1. Near-field imaging of the photocurrent on a patterned Au/GaAs interface with various wavelengths and bias
- Author
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J. Almeida, Renato Generosi, Giancarlo Faini, Carlo Coluzza, M. Spajer, Antonio Cricenti, and S. Davy
- Subjects
Photocurrent ,business.industry ,Chemistry ,Mean free path ,Schottky barrier ,Physics::Optics ,Near and far field ,Dielectric ,Condensed Matter::Mesoscopic Systems and Quantum Hall Effect ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,Condensed Matter::Materials Science ,Wavelength ,Optics ,Planar ,Charge carrier ,business ,Instrumentation - Abstract
This contribution presents an application of scanning near-field optical microscopy to the characterization of semi-conductors. It is based on the photocurrent mapping of a patterned Au/GaAs structure (Schottky barrier) under local illumination by the nanosource. The results obtained with different wavelengths, metallized or dielectric probes and different bias voltages exhibit photocurrent variations independent of the topography and induced by interface defects. Finally, from this study of a patterned planar structure, we propose a method to determine the mean free path of the charge carriers in the volume.
- Published
- 1999
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