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4 results on '"Giuressi, D."'

1. The Design, Construction, Operation and Performance of the Belle II Silicon Vertex Detector

Author

Adamczyk, K., Aggarwal, L., Aihara, H., Aziz, T., Babu, V., Bacher, S., Bahinipati, S., Bari, M., Baroncelli, Ti., Baroncelli, To., Bassi, G., Batignani, G., Baudot, J., Bauer, A., Behera, P.K., Bergauer, T., Bertacchi, V., Bettarini, S., Bilka, T., Bosi, F., Bosisio, L., Bozek, A., Buchsteiner, F., Bulla, L., Casarosa, G., Cautero, G., Ceccanti, M., Chen, Y.Q., Chendvankar, S.R., Corona, L., Cristaudo, P., Czank, T., Das, S.B., Dash, N., de Marino, G., de Nuccio, M., de Pietro, G., Divekar, S.T., Dolejschi, P., Doležal, Z., Dujany, G., Dutta, D., Finck, C., Fischer, K., Forti, F., Friedl, M., Frühwirth, R., Gabrielli, A., Ganiev, E., Gfall, I., Giuressi, D., Gobbo, B., Halder, S., Hara, K., Hazra, S., Higuchi, T., Himori, S., Horiguchi, T., Irmler, C., Ishikawa, A., Jeon, H.B., Jin, Y., Joo, C., Kaleta, M., Kaliyar, A.B., Kandra, J., Kang, K.H., Kapusta, P., Kodyš, P., Kohriki, T., Kolwalkar, M.M., Komarov, I., Kumar, M., Kumar, R., Kvasnička, P., La Licata, C., Lalwani, K., Lanceri, L., Lautenbach, K., Leboucher, R., Lee, S.C., Lee, J.Y., Lettenbichler, J., Li, Y.B., Libby, J., Lueck, T., Maity, S., Mammini, P., Manfredi, R., Martel, L., Martini, A., Massaccesi, L., Mayekar, S.N., Mohanty, G.B., Mohanty, S., Grimaldo, J.A. Mora, Morii, T., Nakamura, K.R., Natkaniec, Z., Negishi, K., Nisar, N.K., Sato, N., Oberegger, M., Onuki, Y., Ostrowicz, W., Otani, F., Paladino, A., Palka, H., Paoloni, E., Park, H., Pernicka, M., Pilo, F., Pirker, J., Polat, L., Profeti, A., Rao, K.K., Rashevskaya, I., Resmi, P.K., Ripp-Baudot, I., Rizzo, G., Rout, N., Rozanska, M., Sahoo, D., Saito, T., Sandilya, S., Sasaki, J., Sato, Y., Schultschik, S., Schwanda, C., Seino, Y., Serrano, J., Koike, S., Shimasaki, T., Shimizu, N., Steininger, H., Stypula, J., Suzuki, J., Tanaka, S., Tanigawa, H., Taylor, G.N., Tenchini, F., Thalmeier, R., Thomas, R., Tiwary, R., Tsuboyama, T., Uematsu, Y., Valentan, M., Vitale, L., Volpi, M., Wan, K., Wang, Z., Watanabe, M., Watanuki, S., Watson, I.J., Webb, J., Werbycka, O., Wiechczynski, J., Williams, S., Würkner, B., Yin, H., Zanetti, A., Zani, L., Zhang, T., Adamczyk, K., Aggarwal, L., Aihara, H., Aziz, T., Babu, V., Bacher, S., Bahinipati, S., Bari, M., Baroncelli, Ti., Baroncelli, To., Bassi, G., Batignani, G., Baudot, J., Bauer, A., Behera, P. K., Bergauer, T., Bertacchi, V., Bettarini, S., Bilka, T., Bosi, F., Bosisio, L., Bozek, A., Buchsteiner, F., Bulla, L., Casarosa, G., Cautero, G., Ceccanti, M., Chen, Y. Q., Chendvankar, S. R., Corona, L., Cristaudo, P., Czank, T., Das, S. B., Dash, N., de Marino, G., De Nuccio, M., De Pietro, G., Divekar, S. T., Dolejschi, P., Dole??al, Z., Dujany, G., Dutta, D., Finck, C., Fischer, K. D., Forti, F., Friedl, M., Fr??hwirth, R., Gabrielli, A., Ganiev, E., Gfall, I., Giuressi, D., Gobbo, B., Halder, S., Hara, K., Hazra, S., Higuchi, T., Himori, S., Horiguchi, T., Irmler, C., Ishikawa, A., Jeon, H. B., Jin, Y., Joo, C., Kaleta, M., Kaliyar, A. B., Kandra, J., Kang, K. H., Kapusta, P., Kody??, P., Kohriki, T., Koike, S., Kolwalkar, M. M., Komarov, I., Kumar, M., Kumar, R., Kvasni??ka, P., La Licata, C., Lalwani, K., Lanceri, L., Lautenbach, K., Leboucher, R., Lee, S. C., Lee, J. Y., Lettenbichler, J., Li, Y. B., Libby, J., Lueck, T., Maity, S., Mammini, P., Manfredi, R., Martel, L., Martini, A., Massaccesi, L., Mayekar, S. N., Mohanty, G. B., Mohanty, S., Mora Grimaldo, J. A., Morii, T., Nakamura, K. R., Natkaniec, Z., Negishi, K., Nisar, N. K., Oberegger, M., Onuki, Y., Ostrowicz, W., Otani, F., Paladino, A., Palka, H., Paoloni, E., Park, H., Pernicka, M., Pilo, F., Pirker, J., Polat, L., Profeti, A., Rao, K. K., Rashevskaya, I., Resmi, P. K., Ripp-Baudot, I., Rizzo, G., Rout, N., Rozanska, M., Sahoo, D., Saito, T., Sandilya, S., Sasaki, J., Sato, N., Sato, Y., Schultschik, S., Schwanda, C., Seino, Y., Serrano, J., Shimasaki, T., Shimizu, N., Steininger, H., Stypula, J., Suzuki, J., Tanaka, S., Tanigawa, H., Taylor, G. N., Tenchini, F., Thalmeier, R., Thomas, R., Tiwary, R., Tsuboyama, T., Uematsu, Y., Valentan, M., Vitale, L., Volpi, M., Wan, K., Wang, Z., Watanabe, M., Watanuki, S., Watson, I. J., Webb, J., Werbycka, O., Wiechczynski, J., Williams, S., W??rkner, B., Yin, H., Zanetti, A., Zani, L., Zhang, T., Institut Pluridisciplinaire Hubert Curien (IPHC), Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Centre de Physique des Particules de Marseille (CPPM), Aix Marseille Université (AMU)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), and Belle-II SVD

