Author: "Alexandre Boulle" / Publisher: hal ccsd - Searchworks@Jio Institute Digital Library Search Results

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69 results on '"Alexandre Boulle"'

1. Monitoring of the recovery of ion-damaged 4H-SiC with in-situ synchrotron X-ray diffraction as a tool for strain-engineering

Author: Anusmita Chakravorty, Alexandre Boulle, Aurélien Debelle, Isabelle Monnet, Gouranga Manna, Pinku Saha, Mrinmay Kumar Mukhopadhyay, Debdulal Kabiraj, Inter-University Accelerator Centre, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physique des 2 Infinis Irène Joliot-Curie (IJCLab), Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Centre de recherche sur les Ions, les MAtériaux et la Photonique (CIMAP - UMR 6252), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Matériaux, Défauts et IRradiations (MADIR), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), Chemistry and Physics of Materials Unit [Bangalore, India], and Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR)
Subjects: 4H-SiC, Ion-irradiation, Mechanics of Materials, Mechanical Engineering, Thermal recovery, Synchrotron single-crystal XRD, General Materials Science, lattice damage, [CHIM.MATE]Chemical Sciences/Material chemistry, Strain-engineering
Abstract: International audience; In-situ thermal annealing (673-1273 K) during X-ray diffraction synchrotron measurements was performed to monitor the strain level as a proxy to follow the recovery of 300 keV Ar ion irradiated 4H-SiC single crystals. Results show that, when exposed to Ar ions at a fluence of 6.7 × 10 14 ions/cm 2 (0.7 dpa), the material suffers a maximum strain of 12% that reduces to 2% after the final anneal at 1273 K. In the same time, the disorder derived from the XRD data also demonstrates a thermal recovery of the crystalline structure. Hence, this work presents ion irradiation as a means to induce specific crystalline order and depth-controlled strain states within a few 100s of nm window in 4H-SiC.
Published: 2022
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2. Structural and electrical properties of high-performance vanadium dioxide thin layers obtained by reactive magnetron sputtering

Author: Eduard-Nicolae Sirjita, Alexandre Boulle, Jean-Christophe Orlianges, Richard Mayet, Aurelian Crunteanu, XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut Matériaux Procédés Environnement Ouvrages (IMPEO), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut Matériaux Procédés Environnement Ouvrages (IMPEO), Université de Limoges (UNILIM)-Université de Limoges (UNILIM), This work benefited from government support managed by the National Research Agency under the Investments for the future program with the reference ANR-10-LABX-0074-01 Sigma-LIM. The authors acknowledge support from the PETACom FET Open H2020 grant number 829153 and the Femto-VO2 Project (Nouvelle-Aquitaine region)., ANR-10-LABX-0074,Sigma-LIM,From specific ceramic materials and components to integrated, secured and intelligent communication systems(2010), and European Project: 712590,H2020 FET Open 'Technologies futures et émergentes',829153,PETACom(2019)
Subjects: Vanadium Dioxide, Metal-insulator transition, Materials Chemistry, Metals and Alloys, Surfaces and Interfaces, [CHIM.MATE]Chemical Sciences/Material chemistry, Reactive magnetron sputtering, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials
Abstract: International audience; Epitaxial vanadium dioxide (VO2) films exhibiting an abrupt metal-insulator transition with resistivity ratios of five orders of magnitude have been grown on (001)-oriented sapphire substrates by reactive magnetron sputtering. The influence of deposition and annealing temperature on the structure and morphology of the layers are discussed as well as their impact on the films' electrical properties. Thus, the VO2 layers obtained using the optimal experimental conditions have electrical resistivity ratios over 10 5 and can be obtained on substrates as large as three-inch in diameter. The combination of the scalability of magnetron sputtering and the high quality of the films enables the large-scale industrial applications of high quality VO2 layers.
Published: 2022
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3. Disordering kinetics in monocrystalline and epitaxial Si upon energy deposition induced by dual-beam ion irradiation

Author: O. Najjar, Aurélien Debelle, C. Cabet, Alexandre Boulle, E. Olebunne, Lionel Thomé, F. Pallier, Gaëlle Gutierrez, Frédérico Garrido, Laboratoire de Physique des 2 Infinis Irène Joliot-Curie (IJCLab), Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Service de recherches de métallurgie physique (SRMP), Département des Matériaux pour le Nucléaire (DMN), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and An-Najah National University
Subjects: 010302 applied physics, Materials science, Thin layers, Annealing (metallurgy), Analytical chemistry, 02 engineering and technology, General Chemistry, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, 01 natural sciences, 7. Clean energy, Fluence, Ion, Monocrystalline silicon, Crystallinity, 0103 physical sciences, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], General Materials Science, Irradiation, 0210 nano-technology
Abstract: International audience; In this work, the effect on the amorphization process of the simultaneous electronic (Se) and nuclear (Sn) energy deposition occurring upon dual-beam irradiation experiments was studied in both bulk Si single-crystals (Si-b) and epitaxial Si thin layers (Si-tl). For this purpose, 900 keV I (for Sn) and 27 MeV Fe (for Se) ions were used at different fluences in order to get complete disordering kinetics. These latter were determined through the monitoring of both the disorder fraction, obtained via Rutherford backscattering spectrometry in channeling experiments and the elastic strain derived from X-ray diffraction measurements. Raman spectroscopy 2D-maps were also recorded to support the results of the two other techniques. RBS/C data indicate that Sn irradiation alone leads to full amorphization of the irradiated region in both Si-b and Si-tl at a fluence of 1.5 × 1014 cm−2. In contrast, during the dual-beam irradiation (Sn & Se), such a complete phase transformation is prevented up to a fluence of 3 × 1014 cm−2. Similarly, the maximum elastic strain developing before the loss of crystallinity reaches a maximum of ~ 1% at 1.5 × 1014 cm−2, but it remains below 0.2% at the same fluence in the Sn & Se regime for which full amorphization is not detected. These results indicate that the electronic energy deposition induces a significant dynamic annealing of the damage created by the nuclear energy loss, and this annealing occurs over the entire investigated fluence range (i.e., up to 3 × 1014 cm−2). The annealing efficiency is shown to be lower for Si-tl, as demonstrated by the disorder and strain values that are always larger than for the bulk counterpart.
Published: 2021
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4. Nacre-like alumina composites based on heteroaggregation

Author: Fabrice Rossignol, Sylvain Deville, Arnaud Videcoq, Hassan Saad, Alexandre Boulle, Manuella Cerbelaud, Mariana Muňoz, Sylvain Meille, Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Synthèse et Fonctionnalisation de Céramiques (LSFC), Saint Gobain-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Matériaux, ingénierie et science [Villeurbanne] (MATEIS), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Liquides et interfaces (L&I), Institut Lumière Matière [Villeurbanne] (ILM), Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon, and ANR-16-CE08-0006,BICuIT,Bioinspired Structural Ceramic Composite(2016)
Subjects: Toughness, Nacre-like composite, Materials science, Sintering, Platelet alignment, 02 engineering and technology, 01 natural sciences, Colloid, [SPI]Engineering Sciences [physics], Settling, 0103 physical sciences, Materials Chemistry, medicine, [CHIM]Chemical Sciences, Ceramic, Anisotropic particles, Composite material, 010302 applied physics, [PHYS]Physics [physics], Freeze-granulation, Stiffness, 021001 nanoscience & nanotechnology, Microstructure, visual_art, Ceramics and Composites, visual_art.visual_art_medium, Heteroaggregation, medicine.symptom, 0210 nano-technology
Abstract: High strength and high toughness are usually mutually exclusive in materials. Among all material classes, ceramics exhibit a high stiffness and strength, but they present a limited plastic deformation, which results in a moderate toughness. However, tough ceramics have been obtained using anisotropic particles organized in a "brick and mortar" microstructure, inspired by the structure of the natural nacre. Here, we propose to build nacre-like ceramic composites from colloidal suspensions using heteroaggregation of particles. Two different shaping processes are used: direct settling of suspensions or freeze-granulation. After sintering, in both cases, the platelets alignment is very good, close to that of platelets in natural nacre, with a slightly better one noted for direct settling. Despite a better platelet alignment, the toughness is lower than in previous studies showing that further improvement of the interfacial phases present in the material must now be considered to reinforce its mechanical behavior.
Published: 2020
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5. Phase Change Materials with Tunable Optical and Electrical Properties for Photonics and THz Programmable (Meta)devices

Author: Alexandre Boulle, Jean-Christophe Orlianges, Aurelian Crunteanu, Georges Humbert, Annie Bessaudou, RF-ELITE : RF-Electronique Imprimée pour les Télécommunications et l'Energie (XLIM-RFEI), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Photonique Fibre et Sources Cohérentes (XLIM-PHOT), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and CRUNTEANU, Aurelian
Subjects: Phase transition, Materials science, business.industry, Chalcogenide, Terahertz radiation, [SPI] Engineering Sciences [physics], Nonlinear optics, 02 engineering and technology, 01 natural sciences, Optical switch, Optical bistability, 010309 optics, chemistry.chemical_compound, [SPI]Engineering Sciences [physics], 020210 optoelectronics & photonics, chemistry, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Photonics, business, Optical filter, ComputingMilieux_MISCELLANEOUS
Abstract: We present our current researches on phase transition materials (vanadium dioxide, VO2) performing a thermally- or electrically-triggered metal-insulator transition and on chalcogenide amorphous-to-crystalline phase change materials like GeTe or Ge 2 Sb 2 Te 5 and we will focus on their tunable electrical and optical properties for applications in different domains spanning from DC to millimeter waves, THz and optics
Published: 2020

6. Symmetry degeneration and room temperature ferroelectricity in ion-irradiated SrTiO 3

Author: Jong Keum, Haizhou Xue, Fuxiang Zhang, William J. Weber, Alexandre Boulle, Yanwen Zhang, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, Condensed matter physics, Phonon, 02 engineering and technology, Electron, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 7. Clean energy, 01 natural sciences, Ferroelectricity, Ion, symbols.namesake, 0103 physical sciences, X-ray crystallography, symbols, General Materials Science, Irradiation, Thin film, 010306 general physics, 0210 nano-technology, Raman spectroscopy, ComputingMilieux_MISCELLANEOUS
Abstract: Polar phonon modes associated with room temperature ferroelectricity are observed in SrTiO3 single crystals irradiated with Ti ions. Quantitative strain analysis reveals that irradiation-induced out-of-plane strain drives the centrosymmetric cubic SrTiO3 to a tetragonal-like structure in the maximum damaged region. Energy transfer from ions to electrons during ion irradiation yields defects in SrTiO3 that also plays an important role for the room temperature ferroelectricity. Different from thin film techniques, the ferroelectricity in the ion irradiated SrTiO3 can occur for much larger thicknesses, depending on the energy and type of ion.
Published: 2020
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7. Comparison of neutron and ion irradiation induced lattice parameter changes in Ni and MgO single crystals

Author: Alexandre Boulle, Aurélien Debelle, Jerome Bourcois, Xin Jin, Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physique des 2 Infinis Irène Joliot-Curie (IJCLab), Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, Diffraction, Condensed Matter - Materials Science, Nuclear and High Energy Physics, Materials science, 02 engineering and technology, 021001 nanoscience & nanotechnology, 7. Clean energy, 01 natural sciences, Molecular physics, Ion, Lattice constant, Recoil, Nuclear Energy and Engineering, Lattice (order), 0103 physical sciences, Atom, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], General Materials Science, Neutron, Irradiation, 0210 nano-technology
Abstract: Data, available in the literature, of lattice parameter changes (i.e. elastic strain) in Ni and MgO single crystals neutron-irradiated in nuclear reactors are tentatively reproduced using ad hoc ion irradiation experiments. The nature and energy of the ions were selected so that their weighted average recoil spectrum matches at best that of the neutron spectrum inside the reactor. The ion fluence was calculated to obtain similar displacement per atom (dpa) levels. The lattice parameters of the irradiated samples were determined using high-resolution X-ray diffraction. We show that, for Ni, it is not possible to reproduce the neutron data because no lattice parameter change is measured after ion irradiation. Main reasons for this failure are the low dpa levels, the small damaged volume and the presence of a complex defect spectrum that leads to a net zero strain. On the contrary, for MgO, which is more prone to exhibiting high strain levels upon irradiation, a very close lattice parameter change buildup is obtained between neutron and ion irradiations, providing that the ion irradiation temperature is significantly increased (by ∼473 K).
Published: 2020
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8. Analysis of strain and disordering kinetics based on combined RBS-channeling and X-ray diffraction atomic-scale modelling

