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The spatially resolved ARPES (nanoARPES) is a development of conventional ARPES technique achieved with the focusing of light on the sample into the spot with submicron sizes. This development is used in research of essentially small samples, for example, heterostructures build of flakes of 2D materials, micro-crystals or polycrystalline samples, different crystal termination, domains in electronic structure. ANTARES is delivering the nanoARPES technique to user community since 2010, up to now the instrument was used with samples of various types, and that was useful to accumulate the specific experience. In this paper we report the current layout and actual performance of the ANTARES instrument at Synchrotron SOLEIL, as well as the most typical application areas. The most important and recent upgrades include focusing optics and in-operando setup. The new optical units deliver the increased flux on sample as well as the option to vary the photon energy. The in-operando setup offers the option of electrical connection to the sample being studied with nanoARPES, that promises various applications, where the most demanded now is the control of charge carrier density with applied voltage. This "gate-doping" is often applied to the heterostructures of 2D materials, that could be designed and build on purpose. The 2D heterostructures is probably the most typical field of application of the instrument, with or without in-operando option. At the same time the use case of the ANTARES instrument is still in the development by the realisation of new kinds of samples and of the new types of the experiments. • NanoARPES is a technique providing the angles resolved photoemission with spatial resolution. • ANTARES is a nanoARPES instrument launched about 10 years ago among the first instruments. • The instrument is delivering performance adequate for studies in various research areas. • Research of 2D materials and heterostructures, topological materials, superconductors, and other subjects. • In-operando electrical connections to the sample under measurement provides opportunity to study micro-devices. [ABSTRACT FROM AUTHOR]