13 results on '"Ionica, I."'
Search Results
2. Undoped junctionless EZ-FET: Model and measurements
3. A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development
4. Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET
5. Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field
6. Back-gated InGaAs-on-insulator lateral N+NN+ MOSFET: Fabrication and typical conduction mechanisms
7. Low-frequency noise in bare SOI wafers: Experiments and model
8. Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers
9. Parasitic bipolar effect in ultra-thin FD SOI MOSFETs
10. Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration
11. A new characterization technique for SOI wafers: Split C(V) in pseudo-MOSFET configuration
12. Field effect and Coulomb blockade in silicon on insulator nanostructures fabricated by atomic force microscope
13. An assessment of the influence of personal branding on financing entrepreneurial ventures.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.