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Using ellipsometry, the film structure is characterized by optical indices n, k (visible region, 450 nm <  < 580 nm) and the thickness (15 < d < 35 nm). The optical indices change with the quantity of silver deposited, obtaining effective indices of 1.0 < n < 1.8 and 1.6 < k < 2.6 to the smaller deposits that belong to a volumetric fraction between 0.35 and 0.5 of silver in the air. An effective optical thickness film decrease is observed when the silver volumetric fraction increases, and a thickness increase with close indices to solid silver when the deposited silver increases. Optical and effective medium theory indices are compared.