1. Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering
- Author
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Jean Yves Duquesne, Institut des Nanosciences de Paris (INSP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Acoustique pour les nanosciences (INSP-E3), and Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Materials science ,III-V semiconductors ,Superlattice ,FOS: Physical sciences ,02 engineering and technology ,Surface finish ,Conductivity ,01 natural sciences ,Gallium arsenide ,interface roughness ,chemistry.chemical_compound ,Condensed Matter::Materials Science ,Thermal conductivity ,0103 physical sciences ,thermal conductivity ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,010306 general physics ,Condensed Matter - Materials Science ,Condensed matter physics ,Scattering ,Materials Science (cond-mat.mtrl-sci) ,aluminium compounds ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Thermal conduction ,gallium arsenide ,Electronic, Optical and Magnetic Materials ,chemistry ,[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] ,0210 nano-technology ,Order of magnitude ,semiconductor superlattices - Abstract
International audience; We present thermal conductivity measurements performed in three short-period (GaAs)_9(AlAs)_5 superlattices. The samples were grown at different temperatures, leading to different small scale roughness and broadening of the interfaces. The cross-plane conductivity is measured with a differential 3w method, at room temperature. The order of magnitude of the overall thermal conductivity variation is consistent with existing theoretical models, although the actual variation is smaller than expected.
- Published
- 2009
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