Author: Xin Jin, Jean-Paul Crocombette, Alexandre Boulle, Aurélien Debelle, Alain Chartier, Laboratoire de Physique des 2 Infinis Irène Joliot-Curie (IJCLab), Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Service de la Corrosion et du Comportement des Matériaux dans leur Environnement (SCCME), Département de Physico-Chimie (DPC), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Service de recherches de métallurgie physique (SRMP), and Département des Matériaux pour le Nucléaire (DMN)
Subjects: Diffraction, Materials science, Polymers and Plastics, 02 engineering and technology, Channelling, 01 natural sciences, Atomic units, X-ray diffraction (XRD), 0103 physical sciences, Radiative transfer, Microelectronics, Absolute scale, 010302 applied physics, business.industry, Molecular dynamics simulations, Metals and Alloys, Experimental data, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, Electronic, Optical and Magnetic Materials, Computational physics, Ceramics and Composites, Defects, 0210 nano-technology, business, [CHIM.RADIO]Chemical Sciences/Radiochemistry, RBS/C, Irradiation effect
Abstract: International audience; Ion beams delivered by particle accelerators are routinely used to emulate harsh, radiative environments and they also constitute the foundations of the modern microelectronics industry. To characterize irradiated materials, numerous experimental and computational techniques can be implemented, but it is extremely difficult to effectively intertwine them, and to compare the associated data. In the present work, we present an integrated, experimental and computational approach that uses a same set of molecular dynamics simulations to generate signals of Rutherford backscattering spectrometry in channelling condition and X-ray diffraction, with UO2 as a test-case material. From these signals, parameters to monitor the damage level are computed, compared and confronted with experimental data. Although the evolution of the strain and disordering kinetics obtained by simulations differ on an absolute scale from those obtained experimentally (a discrepancy inherent to the method used to generate the atomic-scale data), a very good relative agreement is obtained, which demonstrates the validity of the approach, hence providing a new tool for the fine study of irradiation effects in materials.
Published: 2020
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9. RaDMaX online: a web-based program for the determination of strain and damage profiles in irradiated crystals using X-ray diffraction

Author: Alexandre Boulle, Vincent Mergnac, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and Boulle, Alexandre
Subjects: Diffraction, Web development, Computer science, FOS: Physical sciences, 02 engineering and technology, 01 natural sciences, General Biochemistry, Genetics and Molecular Biology, Software, Computer graphics (images), 0103 physical sciences, Web application, ComputingMilieux_MISCELLANEOUS, computer.programming_language, 010302 applied physics, Web browser, [CHIM.MATE] Chemical Sciences/Material chemistry, Condensed Matter - Materials Science, business.industry, Materials Science (cond-mat.mtrl-sci), [CHIM.MATE]Chemical Sciences/Material chemistry, Python (programming language), 021001 nanoscience & nanotechnology, [PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], X-ray crystallography, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], The Internet, 0210 nano-technology, business, computer
Abstract: RaDMaX online is a major update to the previously published RaDMaX (radiation damage in materials analysed with X-ray diffraction) software [Souilah, Boulle & Debelle (2016). J. Appl. Cryst. 49, 311–316]. This program features a user-friendly interface that allows retrieval of strain and disorder depth profiles in irradiated crystals from the simulation of X-ray diffraction data recorded in symmetrical θ/2θ mode. As compared with its predecessor, RaDMaX online has been entirely rewritten in order to be able to run within a simple web browser, therefore avoiding the necessity to install any programming environment on the users' computers. The RaDMaX online web application is written in Python and developed within a Jupyter notebook implementing graphical widgets and interactive plots. RaDMaX online is free and open source and can be accessed on the internet at https://aboulle.github.io/RaDMaX-online/.
Published: 2019
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10. Texture and interface characterization of iridium thin films grown on MgO substrates with different orientations

Author: Catalin Constantinescu, L. Nedelcu, Laure Huitema, Marian Gabriel Banciu, Alexandre Boulle, Aurelian Crunteanu, Lucian Trupina, National Institute for Materials Physics - NIMP (ROMANIA), RF-ELITE : RF-Electronique Imprimée pour les Télécommunications et l'Energie (XLIM-RFEI), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Systèmes RF (XLIM-SRF), IRCER - Axe 2 : procédés plasmas et lasers (IRCER-AXE2), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3)
Subjects: Materials science, Scanning electron microscope, thin film, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, lattice distortion, Epitaxy, 01 natural sciences, Mosaicity, [SPI.MAT]Engineering Sciences [physics]/Materials, 0103 physical sciences, General Materials Science, mosaicity, Iridium, Thin film, 010302 applied physics, Mechanical Engineering, epitaxy, Sputter deposition, iridium, 021001 nanoscience & nanotechnology, Surface energy, chemistry, Mechanics of Materials, Transmission electron microscopy, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], interface, 0210 nano-technology, texturation
Abstract: International audience; Iridium thin films are grown by direct-current plasma magnetron sputtering, on MgO single crystal substrates with various surface orientation, i.e. (100), (111) and (110). The surface morphology, the crystalline properties of the films, and the substrate-thin film interface, are investigated by atomic force microscopy (AFM), X-ray diffraction (XRD), focused ion beam scanning electron microscopy (FIB-SEM), and high-resolution transmission electron microscopy (HR-TEM), respectively. The results reveal that hetero-epitaxial thin films with different crystallographic orientation and notable atomic scale smooth surface are obtained. From the XRD analysis the following epitaxial relations are obtained: i) (100) Ir || (100) MgO out-of-plane and [001] Ir || [001] MgO in-plane for Ir grown on MgO(100), ii) (110) Ir || (110) MgO out-of-plane and [1-10] Ir || [1-10] MgO in-plane for Ir grown on MgO(110) and iii) (111) Ir || (111) MgO out-of-plane and two variants for in-plane orientation [1-10] Ir || [1-10] MgO and [1-10] Ir || [10-1] MgO , respectively for Ir grown on MgO(111). Because of the large misfit strain (9.7%), the thin films are found to grow in a strain-relaxed state with the formation of geometrical misfit dislocations with a ~2.8 nm spacing, whereas thermal strain is stored upon cooling down from the growth temperature (600 °C). The best structural characteristics are obtained for the (111) oriented films with a mosaicity of 0.3° and vanishingly small lattice distortions. The (100)-and (110)-oriented films exhibit mosaicities of ̴ 1.2° and lattice distortions of ̴ 1% which can be explained by the larger surface energy of these planes as compared to (111).
Published: 2019
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11. High-performance Python for crystallographic computing

Author: Alexandre Boulle, Jérôme Kieffer, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and European Synchrotron Radiation Facility (ESRF)
Subjects: [INFO.INFO-PL]Computer Science [cs]/Programming Languages [cs.PL], Lift (data mining), Computer science, NumPy, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, Python (programming language), 021001 nanoscience & nanotechnology, 010403 inorganic & nuclear chemistry, computer.software_genre, 01 natural sciences, General Biochemistry, Genetics and Molecular Biology, 0104 chemical sciences, Crystallography, Python language, [CHIM.CRIS]Chemical Sciences/Cristallography, Numerical computing, Compiler, [INFO.INFO-DC]Computer Science [cs]/Distributed, Parallel, and Cluster Computing [cs.DC], 0210 nano-technology, computer, Implementation, De facto standard, computer.programming_language
Abstract: The Python programming language, combined with the numerical computing library NumPy and the scientific computing library SciPy, has become the de facto standard for scientific computing in a variety of fields. This popularity is mainly due to the ease with which a Python program can be written and executed (easy syntax, dynamical typing, no compilation etc.), coupled with the existence of a large number of specialized third-party libraries that aim to lift all the limitations of the raw Python language. NumPy introduces vector programming, improving execution speeds, whereas SciPy brings a wealth of highly optimized and reliable scientific functions. There are cases, however, where vector programming alone is not sufficient to reach optimal performance. This issue is addressed with dedicated compilers that aim to translate Python code into native and statically typed code with support for the multi-core architectures of modern processors. In the present article it is shown how these approaches can be efficiently used to tackle different problems, with increasing complexity, that are relevant to crystallography: the 2D Laue function, scattering from a strained 2D crystal, scattering from 3D nanocrystals and, finally, diffraction from films and multilayers. For each case, detailed implementations and explanations of the functioning of the algorithms are provided. Different Python compilers (namely NumExpr, Numba, Pythran and Cython) are used to improve performance and are benchmarked against state-of-the-art NumPy implementations. All examples are also provided as commented and didactic Python (Jupyter) notebooks that can be used as starting points for crystallographers curious to enter the Python ecosystem or wishing to accelerate their existing codes.
Published: 2019
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12. Defects and mechanical properties in weakly damaged Si ion implanted GaAs

Author: Markus Rettenmayr, E. Schmidt, Elke Wendler, R. Loetzsch, Aurélien Debelle, Andreas Undisz, Giuseppe Zollo, Alexandre Boulle, P. Kutza, Ingo Uschmann, Fabrizio Gala, Sascha Creutzburg, Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), and Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, [PHYS]Physics [physics], Materials science, GaAs, Semiconductors I: bulk, 02 engineering and technology, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, Microstructure, 01 natural sciences, Crystallographic defect, Molecular physics, radiation damage, GaAs, defects, Ion, Shear modulus, Transmission electron microscopy, radiation damage, 0103 physical sciences, 010306 general physics, 0210 nano-technology, Spectroscopy, defects
Abstract: Damage formation is investigated in GaAs implanted with 1 MeV Si ions to ion fluences from $3\ifmmode\times\else\texttimes\fi{}{10}^{12}$ to $5\ifmmode\times\else\texttimes\fi{}{10}^{15}\phantom{\rule{4pt}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}$ at room temperature. Under the conditions applied, amorphization of the implanted layers does not occur. The weakly damaged layers are studied by applying different experimental techniques including Rutherford backscattering spectrometry in channeling configuration, x-ray diffraction, in situ curvature measurement, optical subgap spectroscopy, and transmission electron microscopy. The results are evaluated and quantitatively connected with each other. Damage formation is described as a function of the ion fluence using a common defect evolution model. Point defects and defect clusters have to be taken into account in the ion fluence range of main interest up to $2\ifmmode\times\else\texttimes\fi{}{10}^{15}\phantom{\rule{4pt}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}$. Point defects contribute by a factor of about 8 more to both perpendicular strain and in-plane stress than defect clusters. When the concentration of point defects or the induced strain reaches a critical value, defect clusters form, which ensures that no further increase of perpendicular strain occurs. This reveals a clear driving force for cluster formation. The microstructure of the defect clusters cannot be determined from the results. ${\mathrm{As}}_{3}{\mathrm{Ga}}_{2}$ interstitial clusters are supposed. A remarkable decrease of the shear modulus of the implanted layers below the value of pristine GaAs by $\ensuremath{\approx}\ensuremath{-}35%$ is observed. Surprisingly, the change of shear modulus already sets in at a very low damage level of a few percent.
Published: 2019
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13. Strain engineering 4H-SiC with ion beams

Author: Yanwen Zhang, Jong K. Keum, Fuxiang Zhang, Haizhou Xue, William J. Weber, Aurélien Debelle, Alexandre Boulle, Yang Tong, Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, [PHYS]Physics [physics], Materials science, Physics and Astronomy (miscellaneous), Annealing (metallurgy), Physics::Instrumentation and Detectors, Physics::Medical Physics, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, 01 natural sciences, Fluence, Ion, symbols.namesake, Condensed Matter::Materials Science, Strain engineering, Physics::Plasma Physics, 0103 physical sciences, symbols, Irradiation, 0210 nano-technology, Single crystal, Raman scattering
Abstract: International audience; Single crystals of 4H-SiC irradiated with 900 keV Si and 21 MeV Ni ions separately and sequentially were studied by Rutherford backscattering spectrometry in channeling geometry, single crystal X-ray diffraction, and Raman scattering. SiC irradiated with 900 keV Si ions to a fluence of 6.3 × 1014 ions/cm2 experiences 7.3% strain over the depth of 650 nm. Strain relaxation from ionization-induced annealing was directly observed due to subsequent irradiation with 21 MeV Ni ions to a fluence of 2 × 1014 ions/cm2. These competitive processes suggest the use of ion irradiation to create a specific strain state in 4H-SiC, particularly in films.
Published: 2019
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14. How relative defect migration energies drive contrasting temperature-dependent microstructural evolution in irradiated ceramics

