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Doped and co-doped vanadium oxide (VO) thin films were deposited on quartz substrates with varying concentrations of doping elements by sol-gel spin coating technique. The VO thin films were characterized by the X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), cross-sectional FESEM and X-ray photoelectron spectroscopy (XPS) techniques. The optical properties, e.g., the average solar absorptance (α s), the average solar reflectance (ρ s) and the average solar transmittance (τ s) of the films deposited on quartz were evaluated by using a solar spectrum reflectometer. Based on the optical characterizations, an optimized doping concentration was identified. Further, a process optimized condition was utilized to grow both doped and co-doped vanadium oxide films on metallic Al6061 substrates; which are generally used in spacecraft. The phase transitions of all as grown vanadium oxide films on Al6061 were characterized by the differential scanning calorimetry (DSC) technique. The thin films showed reversible and repeatable phase transitions at sub-zero level of temperatures e.g., ∼ (̶ 23.3 °C). Thus, the VO thin films developed in the present work emerge out to be of paramount importance for the smart radiative device applications in spacecraft. [ABSTRACT FROM AUTHOR]

Smooth, uniform and crystalline vanadium oxide thin films were deposited on quartz by spin coating technique with four different rpm i.e., 1000, 2000, 3000 and 4000 and subsequently post annealed at 350, 450 and 550 °C in vacuum. Transmission electron microscopy (TEM), Field emission scanning electron microscopy (FESEM) and X-ray diffraction (XRD) techniques were utilized for microstructural characterizations and phase analysis, respectively, for vanadium oxide powder and deposited film. Nanorods were observed to be grown after vacuum annealing. X-ray photoelectron spectroscopy (XPS) technique was utilized to study the elemental oxidation state of deposited vanadium oxide films. Thermo-optical and electrical properties such as solar transmittance (τ s ), reflectance (ρ s ), absorptance (α s ), infrared (IR) emittance (ε ir ) and sheet resistance (R s ) of different thin films were evaluated. Based on the optical characteristics the optimized condition of the film processing was identified to be spin coated at 3000 rpm. Subsequently, the nanoindentation technique was utilized to measure hardness and Young's modulus of the optimized film. The measured nanomechanical properties were found to be superior to those reported for sputtered vanadium oxide films. Finally, temperature dependent phase transition characteristics of optimized vanadium oxide films were studied by differential scanning calorimetry (DSC) technique. Reversible and repeatable phase transition was found to occur in the range of 44–48 °C which was significantly lower than the phase transition temperature (i.e., 68 °C) of bulk VO 2 . [ABSTRACT FROM AUTHOR]