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In this paper, heavily C-doped GaN samples were deposited on glass and PET substrates by the thermionic vacuum arc (TVA) method, for the first time. Microstructure, surface and optical properties of the carbon-doped GaN samples were investigated by X-ray diffraction (XRD), field emission scanning electron microscopy, atomic force microscopy, and UV–Vis spectrophotometer. According to XRD pattern, fullerene (C60) structures were able to deposit in doped samples, for the first time. The fullerene structures were detected at heavily carbon-doped GaN. The obtained band gap changes of heavily carbon-doped GaN samples are determined. The band gap of CGaN on PET substrate decreased to a lower value, about 100 meV. The band gaps were shifted to the lowest wavelengths towards the edge of the UV region by heavily doped carbon. (002) and (004) peaks for GaN were also detected. © 2016 Elsevier Ltd

In this paper, copper oxide (CuO/Cu2O) nanocrystalline thin films were deposited by radio frequency (RF) magnetron sputtering system at 75 W and 100 W. The surface, optical, composition and structural properties of obtaining samples were characterized by using atomic force microscopy (AFM), UV–Vis spectrophotometer, field emission scanning electron microscopy (FESEM), energy dispersive X-ray spectroscopy (EDX) and X-ray diffraction (XRD). The optical band gaps of produced films were calculated as 2.05 eV and 1.83 eV for 75 W and 100 W. The layer’s thicknesses were measured as 20 nm and 50 nm using a Filmetrics F20. FESEM images of the samples prove the AFM images change and also show homogeneity of thin films and variation relative to power change, thus revealed the surface of samples disturb in homogen mode. EDX results denote presence of Cu and O elements inside the deposited samples.

In this paper, GaN thin film production was realized by thermionic vacuum arc (TVA), a plasma deposition technique, for the first time. We present a new deposition mechanism for GaN thin films with a very short production time. Microstructure properties of samples were analyzed by X-ray diffractometry. The peak at 2? = 72.88° corresponding to GaN (0004) was detected in XRD spectra. The surface morphology of the deposited GaN films was analyzed using field emission scanning electron microscopy and atomic force microscopy. The surface properties of the produced samples are quite different. The average roughness values were determined to be 0.48 nm for GaN/PET and 1.17 nm for GaN/glass. The optical properties (i.e., refractive index and reflection) were determined using an interferometer. Moreover, the obtained optical data were compared with bulk GaN materials. The refractive indexes were measured as 2.2, 3,0 and 2,5 for the GaN/glass, GaN/PET and bulk GaN, respectively. The transparencies of the different GaN-coated substrates are nearly the same. The obtained band gap values were measured in the energy range of 3.3-3.5 eV. TVA is a novel non-reactive plasma technique for the generation of metal organic thin films. The main advantage of this method is its fast deposition rate without any loss in the quality of the films. © 2015 Elsevier B.V.

Aluminium doped zinc oxide (AZO) nanostructures have been successfully synthesized on sapphire substrates by using nanoparticle assisted pulsed laser deposition (NAPLD) in Ar atmosphere without using any catalyst. The growth of the AZO nanowires has been investigated by varying the argon flow rates. The coatings have been characterized by X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM), Atomic force microscopy (AFM), Diffuse Reflectance Spectroscopy (DRS), Laser Raman spectroscopy and Photoluminescence spectroscopy. The results of XRD indicate that the deposited films are crystalline ZnO with hexagonal wurtzite structure with (0 0 2) preferred orientation. FESEM images also clearly reveal the hexagonal structure and the formation of nanowires with aspect ratios between 15 and 20. The surface roughness value of 9.19 nm was observed from AFM analysis. The optical properties of the sample showed that under excitation with ? = 325 nm, an emission band was observed in UV and visible region. The characteristic Raman peaks were detected at 328, 380, 420, 430 cm-1. � 2013 Elsevier B.V. All rights reserved.

Synthesis and characterization of Ga-doped ZnO nanodisk and the formation of nanodisk/nanorod hybrid morphologies on AlN/Si substrate by polymer assisted one-pot hydrothermal process have been studied. The low concentration of Ga-ZnO sol (0.2. M) and optimized concentration (0.5. M) of Zinc sol is used to vary the morphology and physico-chemical properties. Varying amounts of Ga (1%-3%) doped ZnO nanodisks have also been synthesized and characterized. The morphology and structural properties were determined by field emission scanning electron microscopy (FESEM) and X-ray diffraction techniques. Ga-ZnO nanodisk shows major intense X-ray diffraction peak at ZnO (101). X-ray photoelectron spectroscopy (XPS) confirms the effect of gallium doping and variation in their surface property after Ga doping in ZnO. FESEM images clearly confirm the pure nanodisk formation for Ga-ZnO (0.5) at optimized ZnO concentration and hybrid nanodisk/nanorod formation obtained for Ga-ZnO (0.2) at lower ZnO concentration. The pure Ga-ZnO (0.5) nanodisk on AlN/Si thin film substrate showed effective response and fast recovery time towards UV light sensing in dark condition compared to low concentration route prepared Ga-ZnO (0.2)/AlN/Si sample. � 2013 Elsevier B.V.