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19 results on '"Hu, S.C"'

1. Data quality control system and long-term performance monitor of LHAASO-KM2A

Author

Cao, Zhen, Aharonian, F., Axikegu, Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Bian, W., Bukevich, A.V., Cao, Q., Cao, W.Y., Cao, Zhe, Chang, J., Chang, J.F., Chen, A.M., Chen, E.S., Chen, H.X., Chen, Liang, Chen, Lin, Chen, Long, Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, Y., Cheng, N., Cheng, Y.D., Cui, M.Y., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, Dong, X.Q., Duan, K.K., Fan, J.H., Fan, Y.Z., Fang, J., Fang, J.H., Fang, K., Feng, C.F., Feng, H., Feng, L., Feng, S.H., Feng, X.T., Feng, Y., Feng, Y.L., Gabici, S., Gao, B., Gao, C.D., Gao, Q., Gao, W., Gao, W.K., Ge, M.M., Geng, L.S., Giacinti, G., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, F.L., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., Hasan, M., He, H.H., He, H.N., He, J.Y., He, Y., Hor, Y.K., Hou, B.W., Hou, C., Hou, X., Hu, H.B., Hu, Q., Hu, S.C., Huang, D.H., Huang, T.Q., Huang, W.J., Huang, X.T., Huang, X.Y., Huang, Y., Ji, X.L., Jia, H.Y., Jia, K., Jiang, K., Jiang, X.W., Jiang, Z.J., Jin, M., Kang, M.M., Karpikov, I., Kuleshov, D., Kurinov, K., Li, B.B., Li, C.M., Li, Cheng, Li, Cong, Li, D., Li, F., Li, H.B., Li, H.C., Li, Jian, Li, Jie, Li, K., Li, S.D., Li, W.L., Li, X.R., Li, Xin, Li, Y.Z., Li, Zhe, Li, Zhuo, Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, D.B., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y., Liu, Y.N., Luo, Q., Luo, Y., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Min, Z., Mitthumsiri, W., Mu, H.J., Nan, Y.C., Neronov, A., Ou, L.J., Pattarakijwanich, P., Pei, Z.Y., Qi, J.C., Qi, M.Y., Qiao, B.Q., Qin, J.J., Raza, A., Ruffolo, D., Sáiz, A., Saeed, M., Semikoz, D., Shao, L., Shchegolev, O., Sheng, X.D., Shu, F.W., Song, H.C., Stenkin, Yu.V., Stepanov, V., Su, Y., Sun, D.X., Sun, Q.N., Sun, X.N., Sun, Z.B., Takata, J., Tam, P.H.T., Tang, Q.W., Tang, R., Tang, Z.B., Tian, W.W., Wang, C., Wang, C.B., Wang, G.W., Wang, H.G., Wang, H.H., Wang, J.C., Wang, Kai, Wang, L.P., Wang, L.Y., Wang, P.H., Wang, R., Wang, W., Wang, X.G., Wang, X.Y., Wang, Y., Wang, Y.D., Wang, Y.J., Wang, Z.H., Wang, Z.X., Wang, Zhen, Wang, Zheng, Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, Q.W., Wu, S., Wu, X.F., Wu, Y.S., Xi, S.Q., Xia, J., Xiang, G.M., Xiao, D.X., Xiao, G., Xin, Y.L., Xing, Y., Xiong, D.R., Xiong, Z., Xu, D.L., Xu, R.F., Xu, R.X., Xu, W.L., Xue, L., Yan, D.H., Yan, J.Z., Yan, T., Yang, C.W., Yang, C.Y., Yang, F., Yang, F.F., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, W.X., Yao, Y.H., Yao, Z.G., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Yue, H., Zeng, H.D., Zeng, T.X., Zeng, W., Zha, M., Zhang, B.B., Zhang, F., Zhang, H., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, Li, Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.B., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y.F., Zhang, Yi, Zhang, Yong, Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zhao, X.H., Zheng, F., Zhong, W.J., Zhou, B., Zhou, H., Zhou, J.N., Zhou, M., Zhou, P., Zhou, R., Zhou, X.X., Zhu, B.Y., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., Zou, Y.C., and Zuo, X.

