1. Influence of material migration on the mechanical integrity of inverted organic solar cells
- Author
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Dargie Hailu Deribew, Alberto Gregori, Thomas Chassé, Heiko Peisert, Roger C. Hiorns, Agnès Rivaton, Andreas Distler, Ahmed Allal, Hans-Joachim Egelhaaf, Christine Lartigau-Dagron, Aurélien Tournebize, Institut de Chimie de Clermont-Ferrand (ICCF), Centre National de la Recherche Scientifique (CNRS)-Université Clermont Auvergne [2017-2020] (UCA [2017-2020])-SIGMA Clermont (SIGMA Clermont), Institut für Physikalische und Theoretische Chemie, Universität Tübingen, Tübingen, Belectric OPV GmbH, Nürnberg, Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux (IPREM), Université de Pau et des Pays de l'Adour (UPPA)-Centre National de la Recherche Scientifique (CNRS), Eberhard Karls Universität Tübingen = Eberhard Karls University of Tuebingen, SIGMA Clermont (SIGMA Clermont)-Institut de Chimie du CNRS (INC)-Université Clermont Auvergne [2017-2020] (UCA [2017-2020])-Centre National de la Recherche Scientifique (CNRS), and Université de Pau et des Pays de l'Adour (UPPA)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Materials science ,Organic solar cell ,Renewable Energy, Sustainability and the Environment ,Photoemission spectroscopy ,Drop (liquid) ,Delamination ,Humidity ,02 engineering and technology ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,Accelerated aging ,0104 chemical sciences ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,PEDOT:PSS ,X-ray photoelectron spectroscopy ,[CHIM]Chemical Sciences ,Composite material ,PCBM diffusion ,0210 nano-technology ,Stability ,ComputingMilieux_MISCELLANEOUS ,ISOS-D3 - Abstract
International audience; We have identified modifications of material distributions in inverted organic solar cell structures during accelerated aging processes that are potentially linked to the loss of the mechanical integrity of the devices. Non-encapsulated devices were treated with ISOS-D-3 ageing (the so called damp heat exposure at 85 °C/85% room humidity in the dark). After performing pull-off tests, the exposed surfaces were analyzed by X-ray photoemission spectroscopy and atomic force microscopy. For fresh devices, the results revealed that mechanical failure occurs close to the PEDOT:PSS/P3HT:PCBM interface, in agreement with the literature. However, after a short exposure to damp heat, XPS investigations indicate an enrichment of PCBM at the PEDOT:PSS/P3HT:PCBM interface and a change in the 2 PEDOT:PSS surface composition. Both phenomena may explain the rapid drop in device performances and the increased tendency towards delamination.
- Published
- 2019
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