Author: Alexandre Boulle, Enrique Martínez, Jean-Paul Crocombette, Frédérico Garrido, Lionel Thomé, Blas P. Uberuaga, Moni Behar, Yara Haddad, Aurélien Debelle, Diana Bachiller-Perea, Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Service de recherches de métallurgie physique (SRMP), Département des Matériaux pour le Nucléaire (DMN), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM PCI), Université Paris-Saclay-Univ. Paris-Sud-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3), Universidad Federal de Río Grande del Sur, Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), and Los Alamos National Laboratory (LANL)
Subjects: Diffraction, Materials science, Physics and Astronomy (miscellaneous), Condensed matter physics, 02 engineering and technology, Rate equation, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Ion, [SPI.MAT]Engineering Sciences [physics]/Materials, visual_art, Vacancy defect, 0103 physical sciences, visual_art.visual_art_medium, General Materials Science, Cubic zirconia, Ceramic, Irradiation, 010306 general physics, 0210 nano-technology, Energy (signal processing), ComputingMilieux_MISCELLANEOUS
Abstract: Ceramic materials have become widely used in various fields of material science, and ceramic oxides such as cubic zirconia (c-${\mathrm{ZrO}}_{2})$ and magnesia (MgO) are candidate materials for nuclear energy applications. For the corresponding in-service conditions of these materials, there is a crucial need in studies at moderate or high temperatures of the physical phenomena underlying the damage buildup under irradiation. In the present work, we show, using x-ray diffraction, that these two materials exhibit a similar damage accumulation process under ion irradiation at fixed temperature. However, they display an unexpected opposite damaging rate to changes in the irradiation temperature. In fact, as the temperature is increased, the final damage state is reached earlier in c-${\mathrm{ZrO}}_{2}$ while it is delayed in MgO. Rate equation cluster dynamics simulations show that defect clustering is favored over defect recombination in c-${\mathrm{ZrO}}_{2}$, but the situation is reversed for MgO, explaining the observed opposite response to temperature of the two materials. This contrasting behavior can be rationalized in terms of nonequivalent interstitial versus vacancy defect migration energies in MgO. We finally demonstrate that these results allow for a qualitative prediction of the evolution of the experimental irradiation-induced disorder with temperature, henceforth potentially reducing the cost in selecting and developing ad hoc materials.
Published: 2018
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15. Lattice strain in irradiated materials unveils a prevalent defect evolution mechanism

Author: Alain Chartier, Diana Bachiller-Perea, Frédérico Garrido, Thomas Jourdan, Alexandre Boulle, S. Pellegrino, Jean-Paul Crocombette, Jayanth Channagiri, Tien-Hien Nguyen, Aurélien Debelle, Denise Carpentier, Lionel Thomé, Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Service de recherches de métallurgie physique (SRMP), Département des Matériaux pour le Nucléaire (DMN), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Service de la Corrosion et du Comportement des Matériaux dans leur Environnement (SCCME), Département de Physico-Chimie (DPC), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM PCI), and Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Saclay-Univ. Paris-Sud
Subjects: Diffraction, computation, Materials science, Physics and Astronomy (miscellaneous), 02 engineering and technology, 01 natural sciences, Atomic units, Ion, [SPI.MAT]Engineering Sciences [physics]/Materials, Molecular dynamics, strain, 0103 physical sciences, General Materials Science, 010306 general physics, ComputingMilieux_MISCELLANEOUS, defects, atomic scale, Strain (chemistry), irradiation, Relaxation (NMR), [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Microstructure, X-ray diffraction, Chemical physics, Dislocation, 0210 nano-technology
Abstract: International audience; Modification of materials using ion beams has become a widespread route to improve or design materials for advanced applications, from ion doping for microelectronic devices to emulation of nuclear reactor environments. Yet, despite decades of studies, major issues regarding ion/solidinteractions are not solved, one of them being the lattice-strain development process in irradiated crystals. In this work, we address this question using a consistent approach that combines X-ray diffraction (XRD) measurements with both molecular dynamics (MD) and rate equation clusterdynamics (RECD) simulations. We investigate four distinct materials that differ notably in terms of crystalline structure and nature of the atomic bonding. We demonstrate that these materials exhibit a common behaviour with respect to the strain development process. In fact, a strain build-upfollowed by a strain relaxation is observed in the four investigated cases. The strain variation is unambiguously ascribed to a change in the defect configuration, as revealed by MD simulations. Strain development is due to the clustering of interstitial defects into dislocation loops, while the strain release is associated with the disappearance of these loops through their integration into a network of dislocation lines. RECD calculations of strain depth profiles, which are in agreement with experimental data, indicate that the driving force for the change in the defect nature is the defect clustering process. This study paves the way for quantitative predictions of the microstructure changes in irradiated materials.
Published: 2018
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16. The amorphization of 3C-SiC irradiated at moderately elevated temperatures as revealed by X-ray diffraction

Author: J. B. Wallace, Alexandre Boulle, L. B. Bayu Aji, Sergei O. Kucheyev, Aurélien Debelle, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Speed Laboratory, University of Galasgow, Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, Diffraction, Materials science, Polymers and Plastics, Metals and Alloys, Analytical chemistry, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, Atmospheric temperature range, 021001 nanoscience & nanotechnology, 01 natural sciences, Fluence, [SPI.MAT]Engineering Sciences [physics]/Materials, Electronic, Optical and Magnetic Materials, Ion, Crystal, Crystallography, 0103 physical sciences, X-ray crystallography, Ceramics and Composites, Radiation damage, Irradiation, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS
Abstract: International audience; Mechanisms of radiation damage buildup in 3C-SiC remain poorly understood. Here, we use X-ray diffraction in combination with numerical simulations to study depth profiles of radiation-produced strain and lattice damage in 3C-SiC bombarded in the temperature range of 25-200 °C with 500 keV Ar ions. Results reveal increased defect recombination with increasing temperature, with a critical amorphization fluence increasing from 0.17 to 0.44 displacements per atom. The amorphization process is found to be correlated with the evolution of lattice strain. We find that, at fluences corresponding to the onset of amorphization, lattice strain is ~2% and is independent of temperature. With continuing bombardment above the onset of amorphization, the strain in the crystal bulk increases and reaches a saturation value that decreases from 7% to 5% with increasing temperature. Based on strain profiles, we compute depth profiles of the effective concentration of point defect clusters in the crystalline phase. Bombardment at higher temperatures results in lower maximum defect concentrations pointing to enhanced defect mobility. 1
Published: 2017
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17. DxTools: Processing large data files recorded with the Bruker D8 diffractometer

Author: Alexandre Boulle, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Data processing, Commercial software, Computer science, Detector, Process (computing), Repetitive task, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, File format, 01 natural sciences, General Biochemistry, Genetics and Molecular Biology, Crystallography, Computer graphics (images), 0103 physical sciences, Data file, 010306 general physics, 0210 nano-technology, Diffractometer
Abstract: Data processing is the daily reality for crystallographers, who often seek to automate this repetitive task. With modern commercial diffractometers allowing for more elaborate experiments to be performed, the use of commercial software is almost unavoidable for processing data, because these are often provided in a manufacturer-specific format. This is especially the case when the intensity is recorded as a function of more than one single scanning motor and/or when recording data with a one-dimensional detector. A simple, free and open-source alternative is here presented to process the type of diffraction data recorded with the Bruker D8 diffractometer. It allows handling of data files (in uxd and brml format) corresponding to reciprocal space maps (in the Qx Qz and Qx Qy planes), temperature-dependent scans, spatial scans, sin2ψ measurements and pole figures. The program is easy to use and can be extended to any file format. It can be downloaded from https://aboulle.github.io/DxTools/.
Published: 2017
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18. Structural and electrical properties of large area epitaxial VO 2 films grown by electron beam evaporation

Author: Aurelian Crunteanu, Amine Mennai, Alexandre Boulle, Arnaud Beaumont, Annie Bessaudou, Richard Mayet, Virginie Théry, Marc Fabert, Jean-Christophe Orlianges, Françoise Cosset, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), RF-ELITE : RF-Electronique Imprimée pour les Télécommunications et l'Energie (XLIM-RFEI), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Institut de biologie et chimie des protéines [Lyon] (IBCP), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Centre National de la Recherche Scientifique (CNRS), Tampere University of Technology [Tampere] (TUT), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Photonique Fibre et Sources Cohérentes (XLIM-PHOT), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)
Subjects: 010302 applied physics, Diffraction, Materials science, business.industry, Annealing (metallurgy), General Physics and Astronomy, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, Electron beam physical vapor deposition, Mosaicity, [SPI.MAT]Engineering Sciences [physics]/Materials, Crystallography, Electrical resistivity and conductivity, 0103 physical sciences, Sapphire, Optoelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, Stoichiometry
Abstract: International audience; Large area (up to 4 squared inches) epitaxial VO 2 films, with a uniform thickness and exhibiting an abrupt metal-insulator transition with a resistivity ratio as high as 2.85 × 10 4 have been grown on (001)-oriented sapphire substrates by electron beam evaporation. The lattice distortions (mosaicity) and the level of strain in the films have been assessed by X-ray diffraction. It is demonstrated that the films grow in a domain-matching mode where distortions are confined close to the interface which allows to grow high-quality materials despite the high film-substrate lattice mismatch. It is further shown that a post-deposition high-temperature oxygen annealing step is crucial to ensure the correct film stoichiometry and provide the best structural and electrical properties. Alternatively, it is possible to obtain high quality films with an RF discharge during deposition, which hence do not require the additional annealing step. Such films exhibit similar electrical properties and only slightly degraded structural properties.
Published: 2017
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19. RaDMaX: a graphical program for the determination of strain and damage profiles in irradiated crystals

Author: M. Souilah, Aurélien Debelle, Alexandre Boulle, Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM)
Subjects: Diffraction, Materials science, 02 engineering and technology, 01 natural sciences, Least squares, General Biochemistry, Genetics and Molecular Biology, [SPI.MAT]Engineering Sciences [physics]/Materials, computer program, X-ray diffraction, Irradiation, Strain gradients, Damage gradients, Optics, computer program, 0103 physical sciences, Radiation damage, 010302 applied physics, Computer program, Strain (chemistry), business.industry, Experimental data, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Strain gradients, Damage gradients, Computational physics, X-ray diffraction, X-ray crystallography, Simulated annealing, Irradiation, 0210 nano-technology, business, [CHIM.RADIO]Chemical Sciences/Radiochemistry
Abstract: RaDMaX(radiation damage in materials analysed with X-ray diffraction) is a user-friendly graphical program that allows the determination of strain and damage depth profiles in ion-irradiated crystals. This task is achieved by fitting experimental X-ray diffraction data, recorded in symmetrical θ–2θ geometry, with a dynamical diffraction model parametrized with variable strain and damage profiles based onB-spline functions. The strain and damage profiles can be graphically manipulated so as to fit the calculated curve to the experimental data. Automatic fitting procedures (generalized simulated annealing and conventional least squares) are also implemented.RaDMaXis free and open source (CeCILL licence) and can be downloaded from http://aboulle.github.io/RaDMaX.
Published: 2016
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20. Strain profiles in ion implanted ceramic polycrystals: a new approach based on reciprocal-space crystal selection

