1. Statistical analysis and equivalent modelling for the simulation of photoelectronic devices with microstructures
- Author
-
Chung-Jen Ou
- Subjects
Materials science ,Resolution (electron density) ,ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION ,02 engineering and technology ,Function (mathematics) ,Extremely Helpful ,021001 nanoscience & nanotechnology ,Microstructure ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,010309 optics ,0103 physical sciences ,Statistical analysis ,Electrical and Electronic Engineering ,0210 nano-technology ,Algorithm ,Reduction factor - Abstract
Equivalent models using scatter function and the statistical analysis with Hypothesis-test are provided to overcome the computational requirement for simulating complicated microstructures of photoelectronic devices. Strategies are introduced to explore the minimal number of rays and spectrum resolution to complete the analysis. Results indicate that on an average 1/25 reduction factor of computational time is possible, which is extremely helpful if an optimization procedure is required for microstructures.
- Published
- 2019
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