Subjects
Physics - Instrumentation and Detectors, vertex detector, FOS: Physical sciences, BELLE, fabrication, Instrumentation for particle accelerators and storage rings - high energy (linear accelerators, High Energy Physics - Experiment, High Energy Physics - Experiment (hep-ex), Detector cooling and thermo-stabilization, Detector grounding, Front-end electronics for detector readout, Particle tracking detectors, Front-end electronics for detector-readout, [PHYS.HEXP]Physics [physics]/High Energy Physics - Experiment [hep-ex], [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], Solid state detectors, Detector alignment and calibration methods, Instrumentation, Instrumentation for particle accelerators and storage rings - high energy (linear accelerators, synchrotrons), activity report, detector: design, Mathematical Physics, Radiation damage to detector materials (solid state), synchrotrons), alignment, Instrumentation and Detectors (physics.ins-det), Si microstrip and pad detectors, Voltage distributions, vibration analysis etc), Particle tracking detector, Overall mechanics design (support structures and materials, quality, efficiency, Instrumentation for particle accelerators and storage rings - high energy, semiconductor detector: microstrip, Detector design and construction technologies and materials, performance
Abstract

The Silicon Vertex Detector of Belle II is a state-of-the-art tracking and vertexing system based on double-sided silicon strip sensors, designed and fabricated by a large international collaboration in the period 2012--2018. Since 2019 it has been in operation providing high quality data with a small number of defective channels (99%), a good signal-to-noise ratio (well in excess of 10 for all sensor configurations and tracks). Together with the good control over the alignment, these are all essential factors to achieve good tracking reconstruction and physics performance. In this extended paper we try to document all the aspects of the SVD challenges and achievements, in the spirit of providing information to the broader community and help the development of high quality detector systems, which are fundamental tools to carry out physics research., 199 pages, 152 figures

Published
2022
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2. Measurements of Beam Backgrounds in SuperKEKB Phase 2

