Search

Jagged1 (JAG1) is a Notch ligand that contact-dependently activates Notch receptors and regulates cancer progression. The JAG1 intracellular domain (JICD1) is generated from JAG1, like formation of the NOTCH1 intracellular domain (NICD1); however, the role of JICD1 in tumorigenicity has not been comprehensively elucidated. Here we show that JICD1 induces astrocytes to acquire several cancer stem cell properties, including tumor formation, invasiveness, stemness, and resistance to anticancer therapy. The transcriptome, chromatin immunoprecipitation sequencing (ChIP-seq), and proteomics analyses show that JICD1 increases SOX2 expression by forming a transcriptional complex with DDX17, SMAD3, and TGIF2. JICD1-driven tumorigenicity is directly regulated by SOX2. Our results demonstrate that, like NICD1, JICD1 acts as a transcriptional cofactor in formation of the DDX17/SMAD3/TGIF2 transcriptional complex, leading to oncogenic transformation.

This article has been retracted at the request of the Editor-in-Chief and Author. Please see http://www.elsevier.com/locate/withdrawalpolicy . Reason:This article is retracted at the request of the editor as it is a duplication of a paper that has already appeared in at least nine other publications. As such this article represents a severe abuse of the scientific publishing system. It has wasted the time of many reviewers and also wastes costly journal space which is explicitly reserved for publishing original, not self-plagiarized work. Organic Electronics takes a very strong view on this matter. The editors want to inform our readership and authors, that those who publish multiple copies of their papers in Organic Electronics and elsewhere will lose their rights to further publication in this journal.

Diamond-like carbon (DLC) layer was deposited by the Cs+ ion sputtered negative ion deposition technique between hole transport layer and indium tin oxide (ITO) anode for polymeric electroluminescent device. An acidic poly(styrene sulfonate)-doped poly(3,4-ethylene dioxythiophene):poly-(styrenesulphonic acid) (PEDOT:PSS) solution acting as a hole transporting material etches the ITO surface and the PEDOT:PSS/ITO interface is not stable. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry have been used to measure the indium contamination in the organic layers such as PEDOT:PSS and poly[2-methoxy-5-( 2′-ethyl-hexyloxy)-1,4-phenylene vinylene]. From the result, it was found that the DLC buffer layer protects ITO surface from acidic PEDOT:PSS solution and restrains the indium diffusion into organic layer. The device with the DLC layer also has electroluminescent efficiency by almost 2 times in the polymeric electroluminescent device compared with the device without diamond-like carbon layer.

Organic light-emitting diodes (OLEDs) with aluminum cathodes prepared by the ion-beam-assisted deposition (IBAD) have a longer lifetime than thermally evaporated one. The electroluminescent features were examined to compare the rate of degradation in the devices with thermally evaporated Al cathodes and ion-beam-assisted Al cathodes. The dense and highly packed Al cathode effectively prevents the permeation of H 2 O and O 2 through pinhole defects, which results in retarding dark spot growth. Employing thin Al buffer layer diminished Ar + ion-induced damages in phenyl-substituted poly- p -phenylene-vinylene (Ph-PPVs) and limited permeation against H 2 O and O 2 . The interface between Al and Ph-PPV may be modified in IBAD case, even though buffered Al layer was deposited to 30 nm by thermal evaporation prior to Ar + ion beam irradiation. It is believed that the buffered Al film cannot screen the Ar + ions or Al atoms wholly due to the existence of pinholes or non-deposited regions among the columnar structures.

This article has been retracted at the request of the Editor-in-Chief and Author. Please see http://www.elsevier.com/locate/withdrawalpolicy . Reason: This article is part of an extreme case of duplicate publication in which the paper, or nearly identical copies of it, has appeared in at least nine other journals. The authors have acknowledged the abuse, which has also been brought to the attention of the responsible administrators at their institutions. Multiple publication represents a flagrant disregard of international copyright law and scientific ethics, it wastes reviewer's and journal staff time, and is also a very poor use of costly journal space which is explicitly reserved for publishing original work. Thin Solid Films takes a strong view on this matter.

We have fabricated highly stable organic electroluminescent devices based on spin-coated poly- p -phenylene-vynylene (PPV) thin films. The electrical properties of aluminum cathode, prepared by ion beam assisted deposition, on PPV have been investigated and compared to those by thermal evaporation. Although energetic particles of Al assisted by Ar + ion may damage the organic material, I – V – L characteristics are improved by applying thin Al buffer layer. In addition, a dense Al cathode inhibits the permeation of H 2 O and O 2 into PPV film through pinhole defects, and thus retards dark spot growth. It may be deduced from highly packed structure of Al cathode with smaller junction resistance between Al and PPV. In conclusion, the lifetime of organic light-emitting device (OLED) has been extended effectively by dense Al film through ion beam assisted deposition process.

CeO2–SiO2 composite thin films were prepared by e-beam evaporation and ion beam-assisted deposition (IBAD) using an End-Hall ion source. The refractive index of composite thin films exhibited a maximum value at 20–35% SiO2 fraction, indicating the highest packing density. Optical analysis revealed that the transmittance and reflectance spectra of composite films were consistent with the results of the refractive index. The results from X-ray diffractometry (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurements showed that composite thin films containing 20–35% SiO2 concentration had a dense and smooth amorphous surface, compared to the roughened granular structure of the pure SiO2 and CeO2 thin films.

Highly stable organic electroluminescent devices based on spin-coated soluble phenyl-substituted poly- p -phenylene-vinylene (Ph-PPVs) thin films have been achieved. We investigated the electrical properties of ion beam assisted aluminum cathode contacting Ph-PPV and compared them to those of thermal evaporation. Although energetic particles of Al assisted by Ar + ion generate the damages in organic materials, I–V–L characteristics can be improved by using thin Al buffer layer to avoid damages. In addition, dense Al cathode inhibits the permeation of H 2 O and O 2 through pinhole defects, which results in retarding gas bubble formation. This may be explained by highly packed structure of Al cathode and decrease of the contact resistance between Al and Ph-PPV. It is believed that the larger contact area and increase of density of state in Ph-PPV minimize the contact resistance and that results in the longevity of organic light-emitting devices (OLEDs).