1. Spectroscopy of rare gas clusters using VUV light from a free-electron-laser
- Author
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Matthias Hoener, Thomas Möller, H. Thomas, Tim Laarmann, Christoph Bostedt, Marion Kuhlmann, Karl-Heinz Meiwes-Broer, A. R. B. de Castro, E. Eremina, Thomas Fennel, H. Wabnitz, and Elke Plönjes
- Subjects
Radiation ,Argon ,Chemistry ,Infrared ,chemistry.chemical_element ,Condensed Matter Physics ,Laser ,Electron spectroscopy ,Atomic and Molecular Physics, and Optics ,Spectral line ,Electronic, Optical and Magnetic Materials ,law.invention ,X-ray photoelectron spectroscopy ,law ,Ionization ,Physics::Atomic and Molecular Clusters ,Physical and Theoretical Chemistry ,Atomic physics ,ddc:620 ,Spectroscopy - Abstract
We performed time-of-flight (TOF) spectroscopy on a jet of rare gas clusters using light pulses at λFEL = 32 nm produced by the FLASH VUV freeelectron-laser (Hamburg, Germany) with a maximum peak power density of about 3 × 1013 W/cm2 at the sample. Energy deposition on the clusters was found to be strongly dependent on lambda and much more efficient in the VUV than in the IR and visible spectral range. We observed multiple ionization of rare gas atoms coming from clusters; the latter fragment completely upon absorption of a single pulse. We have also measured high quality photoelectron spectra. Small angle soft X-ray scattering (SAXS) from a single light pulse (λFEL = 32 nm), was recorded with high signal to noise ratio for very large (Natoms 3 × 106) Argon clusters.
- Published
- 2007
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