Author: Georges Martin, J. Fouet, Alexandre Boulle, François Rieutord, C. Onofri, Philippe Goudeau, V. Favre-Nicolin, Nils Blanc, H. Palancher, Département d'Etudes des Combustibles (DEC), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM), Nanostructures et Rayonnement Synchrotron (NRS ), Modélisation et Exploration des Matériaux (MEM), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Service de Physique des Matériaux et Microstructures (SP2M - UMR 9002), Institut Nanosciences et Cryogénie (INAC), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), CRG et Grands Instruments (CRG ), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Centre d'élaboration de matériaux et d'études structurales (CEMES), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie de Toulouse (ICT-FR 2599), Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut de Chimie du CNRS (INC)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Institut de Chimie du CNRS (INC)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), CRG & Grands instruments (NEEL - CRG), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), CEA-Direction de l'Energie Nucléaire (CEA-DEN), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire de métallurgie physique (LMP), Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers, Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM), Nanostructures et Rayonnement Synchrotron (NRS), Université Grenoble Alpes (UGA)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (CEA) - Grenoble, Centre d'Études et de Recherches par Irradiation (CERI), and Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, X-Ray-Diffraction, Silicon, Materials science, Physics and Astronomy (miscellaneous), 02 engineering and technology, 01 natural sciences, law.invention, [SPI.MAT]Engineering Sciences [physics]/Materials, Crystal, Mechanical-Behavior, law, 0103 physical sciences, Ceramic, Anisotropy, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, Condensed matter physics, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Synchrotron, Reciprocal lattice, Crystallography, Single-Crystals, Ion implantation, visual_art, visual_art.visual_art_medium, Crystallite, Uranium-Dioxide, 0210 nano-technology
Abstract: International audience; The determination of the state of strain in implanted materials is a key issue in the study of their mechanical stability. Whereas this question is nowadays relatively easily solved in the case of single crystals, it remains a challenging task in the case of polycrystalline materials. In this paper, we take benefit of the intense and parallel beams provided by third generation synchrotron sources combined with a two-dimensional detection system to analyze individual grains in polycrystals, hence obtaining “single crystal-like” data. The feasibility of the approach is demonstrated with implanted UO2 polycrystals where the in-depth strain profile is extracted for individual grains using numerical simulations of the diffracted signal. The influence of the implantation dose is precisely analyzed for several diffracting planes and grains. This work suggests that, at low fluences, the development of strain is mainly due to ballistic effects with little effect from He ions, independently from the crystallographic orientation. At higher fluences, the evolution of the strain profiles suggests a partial and anisotropic plastic relaxation. With the present approach, robust and reliable structural information can be obtained, even from complex polycrystalline ceramic materials.
Published: 2016
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21. Diffuse X-ray scattering from 180° ferroelectric stripe domains: polarization-induced strain, period disorder and wall roughness

Author: I.C. Infante, Alexandre Boulle, N. Lemée, Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Structures, Propriétés et Modélisation des solides (SPMS), Institut de Chimie du CNRS (INC)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physique de la Matière Condensée (LPMC), and Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, Condensed matter physics, business.industry, Scattering, Superlattice, 02 engineering and technology, Dielectric, Surface finish, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Polarization (waves), 01 natural sciences, Ferroelectricity, General Biochemistry, Genetics and Molecular Biology, Condensed Matter::Materials Science, Optics, Electric field, 0103 physical sciences, Curie temperature, 010306 general physics, 0210 nano-technology, business
Abstract: A key element in ferroic materials is the presence of walls separating domains with different orientations of the order parameter. It is demonstrated that 180° stripe domains in ferroelectric films give rise to very distinct features in their diffuse X-ray scattering (DXS) intensity distributions. A model is developed that allows the determination of not only the domain period but also the period disorder, the thickness and roughness of the domain walls, and the strain induced by the rotation of the polarization. As an example, the model is applied to ferroelectric/paraelectric superlattices. Temperature-dependent DXS measurements reveal that the polarization-induced strain decreases dramatically with increasing temperature and vanishes at the Curie temperature. The motion of ferroelectric domain walls appears to be a collective process that does not create any disorder in the domain period, whereas pinning by structural defects increases the wall roughness. This work will facilitatein situquantitative studies of ferroic domains and domain wall dynamics under the application of external stimuli, including electric fields and temperature.
Published: 2016
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22. Strain relaxation in He implanted UO 2 polycrystals under thermal treatment: an in-situ XRD study

Author: Thierry Sauvage, H. Palancher, Georges Martin, J. Raynal, A. Richard, G. Carlot, C. Onofri, Renaud C. Belin, C. Sabathier, R. Kachnaoui, François Rieutord, Alexandre Boulle, Ph. Goudeau, Antoine Ambard, H. Rouquette, Pierre Desgardin, J.-C. Richaud, Département d'Etudes des Combustibles (DEC), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), CEA Cadarache, Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Modélisation Multi-échelles des Combustibles (LM2C), Service d'Etudes de Simulation du Comportement du combustibles (SESC), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Département d'Etudes des Combustibles (DEC), Conditions Extrêmes et Matériaux : Haute Température et Irradiation (CEMHTI), Université d'Orléans (UO)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Nanostructures et Rayonnement Synchrotron (NRS ), Modélisation et Exploration des Matériaux (MEM), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Matériaux et Mécanique des Composants (EDF R&D MMC), EDF R&D (EDF R&D), EDF (EDF)-EDF (EDF), ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers, Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université d'Orléans (UO), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
Subjects: X-Ray-Diffraction, Nuclear and High Energy Physics, Materials science, XRD, Thermal recovery, Uranium dioxide, Analytical chemistry, Pellets, Thermophysical Properties, 02 engineering and technology, Thermal treatment, 01 natural sciences, Ion, chemistry.chemical_compound, 0103 physical sciences, General Materials Science, Alpha decay, 010302 applied physics, Strain (chemistry), Doping, Spent Fuel, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Single-Crystals, Nuclear Energy and Engineering, chemistry, Lattice-Defects, X-ray crystallography, Free swelling, Relaxation (physics), Uranium-Dioxide, 0210 nano-technology, Nuclear chemistry
Abstract: International audience; Within the frame of the long-term evolution of spent nuclear fuel in dry disposal, the behavior of He in UO2 polycrystals has to be studied. Here, strain relaxation in He implanted samples has been characterized using in situ X-ray diffraction during thermal annealing. The influence of a wide range of experimental parameters (annealing atmosphere, He ion energy, orientation of the UO2 grains probed by X-rays) has been evaluated. If each of them contributes to the strain relaxation kinetics in the implanted layer, strain relaxation is not completed for temperatures below 900 °C which is equivalent to what has been found on He implanted UO2 single crystals, or aged UO2 pellets doped with α-emitters. In the case of implantation with 500 keV He ions, we clearly show that strain relaxation and He release are not correlated for temperatures below 750 °C.
Published: 2016
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23. Diffuse X-ray scattering from ion-irradiated materials: A parallel-computing approach

Author: Alexandre Boulle, Aurélien Debelle, Jayanth Channagiri, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), and Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)
Subjects: Materials science, business.industry, Scattering, Monte Carlo method, Fast Fourier transform, [CHIM.MATE]Chemical Sciences/Material chemistry, General Biochemistry, Genetics and Molecular Biology, Ion, Computational physics, Crystal, Reciprocal lattice, Optics, Displacement field, business, Single crystal
Abstract: A computational method for the evaluation of the two-dimensional diffuse X-ray scattering distribution from irradiated single crystals is presented. A Monte Carlo approach is used to generate the displacement field in the damaged crystal. This step makes use of vector programming and multiprocessing to accelerate the computation. Reciprocal space maps are then computed using GPU-accelerated fast Fourier transforms. It is shown that this procedure speeds up the calculation by a factor of ∼190 for a crystal containing 109unit cells. The potential of the method is illustrated with two examples: the diffuse scattering from a single crystal containing (i) a non-uniform defect depth distribution (with a potentially bimodal defect size distribution) and (ii) spatially correlated defects exhibiting either long-range or short-range ordering with varying positional disorder.
Published: 2015
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24. Polarization Rotation in Ferroelectric Tricolor PbTiO3/SrTiO3/PbZr0.2Ti0.8O3 Superlattices

Author: Nils Blanc, Alexandre Boulle, Nathalie Boudet, Ingrid C. Infante, Cécile Hubault, M. G. Karkut, Valérie Demange, N. Lemée, Laboratoire de Physique de la Matière Condensée - UR UPJV 2081 (LPMC), Université de Picardie Jules Verne (UPJV), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM), CRG et Grands Instruments (CRG), Institut Néel (NEEL), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF), Institut des Sciences Chimiques de Rennes (ISCR), Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), CRG & Grands instruments (NEEL - CRG), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and DERORY, BEATRICE
Subjects: Diffraction, pb(zr, Materials science, Superlattice, 02 engineering and technology, Dielectric, [SPI.MAT] Engineering Sciences [physics]/Materials, 01 natural sciences, [SPI.MAT]Engineering Sciences [physics]/Materials, strain and interface effects, domain structure, 0103 physical sciences, ferroelectric materials, [CHIM]Chemical Sciences, General Materials Science, 010306 general physics, ComputingMilieux_MISCELLANEOUS, epitaxial and superlattice film, [CHIM.MATE] Chemical Sciences/Material chemistry, Condensed matter physics, ti)o3-based films, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Polarization (waves), Piezoelectricity, Ferroelectricity, Crystallography, Reciprocal lattice, 0210 nano-technology, Monoclinic crystal system
Abstract: International audience; In ferroelectric thin films, controlling the orientation of the polarization is a key element to controlling their physical properties. We use laboratory and synchrotron X-ray diffraction to investigate ferroelectric bicolor PbTiO3/PbZr0.2Ti0.8O3 and tricolor PbTiO3/SrTiO3/PbZr0.2Ti0.8O3 superlattices and to study the role of the SrTiO3 layers on the domain structure. In the tricolor superlattices, we demonstrate the existence of 180° ferroelectric stripe nanodomains, induced by the depolarization field produced by the SrTiO3 layers. Each ultrathin SrTiO3 layer modifies the electrostatic boundary conditions between the ferroelectric layers compared to the corresponding bicolor structures, leading to the suppression of the a/c polydomain states. Combined with the electrostatic effect, the tensile strain induced by PbZr0.2Ti0.8O3 in the PbTiO3 layers leads to polarization rotation in the system as evidenced by grazing incidence X-ray measurements. This polarization rotation is associated with the monoclinic Mc phase as revealed by the splitting of the (HHL) and (H0L) reciprocal lattice points. This work demonstrates that the tricolor paraelectric/ferroelectric superlattices constitute a tunable system to investigate the concomitant effects of strains and depolarizing fields. Our studies provide a pathway to stabilize a monoclinic symmetry in ferroelectric layers, which is of particular interest for the enhancement of the piezoelectric properties.
Published: 2015
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25. Mechanical response of UO2 single crystals submitted to low-energy ion irradiation

Author: Alexandre Boulle, Lionel Thomé, Frédérico Garrido, Valérie Demange, Tien-Hien Nguyen, Aurélien Debelle, Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM PCI), Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Saclay-Univ. Paris-Sud, Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut des Sciences Chimiques de Rennes (ISCR), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), We are grateful to the Semiramis staff for their help during irradiations. One of us (T.H. Nguyen) acknowledges the Ecole Doctorale MIPEGE at the Université Paris-Sud for financial support during his PhD thesis., Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), and Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)
Subjects: Diffraction, Nuclear and High Energy Physics, Materials science, XRD, elastic strain, 61.80.Jh, 62.20.D, 02 engineering and technology, UO2, 01 natural sciences, Fluence, Ion, Lattice constant, 0103 physical sciences, [CHIM]Chemical Sciences, General Materials Science, Irradiation, Composite material, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 010306 general physics, PACS, [PHYS]Physics [physics], Range (particle radiation), Strain (chemistry), Relaxation (NMR), 021001 nanoscience & nanotechnology, Crystallography, 61.05.cp, Nuclear Energy and Engineering, 61.72.J, 61.72.Dd, radiation effects, Defects, 0210 nano-technology
Abstract: International audience; {111}- and {100}-oriented UO2 single crystals were irradiated with 500-keV Ce3+ ions in the 1014 - 9x1014 cm-2 fluence range. The irradiation-induced strain was monitored using high-resolution X-ray diffraction. A mechanical modelling dedicated to thin irradiated layers was applied to account for the reaction of the unirradiated part of the crystals. The elastic strain, which is confined along the surface normal of the samples, increases with ion fluence until it is dramatically relieved. This behaviour is observed for both orientations. While the measured elastic strain depends on the crystallographic direction, the strain due to irradiation defects only is found to be equal for both directions, with a maximum value of ∼0.5%. Strain relaxation takes place at the damage peak, but the in-plane lattice parameter of the irradiated layer remains unchanged and equal to that of the pristine material. Meanwhile, the strain at the damaged/pristine interface continues to increase.
Published: 2015
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26. Self-organized ultrathin FePt nanowires produced by glancing-angle ion-beam codeposition on rippled alumina surfaces

