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1. Thermal neutron-induced soft-error rates for flip-flop designs in 16-nm bulk FinFET technology

Author: Zhang, H., primary, Jiang, H., additional, Brockman, J. D., additional, Assis, T. R., additional, Fan, X., additional, Bhuva, B. L., additional, Narasimham, B., additional, Wen, S.-J., additional, and Wong, R., additional
Published: 2017
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