Author: "Demarest, James J." / Publisher: asm international - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Demarest, James J."' showing total 4 results

Start Over Author "Demarest, James J." Publisher asm international

4 results on '"Demarest, James J."'

1. TEM Sample Fabrication of Sub 22 nm Three-Dimensional Test Structures

Author: Demarest, James J., additional
Published: 2013
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2. Highly Automated Transmission Electron Microscopy Tomography for Defect Understanding

Author: Demarest, James J., additional and Zhai, Hong-Ying, additional
Published: 2011
Full Text: View/download PDF

3. Start up of a Dual Beam FIB for Automatic STEM Sample Preparation

Author: Demarest, James J., additional and DeSouza, Zubin, additional
Published: 2009
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4. Advanced Defect Isolation Utilizing Image Intensity Analysis

Author: Demarest, James J., primary, Dunn, Derren, additional, Rue, Chad, additional, and Wang, Yun-Yu, additional
Published: 2007
Full Text: View/download PDF

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