1. In situ x-ray diffraction analysis of 2D crack patterning in thin films
- Author
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Pierre-Olivier Renault, Damien Faurie, T. Sadat, Dominique Thiaudière, Guillaume Parry, Fatih Zighem, Pierre Godard, Laboratoire des Sciences des Procédés et des Matériaux (LSPM), Université Paris 13 (UP13)-Institut Galilée-Université Sorbonne Paris Cité (USPC)-Centre National de la Recherche Scientifique (CNRS), Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), Surface, Interfaces et MAtériaux sous Contrainte SIMAC (SIMAC), Département Physique et Mécanique des Matériaux (Département Physique et Mécanique des Matériaux), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)-Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), Science et Ingénierie des Matériaux et Procédés (SIMaP ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Synchrotron SOLEIL (SSOLEIL), and Centre National de la Recherche Scientifique (CNRS)
- Subjects
Diffraction ,Digital image correlation ,Cracks ,Materials science ,Polymers and Plastics ,[PHYS.MPHY]Physics [physics]/Mathematical Physics [math-ph] ,Mechanical properties ,02 engineering and technology ,Substrate (electronics) ,01 natural sciences ,Synchrotron ,[SPI.AUTO]Engineering Sciences [physics]/Automatic ,[PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph] ,0103 physical sciences ,[PHYS.MECA.MEFL]Physics [physics]/Mechanics [physics]/Fluid mechanics [physics.class-ph] ,[PHYS.MECA.BIOM]Physics [physics]/Mechanics [physics]/Biomechanics [physics.med-ph] ,Composite material ,Thin film ,Plane stress ,[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph] ,[PHYS.MECA.VIBR]Physics [physics]/Mechanics [physics]/Vibrations [physics.class-ph] ,010302 applied physics ,[SPI.FLUID]Engineering Sciences [physics]/Reactive fluid environment ,[SPI.NRJ]Engineering Sciences [physics]/Electric power ,Metals and Alloys ,[CHIM.MATE]Chemical Sciences/Material chemistry ,[PHYS.MECA.MSMECA]Physics [physics]/Mechanics [physics]/Materials and structures in mechanics [physics.class-ph] ,021001 nanoscience & nanotechnology ,[PHYS.MECA.ACOU]Physics [physics]/Mechanics [physics]/Acoustics [physics.class-ph] ,Electronic, Optical and Magnetic Materials ,Stress field ,[SPI.ELEC]Engineering Sciences [physics]/Electromagnetism ,[CHIM.POLY]Chemical Sciences/Polymers ,Flexible substrates ,X-ray crystallography ,[PHYS.MECA.THER]Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph] ,Ceramics and Composites ,Deformation (engineering) ,0210 nano-technology - Abstract
International audience; In this work, the effect of the loading path on the multicracking of Nickel thin films on Kapton® substrate was studied thanks to an experimental set-up combining controlled biaxial deformation, x-ray diffraction and digital image correlation. Samples were biaxially stretched up to 10% strain following either a single equibiaxial path or a complex one consisting of loading successively along each of the axes of the cruciform specimen. While the first path leads to a mud-crack pattern (random), the second leads to a roman-bricks one (square). Moreover, the in situ x-ray diffraction experiments show that the stress field developed in the thin film during the multicracking is clearly dependent on the loading path. By combining the study of stresses and x-ray diffraction peaks linewidth, we evidenced mechanical domains related to initiation of cracks and their multiplication for each loading path. Moreover, stress evolution in the thin film during mud-crack pattern formation is significantly smoother than in the case of roman-bricks one as represented in the plane stress space.
- Published
- 2019
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