Published
2025
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2. Evidence for particle acceleration approaching PeV energies in the W51 complex

Author

Cao, Zhen, Aharonian, F., Axikegu, Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Bian, W., Bukevich, A.V., Cao, Q., Cao, W.Y., Cao, Zhe, Chang, J., Chang, J.F., Chen, A.M., Chen, E.S., Chen, H.X., Chen, Liang, Chen, Lin, Chen, Long, Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, Y., Cheng, N., Cheng, Y.D., Cui, M.Y., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, Dong, X.Q., Duan, K.K., Fan, J.H., Fan, Y.Z., Fang, J., Fang, J.H., Fang, K., Feng, C.F., Feng, H., Feng, L., Feng, S.H., Feng, X.T., Feng, Y., Feng, Y.L., Gabici, S., Gao, B., Gao, C.D., Gao, Q., Gao, W., Gao, W.K., Ge, M.M., Geng, L.S., Giacinti, G., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, F.L., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., Hasan, M., He, H.H., He, H.N., He, J.Y., He, Y., Hor, Y.K., Hou, B.W., Hou, C., Hou, X., Hu, H.B., Hu, Q., Hu, S.C., Huang, D.H., Huang, T.Q., Huang, W.J., Huang, X.T., Huang, X.Y., Huang, Y., Ji, X.L., Jia, H.Y., Jia, K., Jiang, K., Jiang, X.W., Jiang, Z.J., Jin, M., Kang, M.M., Karpikov, I., Kuleshov, D., Kurinov, K., Li, B.B., Li, C.M., Li, Cheng, Li, Cong, Li, D., Li, F., Li, H.B., Li, H.C., Li, Jian, Li, Jie, Li, K., Li, S.D., Li, W.L., Li, X.R., Li, Xin, Li, Y.Z., Li, Zhe, Li, Zhuo, Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, D.B., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y., Liu, Y.N., Luo, Q., Luo, Y., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Min, Z., Mitthumsiri, W., Mu, H.J., Nan, Y.C., Neronov, A., Ou, L.J., Pattarakijwanich, P., Pei, Z.Y., Qi, J.C., Qi, M.Y., Qiao, B.Q., Qin, J.J., Raza, A., Ruffolo, D., Sáiz, A., Saeed, M., Semikoz, D., Shao, L., Shchegolev, O., Sheng, X.D., Shu, F.W., Song, H.C., Stenkin, Yu.V., Stepanov, V., Su, Y., Sun, D.X., Sun, Q.N., Sun, X.N., Sun, Z.B., Takata, J., Tam, P.H.T., Tang, Q.W., Tang, R., Tang, Z.B., Tian, W.W., Wang, C., Wang, C.B., Wang, G.W., Wang, H.G., Wang, H.H., Wang, J.C., Wang, Kai, Wang, L.P., Wang, L.Y., Wang, P.H., Wang, R., Wang, W., Wang, X.G., Wang, X.Y., Wang, Y., Wang, Y.D., Wang, Y.J., Wang, Z.H., Wang, Z.X., Wang, Zhen, Wang, Zheng, Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, Q.W., Wu, S., Wu, X.F., Wu, Y.S., Xi, S.Q., Xia, J., Xiang, G.M., Xiao, D.X., Xiao, G., Xin, Y.L., Xing, Y., Xiong, D.R., Xiong, Z., Xu, D.L., Xu, R.F., Xu, R.X., Xu, W.L., Xue, L., Yan, D.H., Yan, J.Z., Yan, T., Yang, C.W., Yang, C.Y., Yang, F., Yang, F.F., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, W.X., Yao, Y.H., Yao, Z.G., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Yue, H., Zeng, H.D., Zeng, T.X., Zeng, W., Zha, M., Zhang, B.B., Zhang, F., Zhang, H., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, Li, Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.B., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y.F., Zhang, Yi, Zhang, Yong, Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zhao, X.H., Zheng, F., Zhong, W.J., Zhou, B., Zhou, H., Zhou, J.N., Zhou, M., Zhou, P., Zhou, R., Zhou, X.X., Zhu, B.Y., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., Zou, Y.C., Zuo, X., and Celli, S.

Published
2024
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3. Method to measure muon content of extensive air showers with LHAASO KM2A-WCDA synergy

