11 results on '"Balestra, Francis"'
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2. Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory
3. Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances
4. New parameter extraction method based on split C–V measurements in FDSOI MOSFETs
5. Characterization and modeling of capacitances in FD-SOI devices
6. Origin of low-frequency noise in pentacene field-effect transistors
7. Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs
8. Low frequency noise in 0.12 μm partially and fully depleted SOI technology
9. Foreword
10. Foreword
11. A method for MOSFET parameter extraction at very low temperature
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