6 results on '"Basler T"'
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2. Study of different parameters influencing IGBT and diode robustness under short-circuit type III conditions
3. Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs
4. Investigation of the avalanche ruggedness of SiC MPS diodes under repetitive unclamped-inductive-switching stress
5. Ruggedness of 1200 V SiC MPS diodes
6. Mechanical analysis of press-pack IGBTs
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