6 results on '"Tan, Yung-Fang"'
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2. Influences of aluminum doping on the microstructures and electrical properties of tantalum nitride thin films before and after annealing
3. Degradation Mechanism Differences between Tin- and Tanelectrode Hzo-Based Ferams Analyzed by Current
4. A high-speed MIM resistive memory cell with an inherent vanadium selector
5. Utilizing compliance current level for controllability of resistive switching in nickel oxide thin films for resistive random-access memory
6. A characteristic improved technique and analysis with plasma treatment to the electrode on oxide-based resistive random access memory
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