Author: Alexandre Boulle, Frédéric Pailloux, Mathieu Garel, Yves Garreau, Aline Y. Ramos, Hélio C. N. Tolentino, David Babonneau, Alessandro Coati, Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), Laboratoire Matériaux et Phénomènes Quantiques (MPQ (UMR_7162)), Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS), Matériaux, Rayonnements, Structure (MRS), Institut Néel (NEEL), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), CRG et Grands Instruments (CRG), Université de Poitiers-Centre National de la Recherche Scientifique (CNRS)-ENSMA, Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), MRS - Matériaux, Rayonnements, Structure, Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF), CRG - CRG et Grands Instruments, and Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)
Subjects: 010302 applied physics, Phase transition, Materials science, Ion beam, Condensed matter physics, Annealing (metallurgy), Alloy, Nanowire, Nanotechnology, 02 engineering and technology, engineering.material, 021001 nanoscience & nanotechnology, 01 natural sciences, Ferromagnetism, 0103 physical sciences, engineering, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], General Materials Science, 0210 nano-technology, Anisotropy, Nanodevice
Abstract: International audience; Ultradense macroscopic arrays of ferromagnetic alloy nanowires exhibit unique properties that make them attractive both for basic physics studies and for prospective nanodevice applications in various areas. We report here on the production of self-organized equiatomic FePt nanowires produced by glancing-angle ion-beam codeposition on alumina nanoripple patterns at room temperature and subsequent annealing at 600 °C. This study demonstrates that periodically aligned FePt nanowires with tunable size (∼10–20 nm width and ∼0.5–10 nm height) can be successfully grown as a consequence of shadowing effects and low mobility of Fe and Pt on the rippled alumina surface. Moreover, the structure and magnetic properties of the FePt nanowires, which undergo a phase transition from a disordered A1 (soft) structure to a partially ordered L10 (hard) structure, can be modified upon annealing. We show that this behavior can be further exploited to change the effective uniaxial anisotropy of the system, which is determined by a strong interplay between the shape and magnetocrystalline anisotropies of the nanowires.
Published: 2015
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27. Depth-dependent phase change in Gd2O3 epitaxial layers under ion irradiation

Author: Rytis Dargis, Andrew G. Clark, Gaël Sattonnay, N. Mejai, Alexandre Boulle, Lionel Thomé, D. Gosset, Aurélien Debelle, Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Institut de Chimie Moléculaire et des Matériaux d'Orsay (ICMMO), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC), Service des Recherches Métallurgiques Appliquées (SRMA), Département des Matériaux pour le Nucléaire (DMN), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, Crystallography, Materials science, Thin layers, Physics and Astronomy (miscellaneous), Phase (matter), X-ray crystallography, Irradiation, [CHIM.MATE]Chemical Sciences/Material chemistry, Thin film, Molecular physics, Fluence, Ion
Abstract: International audience; Epitaxial Gd2O3 thin layers with the cubic structure were irradiated with 4-MeV Au 2+ ions in the 10 13-10 15 cm-2 fluence range. X-ray diffraction indicates that ion irradiation induces a cubic to monoclinic phase change. Strikingly, although the energy-deposition profile of the Au 2+ ions is constant over the layer thickness, this phase transformation is depth-dependent, as revealed by a combined X-ray diffraction and ion channeling analysis. In fact, the transition initiates very close to the surface and propagates inwards, which can be explained by an assisted migration process of irradiation-induced defects. This result is promising for developing a method to control the thickness of the rare-earth oxide crystalline phases.
Published: 2015
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28. Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na0.5Bi0.5TiO3 perovskite thin film

Author: Alexandre Boulle, Thomas W. Cornelius, Genziana Bussone, M. Bousquet, Brice Gautier, Jean-René Duclere, Anastasios Pateras, Dina Carbone, Paul G. Evans, European Synchrotron Radiation Facility (ESRF), National Technical University of Athens [Athens] (NTUA), University of Wisconsin-Madison, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), INL - Dispositifs Electroniques (INL - DE), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), and Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, Piezoelectric coefficient, Physics and Astronomy (miscellaneous), Piezoelectric fields, 02 engineering and technology, 01 natural sciences, [SPI.MAT]Engineering Sciences [physics]/Materials, [SPI]Engineering Sciences [physics], Electric field, Polarization, 0103 physical sciences, Piezoelectric films, Thin film, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Perovskite (structure), 010302 applied physics, Condensed matter physics, Crystal structure, 021001 nanoscience & nanotechnology, Polarization (waves), Microstructure, Ferroelectric thin films, Ferroelectricity, Piezoelectricity, Crystallography, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, 0210 nano-technology
Abstract: International audience; Thin films of the lead-free ferroelectric Na0.5Bi0.5TiO3 grown on thin-film Pt electrodes supported by SrTiO3 substrates have a complex microstructure consisting of crystalline grains with three distinct major crystallographic orientations. The piezoelectric response measured in spatially separated sub-micron grains using time-resolved synchrotron x-ray microdiffraction is highly inhomogeneous even among grains sharing the same major orientation. The piezoelectric coefficient d33 varies by nearly a factor of two in a series of areas sharing the 〈001〉 orientation. The piezoelectric inhomogeneity is linked to the peculiar microstructure of the film, arising from local variations in the stress imposed by surrounding grains with different crystallographic orientations and differing directions of the ferroelectric remnant polarization. A systematic nonlinearity of the piezoelectric strain is observed in applied electric fields with small magnitudes in all regions, consistent with the coexistence of domains of differing polarization direction at zero applied electric field.
Published: 2014
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29. Double-Position-Boundaries Free 3C-SiC Epitaxial Layers Grown on On-Axis 4H-SiC

Author: Henrik Jacobson, Alexandre Boulle, Anne Henry, Didier Chaussende, Xun Li, Shanghai Key Laboratory of Trustworthy Computing, East China Normal University [Shangaï] (ECNU), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physique Moleculaire pour l'Atmosphere et l'Astrophysique (LPMAA), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), and Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, Materials science, Analytical chemistry, Chemical vapor deposition, [CHIM.MATE]Chemical Sciences/Material chemistry, Epitaxy, Electronic, Optical and Magnetic Materials, law.invention, Reciprocal lattice, Full width at half maximum, Reflection (mathematics), Optical microscope, law, Teknik och teknologier, Engineering and Technology, Layer (electronics)
Abstract: International audience; High quality double-position-boundaries free 3C-SiC epilayers have been successfully grown on on-axis (0001) 4H-SiC by chemical vapor deposition at optimized conditions as observed with optical microscopy and X-ray diffraction. The effect of the growth parameters, including temperature, C/Si ratio, ramp-up condition, Si/H-2 ratio, N-2 addition and pressure, on the quality of the grown layers is investigated. Different techniques, including microscopic and spectroscopic techniques, are used to characterize the epilayers. High resolution X-ray diffraction shows 2 theta-omega curve with full width at half maximum of only 16 arcsec for the (111) reflection detected from a 35 mu m thick 3C-SiC layer, showing the good structural quality of the layer. Reciprocal space maps confirm the absence of double-position-boundaries in a large depth of the layers. Low temperature photoluminescence measurement shows clear near-bandgap emission with sharp and single peaks, which further verifies the high quality of the epilayers. (C) 2014 The Electrochemical Society. All rights reserved.
Published: 2014
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30. Polytypic transformations in SiC : diuse X-ray scattering and Monte Carlo simulations

Author: Alexandre Boulle, I.G. Galben-Sandulache, Deborah Dompoint, Didier Chaussende, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Physics, Phase transition, Condensed matter physics, Scattering, Monte Carlo method, Stacking, PACS numbers: 61.72.Dd, 61.72.Nn, 61.50.Ks, 81.05.Hd, Interaction model, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Critical value, 01 natural sciences, Molecular physics, Dissociation (chemistry), Electronic, Optical and Magnetic Materials, 0103 physical sciences, Ising model, 010306 general physics, 0210 nano-technology
Abstract: Solid-state phase transitions in SiC are investigated using diffuse x-ray scattering and Monte Carlo simulations. As an example, the 3C-6H transformation is investigated in detail. The transformation is modeled with a statistical algorithm based on the concept of double cross-slipping and subsequent dissociation of basal plane dislocations. The corresponding diffuse x-ray scattering curves are calculated and quantitatively compared with experimental data obtained from 3C-SiC crystals annealed at high temperatures (1700--2100${}^{\ensuremath{\circ}}\phantom{\rule{0.16em}{0ex}}\mathrm{C}$). From the simulations, it is demonstrated that the transformation implies the multiplication and ordering of double and triple stacking faults (SFs). The transformation level and root-mean-squared strains associated with the dislocations are determined from the simulations. The defect structure formed during the transition can be rationalized by considering the relative energies of the SFs. Using an axial next-nearest-neighbor Ising interaction model we show that single SFs are not energetically favored, whereas the simultaneous occurrence of double and triple SFs implies that their relative energy difference remains below a critical value ($\ensuremath{\sim}$8--9%).
Published: 2013
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31. Influence of elastic properties on the strain induced by ion irradiation in crystalline materials

Author: J. Moeyaert, Frédérico Garrido, A. Debelle, Alexandre Boulle, Lionel Thomé, F. Rakotovao, C. Bachelet, CSNSM PCI, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), CSNSM SEMI, Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, Acoustics and Ultrasonics, mechanical & thermal, 02 engineering and technology, 01 natural sciences, Ion, chemistry.chemical_compound, symbols.namesake, 0103 physical sciences, Cubic zirconia, Van der Waals radius, Irradiation, Ceramic, Composite material, Condensed matter: structural, Anisotropy, 010302 applied physics, Relaxation (NMR), [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, visual_art, visual_art.visual_art_medium, Strontium titanate, symbols, 0210 nano-technology
Abstract: International audience; Cubic zirconia, an elastically anisotropic material, has been irradiated with 300 keV Cs+ ions and the irradiation-induced elastic strain has been measured using x-ray diffraction (XRD). In order to highlight the influence of the elastic properties on the strain level, two different cases have been investigated: (i) {1 0 0} versus {1 1 1}-oriented zirconia single crystals and (ii) {1 0 0} zirconia versus {1 0 0} strontium titanate. In the former case, raw experimental results show that the {1 0 0} planes deform less than the {1 1 1} planes. However, with a modelling that takes into account the effect of the elastic properties, it is demonstrated that the strain due to irradiation defects only is the same for both orientations (with a maximum value of ~0.8%). Combined use of this modelling and of a dedicated computer program for fitting XRD data allowed determining both defect concentration (~1%) and relaxation volume (~0.5 atomic volume). In the latter case, it is shown that elastic properties affect the measured strain in irradiated zirconia and strontium titanate. However, a difference between the two materials remains even taking into account this effect, confirming that different compounds of a same class of materials (namely ceramic oxides) can exhibit a different response to ion irradiation
Published: 2013
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32. 3C-SiC heteroepitaxy on hexagonal SiC substrates

Author: Xun Li, Sven Andersson, Erik Janzén, Henrik Jacobson, Anne Henry, Didier Chaussende, Alexandre Boulle, Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM), and Bathias, Pamela
Subjects: Photoluminescence, Materials science, Heteroepitaxial Growth, 02 engineering and technology, Substrate (electronics), Chemical vapor deposition, 01 natural sciences, law.invention, Crystal, 3C-SiC(111), Optical microscope, law, 0103 physical sciences, Naturvetenskap, X-Ray Diffraction (XRD), Photoluminescence (PL), General Materials Science, Single domain, 3C-SiC, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, [CHIM.MATE] Chemical Sciences/Material chemistry, Sublimation Epitaxy, business.industry, Mechanical Engineering, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, CVD, Characterization (materials science), Heteroepitaxy, Crystallography, Mechanics of Materials, TEM, Optoelectronics, 0210 nano-technology, business, Natural Sciences, Layer (electronics)
Abstract: The growth of 3C-SiC on hexagonal polytype is addressed and a brief review is given for various growth techniques. The Chemical Vapor Deposition is shown as a suitable technique to grow single domain 3C epilayers on 4H-SiC substrate and a 12.5 µm thick layer is demonstrated; even thicker layers have been obtained. Various characterization techniques including optical microscopy, X-ray techniques and photoluminescence are compared for the evaluation of the crystal quality and purity of the layers.
Published: 2013
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33. Investigation of irradiation effects induced by self-ion in 6H-SiC combining RBS/C, Raman and XRD

