1. Following the deformation behavior of nanocrystalline Pd films on polyimide substrates using in situ synchrotron XRD
- Author
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Erhard Schafler, A. Castrup, Michael J. Zehetbauer, R. Baumbusch, Horst Hahn, Patric A. Gruber, Michael Kerber, Jochen Lohmiller, and Oliver Kraft
- Subjects
Materials science ,Metallurgy ,Deformation (meteorology) ,Plasticity ,Nanocrystalline material ,Grain size ,Deformation mechanism ,Mechanics of Materials ,General Materials Science ,Grain boundary ,Thin film ,Dislocation ,Composite material ,Instrumentation - Abstract
The deformation behavior of nanocrystalline Pd films on compliant polyimide substrates is investigated using a synchrotron-based in situ tensile testing technique. The combination of analytical and physical modeling of the evolution of peak shape during deformation allows to subdivide the deformation behavior into elastic, microplastic and macroplastic deformation. The results confirm that the deformation behavior of nanocrystalline Pd in the grain size regime of 50 nm is still governed by dislocation plasticity, however, in addition, thermally activated grain boundary mediated deformation mechanisms are active. The deformation behavior of the nanocrystalline Pd films is thus given by a specific sequence of a highly heterogeneous elastic response of the nanocrystalline aggregate, its accommodation by grain boundary mediated deformation and upcoming dislocation activity within individual grains.
- Published
- 2013
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