Author

Cao, Zhen, Aharonian, F., An, Q., Axikegu, Bai, L.X., Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Cai, J.T., Cao, Q., Cao, W.Y., Cao, Zhe, Chang, J., Chang, J.F., Chen, E.S., Chen, Liang, Chen, Lin, Chen, Long, Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, Y., Cheng, H.L., Cheng, N., Cheng, Y.D., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, della Volpe, D., Dong, X.Q., Duan, K.K., Fan, J.H., Fan, Y.Z., Fang, J., Fang, K., Feng, C.F., Feng, L., Feng, S.H., Feng, X.T., Feng, Y.L., Gao, B., Gao, C.D., Gao, L.Q., Gao, Q., Gao, W., Gao, W.K., Ge, M.M., Geng, L.S., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, F.L., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., He, H.H., He, H.N., He, J.Y., He, X.B., He, Y., Heller, M., Hor, Y.K., Hou, B.W., Hou, C., Hou, X., Hu, H.B., Hu, Q., Hu, S.C., Huang, D.H., Huang, T.Q., Huang, W.J., Huang, X.T., Huang, X.Y., Huang, Y., Huang, Z.C., Ji, X.L., Jia, H.Y., Jia, K., Jiang, K., Jiang, X.W., Jiang, Z.J., Jin, M., Kang, M.M., Ke, T., Kuleshov, D., Kurinov, K., Li, B.B., Li, Cheng, Li, Cong, Li, D., Li, F., Li, H.B., Li, H.C., Li, H.Y., Li, J., Li, Jian, Li, Jie, Li, K., Li, W.L., Li, X.R., Li, Xin, Li, Y.Z., Li, Zhe, Li, Zhuo, Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, J.S., Liu, J.Y., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y., Liu, Y.N., Long, W.J., Lu, R., Luo, Q., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Min, Z., Mitthumsiri, W., Nan, Y.C., Ou, Z.W., Pang, B.Y., Pattarakijwanich, P., Pei, Z.Y., Qi, M.Y., Qi, Y.Q., Qiao, B.Q., Qin, J.J., Ruffolo, D., Sáiz, A., Shao, C.Y., Shao, L., Shchegolev, O., Sheng, X.D., Song, H.C., Stenkin, Yu.V., Stepanov, V., Su, Y., Sun, Q.N., Sun, X.N., Sun, Z.B., Tam, P.H.T., Tang, Z.B., Tian, W.W., Wang, C., Wang, C.B., Wang, G.W., Wang, H.G., Wang, H.H., Wang, J.C., Wang, J.S., Wang, K., Wang, L.P., Wang, L.Y., Wang, P.H., Wang, R., Wang, W., Wang, X.G., Wang, X.Y., Wang, Y., Wang, Y.D., Wang, Y.J., Wang, Z.H., Wang, Z.X., Wang, Zhen, Wang, Zheng, Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, S., Wu, X.F., Wu, Y.S., Xi, S.Q., Xia, J., Xia, J.J., Xiang, G.M., Xiao, D.X., Xiao, G., Xin, G.G., Xin, Y.L., Xing, Y., Xiong, Z., Xu, D.L., Xu, R.F., Xu, R.X., Xue, L., Yan, D.H., Yan, J.Z., Yan, T., Yang, C.W., Yang, F., Yang, F.F., Yang, H.W., Yang, J.Y., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, S.B., Yao, Y.H., Yao, Z.G., Ye, Y.M., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Yue, H., Zeng, H.D., Zeng, T.X., Zeng, W., Zeng, Z.K., Zha, M., Zhang, B.B., Zhang, F., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, L.X., Zhang, Li, Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.B., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y.F., Zhang, Yi, Zhang, Yong, Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zheng, F., Zheng, Y., Zhou, B., Zhou, H., Zhou, J.N., Zhou, P., Zhou, R., Zhou, X.X., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., and Zuo, X.

Published
2024
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4. Pointing calibration of LHAASO-WFCTA telescopes using bright stars