Author: P. Trocellier, William J. Weber, Yanwen Zhang, Alexandre Boulle, Constantin Meis, Gaël Sattonnay, N. Chaâbane, A. Debelle, L. Gosmain, Yves Serruys, Lionel Thomé, Institut National des Sciences et Techniques Nucléaires (INSTN), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, CSNSM PCI, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Institut de Chimie Moléculaire et des Matériaux d'Orsay (ICMMO), Université Paris-Sud - Paris 11 (UP11)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Service de recherches de métallurgie physique (SRMP), Département des Matériaux pour le Nucléaire (DMN), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Service d'Etudes des Matériaux Irradiés (SEMI), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)
Subjects: 010302 applied physics, Nuclear and High Energy Physics, Materials science, Annealing (metallurgy), Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, Channelling, 01 natural sciences, Fluence, Damage characterization, Amorphous solid, Ion, Crystallography, symbols.namesake, 6H-SiC, Ion irradiation, 0103 physical sciences, symbols, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Irradiation, 0210 nano-technology, Raman spectroscopy, Instrumentation
Abstract: Single crystals of 6H-SiC were irradiated at room temperature and 670 K with 4 MeV C ions at two fluences: 10 15 and 10 16 cm −2 (0.16 and 1.6 dpa at the damage peak). Damage accumulation was studied by a combination of X-ray diffraction (XRD), Raman spectroscopy and Rutherford backscattering spectrometry in channelling geometry (RBS/C) along the [0 0 0 1] direction. The irradiated layer is found to be composed of a low damage region up to ∼1.5 μm followed by a region where the disorder level is higher, consistent with SRIM predictions. At room temperature and low fluence, typically 10 15 cm −2 , the strain depth profile follows the dpa depth distribution (with a maximum value of ∼2%). The disorder is most likely due to small defect clusters. When increasing the fluence up to 10 16 cm −2 , a buried amorphous layer forms, as indicated by e.g. Raman results where the Si–C bands become broader or even disappear. At a higher irradiation temperature of 670 K, amorphization is not observed at the same fluence, revealing a dynamic annealing process. However, results tend to suggest that the irradiated layer is highly heterogeneous and composed of different types of defects.
Published: 2012
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34. Diffuse X-ray scattering from partially transformed 3C-SiC single crystals

Author: I.G. Galben-Sandulache, Deborah Dompoint, Didier Chaussende, Alexandre Boulle, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Nuclear and High Energy Physics, Materials science, Stacking, 02 engineering and technology, Silicon carbide, diffuse X-ray scattering, 01 natural sciences, Molecular physics, chemistry.chemical_compound, Optics, 0103 physical sciences, Perpendicular, Silicon carbide 3C-6H transition, Instrumentation, stacking faults, 010302 applied physics, business.industry, Scattering, X-ray, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Reciprocal lattice, chemistry, 3C-6H transition, Volume fraction, Partial dislocations, 0210 nano-technology, business
Abstract: International audience; The 3C-6H polytypic transition in 3C-SiC single crystals is studied by means of diffuse X-ray scattering (DXS) coupled with numerical simulations. It is shown that the presence of spatially correlated stacking faults (characteristic of this type of re-stacking transition) gives rise to extended diffuse scattering in the reciprocal space perpendicularly to the fault plane. The simulation of the diffuse intensity allows to determine both the volume fraction of transformed material and the transformation level within these regions. It is further shown that the evolution with time and temperature of the transition implies the multiplication and glide of partial dislocations, the kinetics of which are quantified by means of DXS.
Published: 2012
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35. On the stability of 3C-SiC single crystals at high temperatures

Author: Deborah Dompoint, Irina G. Galben-Sandulache, Alexandre Boulle, Didier Chaussende, Dominique Eyidi, Jean Luc Demenet, Marie France Beaufort, Jacques Rabier, Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique de Grenoble (INPG), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Institut Pprime (PPRIME), Université de Poitiers-Centre National de la Recherche Scientifique (CNRS)-ENSMA, Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), and ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers
Subjects: Materials science, Kinetics, Stacking, 02 engineering and technology, 01 natural sciences, Molecular physics, 0103 physical sciences, General Materials Science, stacking faults, 3C-SiC, 010302 applied physics, Scattering, Mechanical Engineering, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Crystallography, Mechanics of Materials, Transmission electron microscopy, 3C-6H transition, Volume fraction, Partial dislocations, Dislocation, 0210 nano-technology, Stacking fault, dislocations
Abstract: International audience; The 3C-6H polytypic transition in 3C-SiC single crystals is studied by means of diffuse X-ray scattering (DXS) coupled with transmission electron microscopy (TEM). TEM reveals that the partially transformed SiC crystals contain regions of significantly transformed SiC (characterized by a high density of stacking faults) co-existing with regions of pure 3C-SiC. The simulation of the diffuse intensity allows to determine both the volume fraction of transformed material and the transformation level within these regions. It is further shown that the evolution with time and temperature of the transition implies the multiplication and glide of partial dislocations, the kinetics of which are quantified by means of DXS.
Published: 2012
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36. Response of cubic zirconia irradiated with 4-MeV Au ions at high temperature: an X-ray diffraction study

Author: Frédérico Garrido, S. Moll, P. Rosza, A. Debelle, Alexandre Boulle, Lionel Thomé, L. Qasim, CSNSM PCI, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)
Subjects: Diffraction, Nuclear and High Energy Physics, Materials science, XRD, Analytical chemistry, 02 engineering and technology, 01 natural sciences, Fluence, Ion, Strain, [SPI.MAT]Engineering Sciences [physics]/Materials, 0103 physical sciences, Cubic zirconia, Irradiation, Instrumentation, Yttria-stabilized zirconia, 010302 applied physics, Relaxation (NMR), Temperature, 021001 nanoscience & nanotechnology, Crystallography, YSZ, Ion irradiation, X-ray crystallography, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 0210 nano-technology
Abstract: Yttria-stabilized cubic zirconia single-crystals have been irradiated with 4-MeV Au2+ ions at fluences ranging from 1012 cm−2 to 5 × 1015 cm−2 and at three temperatures (room temperature, 500 °C and 800 °C). Evaluation of the irradiation-induced strain has been performed by the X-ray diffraction technique. It is found that, whatever the irradiation temperature, the elastic-strain build-up exhibits two steps. An increase of the (tensile) strain-level is observed in the first step. A drastic strain relaxation occurs at a transition fluence, which defines the beginning of the second step. Increasing the irradiation temperature induces a decrease of the strain level and a shift of the transition fluence towards low fluence. Both effects may be explained by an enhanced defect-clustering rate which occurs already at 500 °C.
Published: 2012
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37. Combined experimental and computational study of the recrystallization process induced by electronic interactions of swift heavy ions with silicon carbide crystals

Author: Stamatis Mylonas, N. Juslin, F. Garrido, Marie Backman, Didier Chaussende, William J. Weber, Alexandre Boulle, Lionel Thomé, Aurélien Debelle, Marcel Toulemonde, Flyura Djurabekova, Kai Nordlund, Olli H. Pakarinen, CSNSM PCI, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Centre de recherche sur les Ions, les MAtériaux et la Photonique (CIMAP - UMR 6252), Centre National de la Recherche Scientifique (CNRS)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Caen Normandie (UNICAEN), Normandie Université (NU), Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), CSNSM PS1, Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Department of Physics [Helsinki], Falculty of Science [Helsinki], Helsingin yliopisto = Helsingfors universitet = University of Helsinki-Helsingin yliopisto = Helsingfors universitet = University of Helsinki, Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et Nanosciences Grand-Est (MNGE), Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Laboratory of Physics, Helsinki University of Technology, TKK Helsinki University of Technology (TKK), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Boulle, Alexandre, Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), University of Helsinki-University of Helsinki, Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et nanosciences d'Alsace (FMNGE), Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, and Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)
Subjects: TRACKS, Materials science, 02 engineering and technology, Radiation, AMORPHIZATION, 01 natural sciences, 7. Clean energy, Ion, Molecular dynamics, chemistry.chemical_compound, Swift heavy ion, 0103 physical sciences, Thermal, Silicon carbide, Irradiation, PACS: 61.80.-x, 61.72.Cc, 61.85.+p, 61.43.Bn, 010302 applied physics, [CHIM.MATE] Chemical Sciences/Material chemistry, fungi, Recrystallization (metallurgy), INORGANIC INSULATORS, [CHIM.MATE]Chemical Sciences/Material chemistry, COLLISION CASCADES, 021001 nanoscience & nanotechnology, Condensed Matter Physics, [PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Electronic, Optical and Magnetic Materials, IRRADIATION, chemistry, Chemical physics, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], RADIATION, Atomic physics, 0210 nano-technology
Abstract: Expérience GANIL/ARIBE; International audience; The healing effect of intense electronic energy deposition arising during swift heavy ion (SHI) irradiation is demonstrated in the case of 3C-SiC damaged by nuclear energy deposition. Experimental (ion channeling experiments) and computational (molecular dynamics simulations) studies provide consistent indications of disorder decrease after SHI irradiation. Furthermore, both methods establish that SHI-induced recrystallization takes place at amorphous-crystalline interfaces. The recovery process is unambiguously accounted for by the thermal spike phenomenon.
Published: 2012
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38. Electrical properties of (110) epitaxial lead free ferroelectric Na0.5Bi0.5TiO3 thin films grown by pulsed laser deposition : macroscopic and nanoscale data

Author: Pascal Marchet, Stéphanie Députier, Jean-René Duclere, Aiying Wu, Didier Fasquelle, David Albertini, Brice Gautier, Maryline Guilloux-Viry, Corinne Champeaux, Fabien Remondiere, M. Bousquet, Alexandre Boulle, Paula M. Vilarinho, Axe 3 : organisation structurale multiéchelle des matériaux (SPCTS-AXE3), Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de physique de la matière (LPM), Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Center for Research in Ceramic and Composite Materials (CICECO), Universidade de Aveiro, Institut des Sciences Chimiques de Rennes (ISCR), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA), Unité de Dynamique et Structure des Matériaux Moléculaires (UDSMM), Université du Littoral Côte d'Opale (ULCO), Axe 2 : procédés de traitements de surface, European Project, Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), and Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, Materials science, behavior, piezoceramics, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, Ferroelectricity, Pulsed laser deposition, electrodes, Hysteresis, 0103 physical sciences, [CHIM]Chemical Sciences, Dielectric loss, Crystallite, platinum, Thin film, 0210 nano-technology, Saturation (magnetic)
Abstract: International audience; We report the electrical properties, measured both at the macroscopic and nanometric scales, of epitaxial (110)-Na0.5Bi0.5TiO3 (NBT) thin ﬁlms grown on (110)Pt/(110)SrTiO3 by pulsed laser deposition (PLD). The inﬂuence of the A-site composition (Na and/or Bi excess) on both the structural/microstructural characteristics and the electrical properties is discussed. Whatever the composition of the NBT target, the ﬁnal layers are systematically epitaxially grown, with NBT crystallites mainly (110)-oriented, and as well (100)-oriented for some minor proportion. Atomic force microscopy (AFM) images reveal the coexistence of two kinds of grains presenting different shapes: namely ﬂat and elongated grains, corresponding to (100)- and (110)-oriented NBT crystallites, respectively. The macroscopic ferroelectric properties were measured at room temperature. A rather well-deﬁned shape of the hysteresis loops was obtained: the incorporation of a Bi excess in the target clearly improves the saturation of the loops. The ferroelectric performances are a remanent polarization (Pr ) value, ranging from 7 to 14 lC/cm 2 , associated with a coercive ﬁeld (Ec ) in the range 68-85 kV/cm. In addition, at 10 5 Hz, the relative permittivity was about er 255-410 and the dielectric losses (tan d) were 6%-7%. Finally, the electrical properties at the local scale were investigated by coupling piezoresponse force microscopy (PFM) and tunneling AFM (TUNA) measurements. The collected data reveal that the two types of grains behave differently. The PFM amplitude signal of (110)-oriented grains is very contrasted and such grains are often divided in ferroelectric bi-domains of nanometric sizes, whereas the response of (100)-oriented grains is less contrasted and more homogeneous. The interpretation of the PFM signal is provided. The piezoloop recorded on a (110)NBT grain is strongly distorted and shifted along the vertical axis, in agreement with the vertical drift observed for macroscopic ferroelectric data. Finally, TUNA data clearly indicate that ﬂat grains are leakier than elongated grains, highlighting the anisotropy of the electrical properties at the local scale
Published: 2012
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39. Strain effect in PbTiO3/PbZr0.2Ti0.8O3 superlattices: From polydomain to monodomain structures

