1. CAPTURE CROSS-SECTIONS OF DEEP LEVELS IN SUPERLATTICES
- Author
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J. C. Bourgoin, S.L. Feng, Didier Stiévenard, and Dominique Vuillaume
- Subjects
Materials science ,Electron capture ,[PHYS.HIST]Physics [physics]/Physics archives ,Superlattice ,General Engineering ,Electron beam processing ,food and beverages ,Electronic band structure ,Spectroscopy ,Transient capacitance ,Molecular physics - Abstract
Transient capacitance spectroscopy can be used to characterize superlattices and the defects they contain. Here, we describe the measurement of electron capture cross-sections of deep levels introduced by electron irradiation. The variation of the capture rate versus temperature indicates that this capture occurs through a multiphonon emission process whose characteristics can be predicted in taking into account the superlattice band structure.
- Published
- 1987
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