Author

Cao, Zhen, Aharonian, F., An, Q., Axikegu, Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Cai, J.T., Cao, Q., Cao, W.Y., Cao, Zhe, Chang, J., Chang, J.F., Chen, A.M., Chen, E.S., Chen, Liang, Chen, Lin, Chen, Long, Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, Y., Cheng, N., Cheng, Y.D., Cui, M.Y., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, della Volpe, D., Dong, X.Q., Duan, K.K., Fan, J.H., Fan, Y.Z., Fang, J., Fang, K., Feng, C.F., Feng, L., Feng, S.H., Feng, X.T., Feng, Y.L., Gabici, S., Gao, B., Gao, C.D., Gao, L.Q., Gao, Q., Gao, W., Gao, W.K., Ge, M.M., Geng, L.S., Giacinti, G., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, F.L., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., He, H.H., He, H.N., He, J.Y., He, X.B., He, Y., Heller, M., Hor, Y.K., Hou, B.W., Hou, C., Hou, X., Hu, H.B., Hu, Q., Hu, S.C., Huang, D.H., Huang, T.Q., Huang, W.J., Huang, X.T., Huang, X.Y., Huang, Y., Huang, Z.C., Ji, X.L., Jia, H.Y., Jia, K., Jiang, K., Jiang, X.W., Jiang, Z.J., Jin, M., Kang, M.M., Ke, T., Kuleshov, D., Kurinov, K., Li, B.B., Li, Cheng, Li, Cong, Li, D., Li, F., Li, H.B., Li, H.C., Li, H.Y., Li, J., Li, Jian, Li, Jie, Li, K., Li, W.L., Li, X.R., Li, Xin, Li, Y.Z., Li, Zhe, Li, Zhuo, Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, J.Y., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y., Liu, Y.N., Lu, R., Luo, Q., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Min, Z., Mitthumsiri, W., Mu, H.J., Nan, Y.C., Neronov, A., Ou, Z.W., Pang, B.Y., Pattarakijwanich, P., Pei, Z.Y., Qi, M.Y., Qi, Y.Q., Qiao, B.Q., Qin, J.J., Ruffolo, D., Sáiz, A., Semikoz, D., Shao, C.Y., Shao, L., Shchegolev, O., Sheng, X.D., Shu, F.W., Song, H.C., Stenkin, Yu.V., Stepanov, V., Su, Y., Sun, Q.N., Sun, X.N., Sun, Z.B., Tam, P.H.T., Tang, Q.W., Tang, Z.B., Tian, W.W., Wang, C., Wang, C.B., Wang, G.W., Wang, H.G., Wang, H.H., Wang, J.C., Wang, K., Wang, L.P., Wang, L.Y., Wang, P.H., Wang, R., Wang, W., Wang, X.G., Wang, X.Y., Wang, Y., Wang, Y.D., Wang, Y.J., Wang, Z.H., Wang, Z.X., Wang, Zhen, Wang, Zheng, Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, S., Wu, X.F., Wu, Y.S., Xi, S.Q., Xia, J., Xia, J.J., Xiang, G.M., Xiao, D.X., Xiao, G., Xin, G.G., Xin, Y.L., Xing, Y., Xiong, Z., Xu, D.L., Xu, R.F., Xu, R.X., Xu, W.L., Xue, L., Yan, D.H., Yan, J.Z., Yan, T., Yang, C.W., Yang, F., Yang, F.F., Yang, H.W., Yang, J.Y., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, S.B., Yao, Y.H., Yao, Z.G., Ye, Y.M., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Yue, H., Zeng, H.D., Zeng, T.X., Zeng, W., Zha, M., Zhang, B.B., Zhang, F., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, L.X., Zhang, Li, Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.B., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y.F., Zhang, Yi, Zhang, Yong, Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zheng, F., Zhou, B., Zhou, H., Zhou, J.N., Zhou, M., Zhou, P., Zhou, R., Zhou, X.X., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., and Zuo, X.

Published
2023
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7. Absolute calibration of LHAASO WFCTA camera based on LED

Author

Aharonian, F., An, Q., Axikegu, Bai, L.X., Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Cai, H., Cai, J.T., Cao, Zhen, Cao, Zhe, Chang, J., Chang, J.F., Chen, B.M., Chen, E.S., Chen, J., Chen, Liang, Chen, Long, Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, X.L., Chen, Y., Cheng, N., Cheng, Y.D., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, della Volpe, D., Piazzoli, B. D’Ettorre, Dong, X.J., Duan, K.K., Fan, J.H., Fan, Y.Z., Fan, Z.X., Fang, J., Fang, K., Feng, C.F., Feng, L., Feng, S.H., Feng, Y.L., Fu, Y.T., Gan, H.Y., Gao, B., Gao, C.D., Gao, L.Q., Gao, Q., Gao, W., Ge, M.M., Geng, L.S., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, F.L., Guo, J.G., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., He, H.H., He, H.N., He, J.C., He, S.L., He, X.B., He, Y., Heller, M., Hor, Y.K., Hou, C., Hu, H.B., Hu, S., Hu, S.C., Hu, X.J., Huang, D.H., Huang, Q.L., Huang, W.H., Huang, X.T., Huang, X.Y., Huang, Z.C., Ji, F., Ji, X.L., Jia, H.Y., Jiang, K., Jiang, Z.J., Jin, C., Ke, T., Kuleshov, D., Levochkin, K., Li, B.B., Li, Cong, Li, Cheng, Li, F., Li, H.B., Li, H.C., Li, H.Y., Li, J., Li, K., Li, W.L., Li, Xin, Li, X.R., Li, Y., Li, Y.Z., Li, Zhe, Li, Zhuo, Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, J.S., Liu, J.Y., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y., Liu, Y.N., Liu, Z.X., Long, W.J., Lu, R., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Masood, A., Min, Z., Mitthumsiri, W., Montaruli, T., Nan, Y.C., Pang, B.Y., Pattarakijwanich, P., Pei, Z.Y., Qi, M.Y., Qi, Y.Q., Qiao, B.Q., Qin, J.J., Ruffolo, D., Rulev, V., Sáiz, A., Shao, L., Shchegolev, O., Sheng, X.D., Shi, J.Y., Song, H.C., Stenkin, Yu.V., Stepanov, V., Su, Y., Sun, Q.N., Sun, X.N., Sun, Z.B., Tam, P.H.T., Tang, Z.B., Tian, W.W., Wang, B.D., Wang, C., Wang, H., Wang, H.G., Wang, J.C., Wang, J.S., Wang, L.P., Wang, L.Y., Wang, R.N., Wang, W., Wang, X.G., Wang, X.J., Wang, X.Y., Wang, Y., Wang, Y.D., Wang, Y.J., Wang, Y.P., Wang, Z.H., Wang, Z.X., Wang, Zhen, Wang, Zheng, Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, S., Wu, W.X., Wu, X.F., Xi, S.Q., Xia, J., Xia, J.J., Xiang, G.M., Xiao, D.X., Xiao, G., Xiao, H.B., Xin, G.G., Xin, Y.L., Xing, Y., Xu, D.L., Xu, R.X., Xue, L., Yan, D.H., Yan, J.Z., Yang, C.W., Yang, F.F., Yang, J.Y., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, S.B., Yao, Y.H., Yao, Z.G., Ye, Y.M., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Zeng, H.D., Zeng, T.X., Zeng, W., Zeng, Z.K., Zha, M., Zhai, X.X., Zhang, B.B., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, J.W., Zhang, Lu, Zhang, Li, Zhang, L.X., Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y.F., Zhang, Y.L., Zhang, Yong, Zhang, Yi, Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zheng, F., Zheng, Y., Zhou, B., Zhou, H., Zhou, J.N., Zhou, P., Zhou, R., Zhou, X.X., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., and Zuo, X.

