16 results on '"Monsieur, F."'
Search Results
2. Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies
3. Impact of inside spacer process on fully self-aligned 250GHz SiGe:C HBTs reliability performances: a-Si vs. nitride
4. Degradation mechanism understanding of NLDEMOS SOI in RF applications
5. Modified space-charge limited conduction in tantalum pentoxide MIM capacitors
6. HCI degradation model based on the diffusion equation including the MVHR model
7. Multi-vibrational hydrogen release: Physical origin of Tbd,Qbd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides
8. Breakdown mechanisms in ultra-thin oxides: impact of carrier energy and current through substrate hot carrier stress study
9. On the role of holes in oxide breakdown mechanism in inverted nMOSFETs
10. New insights into the change of voltage acceleration and temperature activation of oxide breakdown
11. Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement
12. Gate oxide Reliability assessment optimization
13. Failures in ultrathin oxides: Stored energy or carrier energy driven?
14. Low frequency noise and reliability properties pf 0.12 μm CMOS devices with Ta2O5 as gate dielectrics
15. Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions
16. Wear-out, breakdown occurrence and failure detection in 18–25 Å ultrathin oxides
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.