28 results on '"Pouget, V."'
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2. Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge
3. Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications
4. Reliability-driven pin assignment optimization to improve in-orbit soft-error rate
5. Approximate TMR based on successive approximation and loop perforation in microprocessors
6. Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells
7. Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions
8. A calculation method to estimate single event upset cross section
9. Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis
10. Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
11. Impact of negative bias temperature instability on the single-event upset threshold of a 65nm SRAM cell
12. Effects of 1064 nm laser on MOS capacitor
13. Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology
14. Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory
15. Net integrity checking by optical localization techniques
16. Electrical modeling of the effect of beam profile for pulsed laser fault injection
17. Effect of physical defect on shmoos in CMOS DSM technologies
18. Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results
19. Application of various optical techniques for ESD defect localization
20. Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
21. Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
22. From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
23. Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits
24. A physical approach on SCOBIC investigation in VLSI
25. Front Side and Backside OBIT Mappings applied to Single Event Transient Testing
26. Theoretical Investigation of an Equivalent Laser LET
27. Laser cross section measurement for the evaluation of single-event effects in integrated circuits
28. Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
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