Published
2022
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8. Performance test of the electromagnetic particle detectors for the LHAASO experiment

Author

Aharonian, F., An, Q., Axikegu, Bai, L.X., Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Cai, H., Cai, J.T., Cao, Z., Chang, J., Chang, J.F., Chang, X.C., Chen, B.M., Chen, J., Chen, L., Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, X.L., Chen, Y., Cheng, N., Cheng, Y.D., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, della Volpe, D., D’Ettorre Piazzoli, B., Dong, X.J., Fan, J.H., Fan, Y.Z., Fan, Z.X., Fang, J., Fang, K., Feng, C.F., Feng, L., Feng, S.H., Feng, Y.L., Gao, B., Gao, C.D., Gao, Q., Gao, W., Ge, M.M., Geng, L.S., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, J.G., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., He, H.H., He, H.N., He, J.C., He, S.L., He, X.B., He, Y., Heller, M., Hor, Y.K., Hou, C., Hou, X., Hu, H.B., Hu, S., Hu, S.C., Hu, X.J., Huang, D.H., Huang, Q.L., Huang, W.H., Huang, X.T., Huang, Z.C., Ji, F., Ji, X.L., Jia, H.Y., Jia, K., Jiang, K., Jiang, Z.J., Jin, C., Kuleshov, D., Levochkin, K., Li, B., Li, B.B., Li, C., Li, F., Li, H., Li, H.B., Li, H.C., Li, H.Y., Li, J., Li, K., Li, W.L., Li, X., Li, X.R., Li, Y., Li, Y.Z., Li, Z., Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, J.S., Liu, J.Y., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y.N., Liu, Z.X., Long, W.J., Lu, R., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Masood, A., Mitthumsiri, W., Montaruli, T., Nan, Y.C., Pang, B.Y., Pattarakijwanich, P., Pei, Z.Y., Qi, M.Y., Ruffolo, D., Rulev, V., Sáiz, A., Shao, L., Shchegolev, O., Sheng, X.D., Shi, J.R., Song, H.C., Stenkin, Yu.V., Stepanov, V., Sun, Q.N., Sun, X.N., Sun, Z.B., Tam, P.H.T., Tang, Z.B., Tian, W.W., Wang, B.D., Wang, C., Wang, H., Wang, H.G., Wang, J.C., Wang, J.S., Wang, L.P., Wang, L.Y., Wang, R.N., Wang, W., Wang, X.G., Wang, X.J., Wang, X.Y., Wang, Y.D., Wang, Y.J., Wang, Y.P., Wang, Z., Wang, Z.H., Wang, Z.X., Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, S., Wu, W.X., Wu, X.F., Xi, S.Q., Xia, J., Xia, J.J., Xiang, G.M., Xiao, G., Xiao, H.B., Xin, G.G., Xin, Y.L., Xing, Y., Xu, D.L., Xu, R.X., Xue, L., Yan, D.H., Yang, C.W., Yang, F.F., Yang, J.Y., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, S.B., Yao, Y.H., Yao, Z.G., Ye, Y.M., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Zeng, H.D., Zeng, T.X., Zeng, W., Zeng, Z.K., Zha, M., Zhai, X.X., Zhang, B.B., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, J.W., Zhang, L., Zhang, L.X., Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y., Zhang, Y.F., Zhang, Y.L., Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zhao, X., Zheng, F., Zheng, Y., Zhou, B., Zhou, H., Zhou, J.N., Zhou, P., Zhou, R., Zhou, X.X., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., and Zuo, X.

