Search

Differential reflectivity spectra of some icosahedral boron rich solids, β-rhombohedral boron, boron carbide and YB 66 -type crystals, were measured. The derivatives yield the van Hove singularities, which are compared with results obtained by other experimental methods. [ABSTRACT FROM AUTHOR]

Highlights: [•] Combined differential reflectivity and transmittivity setup was constructed. [•] Non-equilibrium carrier dynamics was studied in a thick 3C-SiC wafer. [•] Optical delay decays provided nonlinear and surface recombination rates. [•] Electrical delay decays provided bulk defect limited lifetimes. [•] Impact of near-surface and surface defects was revealed. [Copyright &y& Elsevier]

Abstract: The reflection from an ultrathin anisotropic film on an isotropic absorbing substrate is investigated in the long-wavelength limit. The analytical expressions for the differential reflection characteristics of s- and p-polarized electromagnetic plane waves are obtained. All analytical results are correlated with the numerical solution of the reflection problem on the basis of rigorous electromagnetic theory for anisotropic medium. The possibilities of using the obtained approximate formulas for resolving the inverse problem for ultrathin anisotropic dielectric films upon absorbing substrates are discussed. [Copyright &y& Elsevier]

Abstract: The small change in the reflectance (differential reflectance) of s- or p-polarized light from an interference film as a result of the deposition of a nanoscale insulating layer on it is investigated theoretically. Analytical relations describing the contribution of nanoscale layers to the reflectance from an interference film as function of film thickness are obtained in the long-wavelength approximation. It is shown that the utilization of interference films in reflection diagnostics through differential measurements allows a significant enhancement of the sensitivity of these techniques and also opens up new possibilities for resolving the inverse problem of determining simultaneously the optical constant and thickness of nanoscale dielectric layers. [Copyright &y& Elsevier]

This paper experimentally and theoretically examines the scattering properties of simulated non-spherical hydrometeors including water oblates, ice oblates and ice sphere–cone-oblates, in terms of the backscattering cross-section and the differential reflectivity. The experimental measurements of the backscattering cross-sections of non-spherical hydrometeor samples were performed in the Electromagnetic Scattering Laboratory of China National Space Industrial Corporation. Meanwhile, the backscattering cross-sections have been computed with the transition (T) matrix method. The theoretical results are compared with the experimental data, showing that the calculations are consistent with the observations in general. Experimental and theoretical analyses indicate that the backscattering cross-section of non-spherical particles increases as the particle size parameter increases, and fluctuates when the sizes are larger under the effect of resonance scattering. Differential reflectivity of water oblates in natural rainfall is always greater than 0dB whereas of hailstones may be negative. There is a good linear relationship between differential reflectivity and aspect ratio of a particle. These derivations agree with the literature and can be used to identify the presence of hail particles and distinguish between plate-type and columnar-type hydrometeors. In this study, the measuring experiment and the T-matrix method calculations for the scattering of simulated raindrop and ice particles are also briefly described. [Copyright &y& Elsevier]

The effect of nanometer dielectric films on the differential reflection characteristics of linearly polarized light from non-absorbing materials is investigated in the long-wavelength approximation. The second-order formulas for changes in the reflectance of s- and p-polarized light caused by ultrathin layer are obtained. A detailed analysis of the influence of ultrathin film to the reflectivity of p-polarized light in the vicinity of the Brewster angle is carried out. The novel methods are developed for determining the thickness and refractive index of uniform (or the average values of refractive index of nonuniform) nanometer-scale films by differential reflectivity and ellipsometric measurements. [Copyright &y& Elsevier]

The differential reflection characteristics for ultrathin inhomogeneous dielectric film on absorbing substrate are investigated in the long-wavelength approximation. The obtained first-order expressions for differential reflectivity and changes in the ellipsometric angles caused by ultrathin layer are of immediate interest to the solution of the inverse problem. The method to determine the averaged values (not the realistic profile) of refractive index for inhomogeneous nanometric films are shown. The novel possibilities for determining the dielectric constant and thickness of nanoscale homogeneous films by the differential ellipsometric and reflectivity measurements are developed, and a simple method to estimate whether the nanometric film is homogeneous or not is also discussed. [Copyright &y& Elsevier]