30 results on '"Kisielowski C"'
Search Results
2. Preface
3. 3D reconstruction of nanocrystalline particles from a single projection
4. Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy
5. Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution
6. Preface
7. Recording low and high spatial frequencies in exit wave reconstructions
8. Using a monochromator to improve the resolution in TEM to below 0.5Å. Part II: Application to focal series reconstruction
9. Using a monochromator to improve the resolution in TEM to below 0.5Å. Part I: Creating highly coherent monochromated illumination
10. Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope
11. A quantitative procedure to probe for compositional inhomogeneities in InxGa1−xN alloys
12. 3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography
13. From extended defects and interfaces to point defects in three dimensions—The case of InxGa1−xN
14. Electron channelling based crystallography
15. Time, energy, and spatially resolved TEM investigations of defects in InGaN
16. Zincblende and wurtzite phases in InN epilayers and their respective band transitions
17. Local indium segregation and bang gap variations in high efficiency green light emitting InGaN/GaN diodes
18. Nonlinear imaging using annular dark field TEM
19. Band transitions in wurtzite GaN and InN determined by valence electron energy loss spectroscopy
20. Decomposition of an Al–Mg–Cu alloy—a high resolution transmission electron microscopy investigation
21. The influence of structural properties on conductivity and luminescence of MBE grown InN
22. Annular dark field imaging in a TEM
23. A HRTEM study of metastable phase formation in Al–Mg–Cu alloys during artificial aging
24. Quasi-epitaxial growth of thick CuInS2 films by RF reactive sputtering with a thin epilayer buffer
25. Imaging of the crystal structure of silicon nitride at 0.8 Ångström resolution1Work supported by the Director, Office of Science, Office of Basic Energy Sciences, Materials Sciences Division of the US Department of Energy under Contract No. DE-AC03-76SF00098.1
26. Benefits of microscopy with super resolution
27. Sub-Ångstrom high-resolution transmission electron microscopy at 300keV
28. Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution
29. Pulsed laser deposition of aluminum nitride and gallium nitride thin films
30. An approach to quantitative high-resolution transmission electron microscopy of crystalline materials
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.