Published
2021
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9. Corrigendum to “Performance test of the electromagnetic particle detectors for the LHAASO experiment” [Nucl. Instrum. Methods Phys. Res. A 1001 (2021) 165193]

Author

Aharonian, F., An, Q., Axikegu, Bai, L.X., Bai, Y.X., Bao, Y.W., Bastieri, D., Bi, X.J., Bi, Y.J., Cai, H., Cai, J.T., Cao, Z., Chang, J., Chang, J.F., Chang, X.C., Chen, B.M., Chen, J., Chen, L., Chen, M.J., Chen, M.L., Chen, Q.H., Chen, S.H., Chen, S.Z., Chen, T.L., Chen, X.L., Chen, Y., Cheng, N., Cheng, Y.D., Cui, S.W., Cui, X.H., Cui, Y.D., Dai, B.Z., Dai, H.L., Dai, Z.G., Danzengluobu, della Volpe, D., Piazzoli, B. D’Ettorre, Dong, X.J., Fan, J.H., Fan, Y.Z., Fan, Z.X., Fang, J., Fang, K., Feng, C.F., Feng, L., Feng, S.H., Feng, Y.L., Gao, B., Gao, C.D., Gao, Q., Gao, W., Ge, M.M., Geng, L.S., Gong, G.H., Gou, Q.B., Gu, M.H., Guo, J.G., Guo, X.L., Guo, Y.Q., Guo, Y.Y., Han, Y.A., He, H.H., He, H.N., He, J.C., He, S.L., He, X.B., He, Y., Heller, M., Hor, Y.K., Hou, C., Hou, X., Hu, H.B., Hu, S., Hu, S.C., Hu, X.J., Huang, D.H., Huang, Q.L., Huang, W.H., Huang, X.T., Huang, Z.C., Ji, F., Ji, X.L., Jia, H.Y., Jia, K., Jiang, K., Jiang, Z.J., Jin, C., Kuleshov, D., Levochkin, K., Li, B., Li, B.B., Li, C., Li, F., Li, H., Li, H.B., Li, H.C., Li, H.Y., Li, J., Li, K., Li, W.L., Li, X., Li, X.R., Li, Y., Li, Y.Z., Li, Z., Liang, E.W., Liang, Y.F., Lin, S.J., Liu, B., Liu, C., Liu, D., Liu, H., Liu, H.D., Liu, J., Liu, J.L., Liu, J.S., Liu, J.Y., Liu, M.Y., Liu, R.Y., Liu, S.M., Liu, W., Liu, Y.N., Liu, Z.X., Long, W.J., Lu, R., Lv, H.K., Ma, B.Q., Ma, L.L., Ma, X.H., Mao, J.R., Masood, A., Mitthumsiri, W., Montaruli, T., Nan, Y.C., Pang, B.Y., Pattarakijwanich, P., Pei, Z.Y., Qi, M.Y., Ruffolo, D., Rulev, V., Sáiz, A., Shao, L., Shchegolev, O., Sheng, X.D., Shi, J.R., Song, H.C., Stenkin, Yu.V., Stepanov, V., Sun, Q.N., Sun, X.N., Sun, Z.B., Tam, P.H. T., Tang, Z.B., Tian, W.W., Wang, B.D., Wang, C., Wang, H., Wang, H.G., Wang, J.C., Wang, J.S., Wang, L.P., Wang, L.Y., Wang, R.N., Wang, W., Wang, X.G., Wang, X.J., Wang, X.Y., Wang, Y.D., Wang, Y.J., Wang, Y.P., Wang, Z., Wang, Z.H., Wang, Z.X., Wei, D.M., Wei, J.J., Wei, Y.J., Wen, T., Wu, C.Y., Wu, H.R., Wu, S., Wu, W.X., Wu, X.F., Xi, S.Q., Xia, J., Xia, J.J., Xiang, G.M., Xiao, G., Xiao, H.B., Xin, G.G., Xin, Y.L., Xing, Y., Xu, D.L., Xu, R.X., Xue, L., Yan, D.H., Yang, C.W., Yang, F.F., Yang, J.Y., Yang, L.L., Yang, M.J., Yang, R.Z., Yang, S.B., Yao, Y.H., Yao, Z.G., Ye, Y.M., Yin, L.Q., Yin, N., You, X.H., You, Z.Y., Yu, Y.H., Yuan, Q., Zeng, H.D., Zeng, T.X., Zeng, W., Zeng, Z.K., Zha, M., Zhai, X.X., Zhang, B.B., Zhang, H.M., Zhang, H.Y., Zhang, J.L., Zhang, J.W., Zhang, L., Zhang, L.X., Zhang, P.F., Zhang, P.P., Zhang, R., Zhang, S.R., Zhang, S.S., Zhang, X., Zhang, X.P., Zhang, Y., Zhang, Y.F., Zhang, Y.L., Zhao, B., Zhao, J., Zhao, L., Zhao, L.Z., Zhao, S.P., Zhao, X., Zheng, F., Zheng, Y., Zhou, B., Zhou, H., Zhou, J.N., Zhou, P., Zhou, R., Zhou, X.X., Zhu, C.G., Zhu, F.R., Zhu, H., Zhu, K.J., and Zuo, X.