Author: N. Lemée, M. G. Karkut, C. Hubault, Brice Gautier, Janez Holc, André Perrin, Loic Dupont, Valérie Demange, C. Davoisne, Alexandre Boulle, M. Kosec, Laboratoire de Physique de la Matière Condensée - UR UPJV 2081 (LPMC), Université de Picardie Jules Verne (UPJV), Laboratoire réactivité et chimie des solides - UMR CNRS 7314 (LRCS), Université de Picardie Jules Verne (UPJV)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut des Sciences Chimiques de Rennes (ISCR), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), INL - Dispositifs Electroniques (INL - DE), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Elect Ceramics Department - slovenia, Jozef Stefan Institute [Ljubljana] (IJS), Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC), Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-École Centrale de Lyon (ECL), Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE)-Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), and Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE)
Subjects: Diffraction, Materials science, General Physics and Astronomy, 02 engineering and technology, 01 natural sciences, deposition, Mosaicity, Pulsed laser deposition, Optics, Lattice constant, 0103 physical sciences, [CHIM]Chemical Sciences, High-resolution transmission electron microscopy, fields, defects, 010302 applied physics, Condensed matter physics, business.industry, layer, 021001 nanoscience & nanotechnology, Ferroelectric thin films, Reciprocal lattice, Epitaxial multilayers, Volume fraction, X-ray crystallography, 0210 nano-technology, business
Abstract: International audience; Ferroelectric symmetric superlattices consisting of alternating layers of PbTiO3 and PbZr0.2Ti0.8O3, were grown by pulsed laser deposition on SrTiO3 and SrRuO3-coated SrTiO3 substrates. The superlattices, with wavelengths K ranging from 20A ° to 200A ° , were analyzed using x-ray diffraction (h 2h diffraction scans, rocking curves, and reciprocal space mapping), high resolution transmission electron microscopy, and piezoforce scanning microscopy. For large-period superlattices, the strain is relieved by the formation of an a/c polydomain structure which propagates through the whole film. We investigate the influence of the wavelength on the a-domain volume fraction, the lattice parameters, the in-plane strain exx, and the mosaicity of the samples. We show that with decreasing the wavelength, a reduction of the a-domain volume fraction is observed as well as a reduced tensile in-plane strain and a lower mosaicity. A concomitant improvement of the local ferroelectric response is detected. Below a critical wavelength of about 30A ° and a critical sample thickness of 500A ° , the formation of 90 a/c domains is inhibited and the superlattices are completely c oriented. Thus the reduced wavelength induces compressive strain which dominates over the tensile clamping due to the thermal expansion mismatch between the substrate and the superlattice. This compressive strain favors a c-oriented structure in the PbTiO3/PbZr0.2Ti0.8O3 superlattices.
Published: 2012
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40. The micro and nanostructure of imperfect oxide epitaxial films

Author: Alexandre Boulle, Florine Conchon, René Guinebretière, Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), EMIX, and E.J. MITTEMEIJER, U. WELZEL
Subjects: 010302 applied physics, Materials science, Nanostructure, business.industry, Oxide, Bragg peak, 02 engineering and technology, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, chemistry.chemical_compound, symbols.namesake, [SPI]Engineering Sciences [physics], Optics, Fourier transform, chemistry, 0103 physical sciences, X-ray crystallography, symbols, Optoelectronics, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS
Abstract: 554 pages; International audience
Published: 2012
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41. Kinetics of the 3C-6H polytypic transition in 3C-SiC single crystals: a diuse X-ray scattering study

Author: Irina G. Galben-Sandulache, Alexandre Boulle, M.F. Beaufort, Jacques Rabier, D. Eyidi, Didier Chaussende, Deborah Dompoint, Thierry Ouisse, Le Thi Mai Hoa, J. L. Demenet, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut Pprime (PPRIME), ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers, Laboratoire des matériaux et du génie physique (LMGP), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique de Grenoble (INPG), and Université de Poitiers-Centre National de la Recherche Scientifique (CNRS)-ENSMA
Subjects: 010302 applied physics, Materials science, Birefringence, Scattering, Annealing (metallurgy), General Physics and Astronomy, 02 engineering and technology, Slip (materials science), [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Crystal, Condensed Matter::Materials Science, Crystallography, Transmission electron microscopy, 0103 physical sciences, Microscopy, Partial dislocations, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS
Abstract: In this work, the kinetics of the 3C-6H polytypic transition in 3C-SiC single crystals are studied in details by means of diffuse x-ray scattering (DXS) coupled with numerical simulations and transmission electron microscopy and optical birefringence microscopy. Upon high-temperature annealing, spatially correlated stacking faults (SFs), lying in the {111} planes, are generated within the crystal and tend to form bands of partially transformed SiC. It is shown that the numerical simulation of the DXS curves allows to unambiguously deduce the transformation level within these bands, as well as the volume fraction corresponding to these bands. Increasing annealing time results (1) in the growth of the partially transformed regions by the glide of the partial dislocations bounding the SFs and (2) in the generation of new SFs within the crystal by means of a double-cross slip motion. The kinetics of each of these mechanisms are presented and discussed with respect to the annealing temperature, the initial SF density and crystalline quality.
Published: 2011
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42. Strain and stress build-up in He-implanted UO2 single crystals: an X-ray diffraction study

Author: F. Garrido, Lionel Thomé, Alexandre Boulle, Aurélien Debelle, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, Materials science, XRD, FUELS, Radiation effects, 02 engineering and technology, UO2, UO 2, 01 natural sciences, Fluence, Stress (mechanics), 0103 physical sciences, Radiation damage, SCATTERING, General Materials Science, Composite material, ION, 010302 applied physics, LATTICE-DEFECTS, Strain (chemistry), He, Mechanical Engineering, Relaxation (NMR), [CHIM.MATE]Chemical Sciences/Material chemistry, CUBIC ZIRCONIA, 021001 nanoscience & nanotechnology, Reciprocal lattice, Crystallography, RADIATION-DAMAGE, Mechanics of Materials, X-ray crystallography, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Defects, 0210 nano-technology, Elastic strain, BEHAVIOR, HELIUM
Abstract: International audience; The strain and stress build-up in 20-keV He-implanted UO 2 single crystals have been determined by means of X-ray diffraction through reciprocal space mapping, with the use of a model dedicated to the analysis of the strain/stress state of ion-irradiated materials. Results indicate that the undamaged part of the crystals exhibits no strain or stress; on the other hand, the implanted layer undergoes a tensile strain directed along the normal to the surface of the crystals and a compressive in-plane stress. The build-up of both strain and stress with He fluence exhibits a two-step process: (i) a progressive increase up to a maximum level of ~ 1% for the strain and ~-2.8 GPa for the stress, followed by (ii) a dramatic decrease. The origin of the strain and stress build-up is the formation of both self-interstitial defects and small He-vacancy clusters. The strain, and stress relief is tentatively attributed to the formation of extended defects (such as dislocations) that induce a plastic relaxation.
Published: 2011
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43. Inhibition of polydomain formation in PbTiO3/PbZr0.2Ti0.8O3 superlattices by intercalation of ultra-thin SrTiO3 layers

Author: Alexandre Boulle, C. Hubault, N. Lemée, M. G. Karkut, Janez Holc, C. Davoisne, M. Kosec, André Perrin, Loic Dupont, Laboratoire de Physique de la Matière Condensée - UR UPJV 2081 (LPMC), Université de Picardie Jules Verne (UPJV), Laboratoire réactivité et chimie des solides - UMR CNRS 7314 (LRCS), Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC), Institut des Sciences Chimiques de Rennes (ISCR), Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Elect Ceramics Department - slovenia, Jozef Stefan Institute [Ljubljana] (IJS), Université de Picardie Jules Verne (UPJV)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), and Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, superlattices, Physics and Astronomy (miscellaneous), Superlattice, Intercalation (chemistry), 02 engineering and technology, 01 natural sciences, Zirconium compounds, epitaxial layers, Pulsed laser deposition, 0103 physical sciences, transmission electron microscopy, lead compounds, [CHIM]Chemical Sciences, Elasticity (economics), 010306 general physics, Polarization (electrochemistry), pulsed laser deposition, Condensed matter physics, association, 021001 nanoscience & nanotechnology, Crystallography, Reciprocal lattice, Transmission electron microscopy, zirconium compounds, elasticity, 0210 nano-technology
Abstract: International audience; We used pulsed laser deposition to grow a series of PbTiO3/PbZr0.2Ti0.8O3 superlattices on SrTiO3 and SrRuO3/SrTiO3 substrates. An a/c polydomain structure was evidenced by reciprocal space mapping and by transmission electron microscopy. Insertion of ultra-thin layers of SrTiO3 at the interfaces between PbTiO3 and PbZr0.2Ti0.8O3 layers has inhibited this polydomain formation. A strong decrease in the tetragonality indicates clearly that the polarization state in these superlattices has changed due to the insertion of the SrTiO3 layers. A purely elastic mechanism does not seem to explain the determined structural parameters
Published: 2011
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44. Characterization and modelling of the ion-irradiation induced disorder in 6H-SiC and 3C-SiC single crystals

Author: Deborah Dompoint, Jacek Jagielski, Didier Chaussende, A. Debelle, Lionel Thomé, Alexandre Boulle, Frédérico Garrido, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), CSNSM PCI, Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institute of Electronic Materials Technology (IEMT), Institute of Electronic Materials Technology, Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), and The Andrzej Soltan Institute for Nuclear Studies
Subjects: Materials science, Acoustics and Ultrasonics, Elastic energy, Analytical chemistry, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Rutherford backscattering spectrometry, Channelling, Microstructure, 01 natural sciences, Synchrotron, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Amorphous solid, Ion, Crystallography, law, 0103 physical sciences, Irradiation, 010306 general physics, 0210 nano-technology, PACS numbers: 6180Jh, 6185+p, 6105cp, 6172-y, 8105Je
Abstract: 6H-SiC and 3C-SiC single crystals were simultaneously irradiated at room temperature with 100 keV Fe ions at fluences up to 4 × 1014 cm−2 (∼0.7 dpa), i.e. up to amorphization. The disordering behaviour of both polytypes has been investigated by means of Rutherford backscattering spectrometry in the channelling mode and synchrotron x-ray diffraction. For the first time, it is experimentally demonstrated that the general damage build-up is similar in both polytypes. At low dose, irradiation induces the formation of small interstitial-type defects. With increasing dose, amorphous domains start to form at the expense of the defective crystalline regions. Full amorphization of the irradiated layer is achieved at the same dose (∼0.45 dpa) for both polytypes. It is also shown that the interstitial-type defects formed during the first irradiation stage induce a tensile elastic strain (up to ∼4.0%) with which is associated an elastic energy. It is conjectured that this stored energy destabilizes the current defective microstructure observed at low dose and stimulates the formation of the amorphous nanostructures at higher dose. Finally, the disorder accumulation has been successfully reproduced with two models (namely multi-step damage accumulation and direct-impact/defect-stimulated). Results obtained from this modelling are compared and discussed in the light of experimental data.
Published: 2010
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45. Strain profile determination in ion implanted single crystals using generalized simulated annealing

