39 results on '"Gergaud, P."'
Search Results
2. Towards the understanding of the Ti/Al ratio role in solid-state reaction for ohmic contacts on n-GaN
3. In-situ mapping of local orientation and strain in a fully operable infrared sensor
4. Platinum redistribution in the Ni0.9Pt0.1/InP system: Impact on solid-state reaction and layer morphology
5. Superconducting V3Si for quantum circuit applications
6. Superconducting V3Si for quantum circuit applications
7. Influence of dual Ge/C pre-amorphization implantation on the Ni1−Pt Si phase nucleation and growth mechanisms
8. Investigation of recrystallization and stress relaxation in nanosecond laser annealed Si1−xGex/Si epilayers
9. Study of the Ti/InGaAs solid-state reactions: Phase formation sequence and diffusion schemes
10. Grazing-incidence X-ray fluorescence analysis of thin chalcogenide materials deposited on Bragg mirrors
11. Redistribution of phosphorus during NiPtSi formation on in-situ doped Si
12. Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments
13. Phase formation sequence and cobalt behavior in the Ni0.9 Co0.1 system during the thin film solid-state formation
14. In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing
15. Anti phase boundary free GaSb layer grown on 300 mm (001)-Si substrate by metal organic chemical vapor deposition
16. Ni and Ti silicide oxidation for CMOS applications investigated by XRD, XPS and FPP
17. Advanced characterizations of fluorine-free tungsten film and its application as low resistance liner for PCRAM
18. Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol–gel films
19. Kinetics study of NiPt(10 at.%)/Si0.7Ge0.3 solid state reactions
20. Mismatch and thermal strain analysis in MBE-grown HgCdTe/CdZnTe
21. GeTe phase change material and Ti based electrode: Study of thermal stability and adhesion
22. The flow stress in polycrystalline films: Dimensional constraints and strengthening effects
23. Mechanical characterization of low-k and barrier dielectric thin films
24. Evolution under annealing and nitrogen implantation of the mechanical properties of amorphous carbon films
25. First stages of silicidation in Ti/Si thin films
26. In-situ study of stress evolution during solid state reaction of Pd with Si(001) using synchrotron radiation
27. Impact of thermal cycling on the evolution of grain, precipitate and dislocation structure in Al, 0.5% Cu, 1% Si thin films
28. In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation
29. The correlation between mechanical stress and magnetic properties of cobalt ultra thin films
30. Raman spectra of TiN/AlN superlattices
31. A methodology development for the study of near surface stress gradients
32. Chemical vapor deposition of silicon–germanium heterostructures
33. Stress, porosity measurements and corrosion behaviour of AlN films deposited on steel substrates
34. Interdependence between strain relaxation and segregation in Au/Ni multilayers
35. Structure characterization of metallic multilayers by symmetric and asymmetric X-ray diffraction
36. Limits of validity of the crystallite group method in stress determination of thin film structures
37. Epitaxial growth of CeO2 on MgO by pulsed laser deposition
38. X-ray study on single crystal superalloy SRR99: Mismatch γ/γ′, mosaicity and internal stress
39. X-ray diffraction determination of texture and internal stresses in magnetron PVD molybdenum thin films
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