Published
2022
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13. Spall response of medium-entropy alloy CrCoNi under plate impact.

Author

Cui, A.R., Hu, S.C., Zhang, S., Cheng, J.C., Li, Q., Huang, J.Y., and Luo, S.N.

Subjects
*DUCTILE fractures, *STRAIN rate, *BLAST effect, *SCANNING electron microscopy, *ALLOYS, *MAGNETIC entropy, *IMPACT loads, *EXTREME environments
Abstract

Dynamic mechanical properties of high-entropy alloys (HEAs) or medium-entropy alloys (MEAs) under high strain rate loading are of increasing interest for their promising applications in dynamic extreme environments. Here, spall damage of a coarse-grained CrCoNi MEA with a face-centered-cubic structure is firstly investigated by combining plate impact experiments, and molecular dynamics (MD) simulations. Yield strength, spall strength and spall-induced re-acceleration at different impact velocities are derived from free-surface velocity history measurements. In addition, soft-recovered samples after spallation are characterized with scanning electron microscopy and electron backscatter diffraction. The CrCoNi MEA exhibits the highest spall strength (around 4 GPa) among the MEAs/HEAs ever reported, with similar or better impact ductility compared to the reported MEAs/HEAs. With increasing impact velocity, the dominant damage mode of the CrCoNi MEA undergoes a gradual transition from intergranular damage, to mixed intergranular and intragranular damage, and then to intragranular damage. MD simulations reveal multiple deformation mechanisms (dislocation slip, stacking faults and twinning) for the CrCoNi MEA under impact loading, and show consistent spall damage mode transition with the experimental observations. The excellent combination of spall strength and ductility for the CrCoNi MEA is mainly attributed to the pronounced intragranular void nucleation followed by ductile void growth and coalescence, ensuring broad application prospects of the CrCoNi MEA in impact scenarios. [Display omitted] • Impact spall experiments on CrCoNi combined with MD simulations. • The highest spall strength of CrCoNi among HEAs/MEAs ever reported. • Inter-granular to intra-granular damage transition with increasing impact velocity. • Nano deformation twinning, and dislocation-tangling induced intra-granular damage. [ABSTRACT FROM AUTHOR]

Published
2023
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14. Deterministic simulation and assessment of air-recirculation performance of unidirectional-flow cleanrooms that incorporate age of air concept.

Author

Hu, S.C. and Chuah, Y.K.

Subjects
AIR flow, FLUID dynamics
Abstract

The airflow characteristics of a unidirectional cleanroom are largely determined by the airflow in the supply air plenum, the return air plenum and the return air shaft. A deterministic computational fluid dynamic model that incorporates fan-performance characteristics was applied to investigate and compare the air-recirculation performance of the two general designs of unidirectional-flow cleanrooms. Typical flow-resistance models of the various components in the air path were used in the simulation. Non-uniformity (NU) of supply air velocity (at the filter face), airflow parallelism (deflection angle, α), and the distribution of the mean age of air were computed for the two types of unidirectional-flow cleanrooms. The results show that the performance of the fan filter unit system is generally superior to that of an axial fan system in terms of NU, deflection angle of airflow in the working zone, and the air-change efficiency derived from the age of air distribution. It was also found that the three performance indices provide a good assessment of the air-recirculation performance of unidirectional-flow cleanrooms. [Copyright &y& Elsevier]

Published
2003
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15. Airflow characteristics in the outlet region of a vortex room air diffuser.

Author

Hu, S.C.