Author: Alexandre Boulle, Aurélien Debelle, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, Materials science, Strain (chemistry), Monte Carlo method, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, Dynamical theory of diffraction, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, General Biochemistry, Genetics and Molecular Biology, Ion, Crystallography, Error function, 0103 physical sciences, Simulated annealing, 010306 general physics, 0210 nano-technology, Yttria-stabilized zirconia
Abstract: A novel least-squares fitting procedure is presented that allows the retrieval of strain profiles in ion-implanted single crystals using high-resolution X-ray diffraction. The model is based on the dynamical theory of diffraction, including a B-spline-based description of the lattice strain. The fitting procedure relies on the generalized simulated annealing algorithm which, contrarily to most common least-squares fitting-based methods, allows the global minimum of the error function (the difference between the experimental and the calculated curves) to be found extremely quickly. It is shown that convergence can be achieved in a few hundred Monte Carlo steps,i.e.a few seconds. The method is model-independent and allows determination of the strain profile even without any `guess' regarding its shape. This procedure is applied to the determination of strain profiles in Cs-implanted yttria-stabilized zirconia (YSZ). The strain and damage profiles of YSZ single crystals implanted at different ion fluences are analyzed and discussed.
Published: 2010
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46. Properties of LiNbO3 based heterostructures grown by pulsed-laser deposition for optical waveguiding application

Author: S. Kilburger, C. Di Bin, René Guinebretière, Eric Millon, P. Di Bin, Alexandre Boulle, Laboratoire de Spectrométrie de Masse et de Chimie Laser (LSMCL), Université Paul Verlaine - Metz (UPVM), PHOTONIQUE, XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Groupe de recherches sur l'énergétique des milieux ionisés (GREMI), Centre National de la Recherche Scientifique (CNRS)-Université d'Orléans (UO), Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and MINACOM
Subjects: Materials science, Optical waveguide, Thin films, Lithium niobate, 02 engineering and technology, Epitaxy, 01 natural sciences, Pulsed laser deposition, chemistry.chemical_compound, Optics, Electrical resistivity and conductivity, 0103 physical sciences, Materials Chemistry, Thin film, 010302 applied physics, business.industry, Metals and Alloys, Heterojunction, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Sapphire, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Optoelectronics, Optical losses, Pulsed-laser deposition, 0210 nano-technology, business, Layer (electronics)
Abstract: International audience; Epitaxial LiNbO3 (LN) thin films have been grown onto (00.1) Al2O3 substrates and onto sapphire covered with a conductive ZnO buffer layer. For the two systems, the LN thin films are well crystallised and highly (00.1) oriented. Epitaxial relationships between the different layers are evidenced both on the LN/sapphire film and the LN/ZnO/sapphire heterostructure. The optical waveguiding propagation losses of the LN/ sapphire films are very low (1±0.5 dB/cm) while the LN/ZnO/sapphire heterostructure does not exhibit satisfying waveguiding properties mainly due to the high conductivity (600 S m−1) of the ZnO buffer layer.
Published: 2010
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47. A new way to prepare tin oxide precursor polymeric gels

Author: Wael Hamd, Alexandre Boulle, René Guinebretière, Elsa Thune, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM)
Subjects: Materials science, Base (chemistry), Inorganic chemistry, Gelation time, Infrared spectroscopy, 02 engineering and technology, Sol–gel, 010402 general chemistry, 01 natural sciences, Role of toluene, Biomaterials, chemistry.chemical_compound, Materials Chemistry, Fourier transform infrared spectroscopy, Sol-gel, chemistry.chemical_classification, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Tin oxide, Toluene, 0104 chemical sciences, Electronic, Optical and Magnetic Materials, Solvent, chemistry, Volume fraction, Ceramics and Composites, 0210 nano-technology, Nuclear chemistry
Abstract: International audience; Transparent tin oxide gels are elaborated in the isopropoxide/toluene/isopropanol system. The gelation occurs at room temperature without any acid or base additions. The formation of the SnO2 precursor gels polymeric network is evidenced by Fourier transform infrared spectroscopy. The gelation time is studied as a function of the complexing ratio R = [acac]/[Sn(OR)4], the hydrolysis ratio W = [H2O]/[Sn(OR)4], the concentration of tin oxide precursor C = [Sn(OR)4], and the volume fraction of toluene P = (toluene volume) / (total solvent volume).
Published: 2010
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48. Quantitative analysis of diffuse X-ray scattering in partially transformed 3C-SiC single crystals

Author: I.G. Galben-Sandulache, Didier Chaussende, Deborah Dompoint, Alexandre Boulle, Axe 3 : organisation structurale multiéchelle des matériaux, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Institut des Procédés Appliqués aux Matériaux (IPAM), and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, Phase transition, Materials science, Scattering, business.industry, Stacking, X-ray, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Polarization (waves), Kinetic energy, 01 natural sciences, Molecular physics, General Biochemistry, Genetics and Molecular Biology, Optics, 0103 physical sciences, Partial dislocations, 0210 nano-technology, Structure factor, business
Abstract: The X-ray scattering of partially transformed 3C-SiC single crystals is considered in detail. Extended diffuse scattering streaks, originating from stacking faults (SFs) lying in the {111} planes, are clearly observed in the wide-range reciprocal-space maps. The intensity distribution along the diffuse streaks is simulated with a model including the contributions of the diffuse scattering originating from the SFs [based on the pioneering theoretical description given by Kabra, Pandey & Lele (1986).J. Mater. Sci.21, 1654–1666], the coherent scattering emanating from untransformed areas of the crystals and all θ-dependent terms that affect the scattered intensity (the layer structure factor, the irradiated volume and the polarization of the beam). The quantitative simulation of the diffuse streaks reveals that the transformation occurs through the glide of partial dislocations and allows one to derive the transformation level. It is shown that the 3C polytype is indeed unstable at high temperature. However, it is further shown that defect-free 3C-SiC single crystals remain stable at temperatures where 3C-SiC is known to be usually unstable (2173 K). The origin of this apparent stability is very likely of kinetic nature,i.e.the lack of crystalline defects inhibits the transformation.
Published: 2010
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49. Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na0.5Bi0.5TiO3 thin films

Author: Paula M. Vilarinho, Alain Catherinot, Alexandre Boulle, Aurelian Crunteanu, A. Wu, Jean-René Duclere, Brice Gautier, Corinne Champeaux, M. Bousquet, David Albertini, Maryline Guilloux-Viry, Pascal Marchet, C. Bachelet, Stéphanie Députier, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Axe 2 : procédés de traitements de surface, Center for Research in Ceramic and Composite Materials (CICECO), Universidade de Aveiro, Institut des Sciences Chimiques de Rennes (ISCR), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA), MINACOM, XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), INL - Dispositifs Electroniques (INL - DE), Institut des Nanotechnologies de Lyon (INL), Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-École Centrale de Lyon (ECL), Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE)-Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE), INL - Plateforme Technologique Nanolyon (INL - Nanolyon), Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), European Project, Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, Misorientation, General Physics and Astronomy, 02 engineering and technology, 01 natural sciences, electric domains, Pulsed laser deposition, crystal orientation, 0103 physical sciences, ferroelectric materials, [CHIM]Chemical Sciences, Thin film, pulsed laser deposition, 010302 applied physics, grain size, Condensed matter physics, leakage currents, dielectric hysteresis, Coercivity, 021001 nanoscience & nanotechnology, Ferroelectricity, Grain size, X-ray diffraction, crystal microstructure, Crystallography, Crystallite, sodium compounds, 0210 nano-technology, Single crystal, piezoelectric thin films, ferroelectric thin films, Bismuth compounds
Abstract: International audience; Epitaxial Na0.5Bi0.5TiO3 thin films presenting various thicknesses were grown by pulsed laser deposition on epitaxial 100 platinum bottom layers supported by 100MgO single crystal substrates. X-ray diffraction data indicated that all Na0.5Bi0.5TiO3 layers are single-phased and that 100-oriented Na0.5Bi0.5TiO3 NBT crystallites are extremely predominant. The thinner films respectively 230 and 400 nm display a quasiunique 100 orientation close to 100%, whereas for the thickest film 610 nm, the proportion of 100-oriented Na0.5Bi0.5TiO3 crystallites decreases to 85.50 vol %. Such variation is supposed to result from the degree of misorientation of the Pt layer. Further x-ray investigations revealed a pronounced asymmetry of the 100NBT reflection. Such asymmetry is also observed in the 310NBT reciprocal space maps. The analysis of the asymmetrical broadening of the reciprocal lattice point suggests a variation in the chemical composition across the samples thickness, in agreement with comparative Rutherford backscattering spectroscopy RBS data. In addition, x-ray diffraction -scans data indicate the systematic epitaxial growth of the 100-oriented crystallites. The observation of the microstructure of Na0.5Bi0.5TiO3 films completely corroborates the x-ray diffraction information. Whereas the two thinnest films are characterized by the presence of only one type of grains: i.e., very fine and spherical grains around 50-100 nm in size, the thickest film is characterized by the presence of two types of grains: the aforementioned one and some elongated and "factory roof"-like grains. Thus, we unambiguously attribute that the spherical grains correspond to 100-oriented crystallites, whereas the "factory roof"-like grains are 110-oriented. The room temperature macroscopic ferroelectric properties were measured only for the thickest film. A rather well-defined shape of the polarization-electric P-E field hysteresis loops was recorded, and a vertical drift of the loops was systematically observed. Recentering the hysteresis loops leads to a Pr value of 12.6 C/cm2, associated to a coercive field of about 94 kV/cm. This P-E vertical drift originates from the very asymmetric conduction of the Pt/NBT/Pt capacitors at different polarities, as testified by the current density-electric field curves. Such drift can be caused by the existence of different barrier heights at the bottom and top Pt/Na0.5Bi0.5TiO3 interfaces. In addition, based on the combined RBS and x-ray data, we suggest that the chemical composition variation across the layer also impacts on the polarization vertical drift. Finally, the nanoscale electrical properties of the thinnest film have been characterized by both tunneling atomic force microscopy TUNA and piezoforce microscopy PFM. The TUNA data revealed that leakage currents cannot be noticeably detected below 8 or 10 V, in negative or positive biases, respectively. The PFM data showed that most of the grains seem to be constituted of single ferroelectric domains. In addition, the recorded d33 piezoloops are strongly distorted, and systematically remain in the vertical positive side, in agreement with the vertical drift observed for the macroscopic ferroelectric data. The presence of self-polarization within our thinnest film is finally invoked, and supported by some piezohistogram, in order to justify the distorted shape of the loops as well as the supplementary horizontal shift.
Published: 2010
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50. Role of nanostructure on the optical waveguiding properties of epitaxial LiNbO 3 films

Author: Alexandre Boulle, Eric Millon, S. Kilburger, C. Di Bin, Annie Bessaudou, René Guinebretière, P. Di Bin, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Groupe de recherches sur l'énergétique des milieux ionisés (GREMI), Centre National de la Recherche Scientifique (CNRS)-Université d'Orléans (UO), IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Axe 3 : organisation structurale multiéchelle des matériaux, Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), PHOTONIQUE, Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), and MINACOM
Subjects: 010302 applied physics, Nanostructure, Materials science, Acoustics and Ultrasonics, business.industry, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Mosaicity, Nanocrystalline material, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Pulsed laser deposition, Surface coating, Reciprocal lattice, Optics, 0103 physical sciences, X-ray crystallography, Optoelectronics, Thin film, 0210 nano-technology, business
Abstract: International audience; High quality LiNbO 3 (LN) epitaxial films have been grown onto (001)Al 2 O 3 substrates by pulsed laser deposition. The deposition conditions have been optimized using experimental designs to promote the growth of highly (001)-oriented, phase pure and light-guiding LN films. The structural and nanostructural properties have been investigated by X-ray diffraction reciprocal space mapping and the guiding properties have been investigated by m-line spectroscopy and measurements of the light propagation losses. In particular it is shown that the film composition, the state of strain, the film thickness, the film roughness, the lateral extension of the crystallites building up the film as well as the mosaicity can be determined by a careful examination of the X-ray reciprocal space maps associated with simulation of the diffracted intensity distribution in reciprocal space. The guiding properties have been correlated with the nanostructural properties of the films: whereas light guiding has been clearly observed in single crystal-like films, the existence of a mosaic structure, made of nanocrystalline domains, is shown to be detrimental to the guiding properties.
Published: 2009
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