6 results on '"Panciera, F"'
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2. Ni silicide nanowires analysis by atom probe tomography
3. Ni(Pt)-silicide contacts on CMOS devices: Impact of substrate nature and Pt concentration on the phase formation
4. Atom probe tomography for advanced metallization
5. Pt redistribution in N-MOS transistors during Ni salicide process
6. Atom probe tomography of SRAM transistors: Specimen preparation methods and analysis
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