Subjects
AIR flow, DIFFUSERS (Fluid dynamics)
Abstract

For turbulent type clean rooms, terminal devices with high diffusion performance are required because the supply flow rate is usually provided only in the margin value. Vortex diffuser is generally assumed with high diffusion performance. However, its detailed technology data are not available. In this study, the airflow characteristics in the outlet region of a generic vortex diffuser were experimentally and numerically investigated. The zonal hybrid meshes were used in grid generation, where the regions around the disk and the guide vanes were meshed with tetrahedral cells, the inlet duct of the diffuser and the room space were meshed with hexahedra cells. The prismatic (or wedge) cells were used as the transitional cells to enable a change in cell type from hexahedra to tetrahedral. Such arrangement of the cell types has been found to be ideal for analysis of room air movement due to an air diffuser. Corresponding airflow measurements were conducted by using a three-dimensional ultrasonic anemometer. In the region very adjacent to the ceiling (0.05 m from the ceiling), the velocity magnitude was conducted by using a hot-wire anemometer. The results show that the flow pattern in the vicinity of outlet region for vortex diffuser is three-dimensional and highly turbulent. The experimental results were found to agree well with the results of the numerical analysis. The K value of the vortex diffuser investigated is in the range 2.1–2.3. It is concluded that the zonal hybrid meshes are well suited for analysis of the complicated flow structure issuing from the vortex diffuser. This study also shows that the vortex diffuser has a greater entrainment ratio than that of a multi-cone circular ceiling diffuser, due to the influence of the stationary twists guide vanes. Therefore, the vortex diffuser is a good option as a terminal device for turbulent type clean room. [Copyright &y& Elsevier]

Published
2003
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18. Failure and stress analysis of through-aluminum-nitride-via substrates during thermal reliability tests for high power LED applications.

Author

Tsai, M.Y., Lin, C.H., Chuang, K.F., Chang, Y.H., Wu, C.T., and Hu, S.C.

Subjects
*ALUMINUM nitride, *THERMAL shock, *HEAT resistant alloys, *THERMAL stresses, *SURFACE hardening, *THERMAL properties
Abstract

The objective of this study is to evaluate the reliability of through-aluminum-nitride-via (TAV) substrate by comparing those experimental results with the finite element simulation associated with measurements of aluminum nitride (AlN) strength and the thermal deformation of Cu/AlN bi-material plate. Two reliability tests for high-power LED (Light emitting diode) applications are used in this study: one is a thermal shock test from − 40 °C to 125 °C, the other is a pressure cook test. Also, the strength of AlN material is measured by using three-point bending test and point load test. The reliability results show that TAV substrates with thicker Cu films have delamination and cracks after the thermal shock test, but there are no failure being found after the pressure cook test. The determined strengths of AlN material are 350 MPa and 650 MPa from three-point bending test and point load test, respectively. The measurement of thermal deformation shows that the bi-material plate has residual-stress change after the solder reflow process, also indicating that a linear finite element model with the stress-free temperature at 80 °C can reasonably represent the stress state of the thermal shock test from − 40 °C to 125 °C without considering Cu nonlinear effect. The further results of the finite element simulation associated with strength data of AlN material have successfully described those of the reliability test. [ABSTRACT FROM AUTHOR]

Published
2016
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19. Mechanical design and analysis of direct-plated-copper aluminum nitride substrates for enhancing thermal reliability.

Author

Tsai, M.Y., Huang, P.S., Lin, C.H., Wu, C.T., and Hu, S.C.

Subjects
*COPPER compounds, *ALUMINUM nitride, *SUBSTRATES (Materials science), *RELIABILITY in engineering, *THERMAL conductivity, *SURFACE cracks, *THERMAL expansion
Abstract

Direct-plated-copper (DPC) aluminum nitride (AlN) substrate with a high thermal conductivity can provide a good alternative to conventional aluminum oxide (Al 2 O 3 ) substrate for better heat dissipation in the high-power module applications. However, the DPC AlN substrate suffers AlN crack initiating at the edge corner of Cu film during thermal cycling, due to the higher thermal expansion coefficient mismatch with copper material. This study is to resolve the AlN crack problem of DPC AlN substrate during thermal cycling and further to provide important parameters for mechanical design for ensuring good thermal reliability. Prior to the analysis, the out-of-plane deformation measurement of a Cu-AlN bi-material plate subject to the solder reflow heating and cooling is conducted for evaluating the material property of the plated Cu film and residual stresses induced from the manufacturing and solder reflow process. The results show the hysteresis and Bauschinger-like behaviors for the Cu-AlN plate during the solder-reflow heating and cooling. It is also found from the validated finite element simulation that the Cu-film wedge angle, length, and thickness significantly affect the maximum 1st principal stress of AlN during thermal cyclic loading, and the predicted failure mode and location based on the maximum 1st principal stress is consistent with experimental observation. The other factors, such as single-side and double-side Cu-film (sandwich-structure-alike) substrates, length difference of Cu films, and the nonlinear property of Cu film will be presented and discussed in detail as well. [ABSTRACT FROM AUTHOR]

Published
2015
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