1. Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
- Author
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Ignacio Llamas-Garro, P. H. B. Cavalcanti Filho, L. M. da Silva, Manuelle R. T. de Oliveira, J. A. I. Araujo, M. S. Coutinho, and M. T. de Melo
- Subjects
Permittivity ,Materials science ,Article Subject ,Microwave sensors ,Acoustics ,Material characterizations ,02 engineering and technology ,High permittivity ,computer.software_genre ,Microwave devices ,01 natural sciences ,Measure (mathematics) ,Resonator ,Planar ,Sierpinski fractals ,0202 electrical engineering, electronic engineering, information engineering ,Range (statistics) ,T1-995 ,Computer software ,Sensitivity (control systems) ,Electrical and Electronic Engineering ,Instrumentation ,Technology (General) ,Planar sensors ,010401 analytical chemistry ,020206 networking & telecommunications ,Microwave resonators ,0104 chemical sciences ,Sierpinski triangle ,Simulation software ,NO KEYWORDS ,Fractals ,Control and Systems Engineering ,Simulator software ,Poles ,Permittivity values ,computer ,Frequency ranges ,Measured results - Abstract
This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results. © 2020 P. H. B. Cavalcanti Filho et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
- Published
- 2020