Author: "Panciera, F" / Publisher: elsevier b.v. - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Panciera, F"' showing total 6 results

Start Over Author "Panciera, F" Publisher elsevier b.v.

6 results on '"Panciera, F"'

1. Lateral growth of NiSi at the θ-Ni2Si/Si(100) interface: Experiments and modelling

Author: Mangelinck, D., El Kousseifi, M., Hoummada, K., Panciera, F., and Epicier, T.
Published: 2018
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2. Atom probe tomography for advanced metallization

Author: Mangelinck, D., Panciera, F., Hoummada, K., El Kousseifi, M., Perrin, C., Descoins, M., and Portavoce, A.
Published: 2014
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3. Ni(Pt)-silicide contacts on CMOS devices: Impact of substrate nature and Pt concentration on the phase formation

Author: Panciera, F., Hoummada, K., Perrin, C., El Kousseifi, M., Pantel, R., Descoins, M., Gregoire, M., Juhel, M., and Mangelinck, D.
Published: 2014
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4. Ni silicide nanowires analysis by atom probe tomography

Author: El Kousseifi, M., Panciera, F., Hoummada, K., Descoins, M., Baron, T., and Mangelinck, D.
Published: 2014
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5. Pt redistribution in N-MOS transistors during Ni salicide process

Author: Panciera, F., Hoummada, K., Gregoire, M., Juhel, M., and Mangelinck, D.
Published: 2013
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6. Atom probe tomography of SRAM transistors: Specimen preparation methods and analysis

Author: Panciera, F., Hoummada, K., Gregoire, M., Juhel, M., Lorut, F., Bicais, N., and Mangelinck, D.
Published: 2013
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