Author

Z. Liptak, A. Paladino, L. Santelj, J. Schueler, S. Stefkova, H. Tanigawa, N. Tsuzuki, A. Aloisio, P. Ahlburg, P. Bambade, G. Bassi, M. Barrett, J. Baudot, T.E. Browder, G. Casarosa, G. Cautero, D. Cinabro, G. Claus, D. Cuesta, F. Di Capua, S. Di Carlo, J. Flanagan, A. Frey, B.G. Fulsom, Y. Funakoshi, M. Gabriel, R. Giordano, D. Giuressi, M. Goffe, K. Hara, O. Hartbrich, M.T. Hedges, D. Heuchel, N. Iida, T. Ishibashi, K. Jaaskelainen, D. Jehanno, S. de Jong, T. Kraetzschmar, C. La Licata, L. Lanceri, P. Leitl, P.M. Lewis, C. Marinas, C. Miller, H. Moser, K.R. Nakamura, H. Nakayama, C. Niebuhr, Y. Onuki, C. Pang, B. Paschen, I. Ripp-Baudot, G. Rizzo, J.M. Roney, H. Schreeck, B. Schwenker, F. Simon, M. Specht, B. Spruck, Y. Soloviev, M. Szelezniak, S. Tanaka, S. Terui, G. Tortone, T. Tsuboyama, Y. Uematsu, S.E. Vahsen, L. Vitale, H. Windel, Liptak, Z., Paladino, A., Santelj, L., Schueler, J., Stefkova, S., Tanigawa, H., Tsuzuki, N., Aloisio, A., Ahlburg, P., Bambade, P., Bassi, G., Barrett, M., Baudot, J., Browder, T. E., Casarosa, G., Cautero, G., Cinabro, D., Claus, G., Cuesta, D., Di Capua, F., Di Carlo, S., Flanagan, J., Frey, A., Fulsom, B. G., Funakoshi, Y., Gabriel, M., Giordano, R., Giuressi, D., Goffe, M., Hara, K., Hartbrich, O., Hedges, M. T., Heuchel, D., Iida, N., Ishibashi, T., Jaaskelainen, K., Jehanno, D., de Jong, S., Kraetzschmar, T., La Licata, C., Lanceri, L., Leitl, P., Lewis, P. M., Marinas, C., Miller, C., Moser, H., Nakamura, K. R., Nakayama, H., Niebuhr, C., Onuki, Y., Pang, C., Paschen, B., Ripp-Baudot, I., Rizzo, G., Roney, J. M., Schreeck, H., Schwenker, B., Simon, F., Specht, M., Spruck, B., Soloviev, Y., Szelezniak, M., Tanaka, S., Terui, S., Tortone, G., Tsuboyama, T., Uematsu, Y., Vahsen, S. E., Vitale, L., and Windel, H.

Subjects
Nuclear and High Energy Physics, Physics - Instrumentation and Detectors, FOS: Physical sciences, SuperKEKB, Instrumentation and Detectors (physics.ins-det), Accelerator background, High Energy Physics - Experiment, Beam background, High Energy Physics - Experiment (hep-ex), Belle II, Physics::Accelerator Physics, High Energy Physics::Experiment, Instrumentation
Abstract

The high design luminosity of the SuperKEKB electron-positron collider will result in challenging levels of beam-induced backgro\ unds in the interaction region. Understanding and mitigating these backgrounds is critical to the success of the Belle~II experi\ ment. We report on the first background measurements performed after roll-in of the Belle II detector, a period known as SuperKE\ KB Phase 2, utilizing both the BEAST II system of dedicated background detectors and the Belle II detector itself. We also repor\ t on first revisions to the background simulation made in response to our findings. Backgrounds measured include contributions f\ rom synchrotron radiation, beam-gas, Touschek, and injection backgrounds. At the end of Phase 2, single-beam backgrounds origina\ ting from the 4 GeV positron Low Energy Ring (LER) agree reasonably well with simulation, while backgrounds from the 7 GeV elect\ ron High Energy Ring (HER) are approximately one order of magnitude higher than simulation. We extrapolate these backgrounds for\ ward and conclude it is safe to install the Belle II vertex detector., Comment: 22 Pages, 33 figures

Published
2021
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3. The new FAST module: a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes

Author

Barbara A. J. Lechner, Daniel Tiemann, Carlo Dri, Jordi Fraxedas, Yves Fukamori, Cristina Africh, Fabian Knoller, Dario Giuressi, Giovanni Comelli, Mirco Panighel, Laerte L. Patera, Giulia Troiano, Giuseppe Cautero, Friedrich Esch, Dri, C., Panighel, M., Tiemann, D., Patera, L. L., Troiano, G., Fukamori, Y., Knoller, F., Lechner, B. A. J., Cautero, G., Giuressi, D., Comelli, G., Fraxedas, J., Africh, C., Esch, F., European Commission, Agencia Estatal de Investigación (España), Generalitat de Catalunya, Ministerio de Economía y Competitividad (España), Ministerio de Ciencia, Innovación y Universidades (España), German Research Foundation, and Alexander von Humboldt Foundation

Subjects
Microscope, Physics - Instrumentation and Detectors, Computer science, FOS: Physical sciences, 02 engineering and technology, Tracking (particle physics), 01 natural sciences, law.invention, Atomic force microscopy, FastAFM, FastSTM, Scanning probe microscopy, Scanning tunneling microscopy, Software portability, law, 0103 physical sciences, Instrumentation, 010302 applied physics, Surface diffusion, Condensed Matter - Materials Science, business.industry, Materials Science (cond-mat.mtrl-sci), Time resolution, Instrumentation and Detectors (physics.ins-det), 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Characterization (materials science), Scanning tunneling microscope, 0210 nano-technology, business, Computer hardware
Abstract

Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated., The FAST project has received funding from the EU-H2020 research and innovation programme under grant agreement no. 654360 NFFA-Europe. The ICN2 is funded by the CERCA program/ Generalitat de Catalunya. The ICN2 is supported by the Severo Ochoa program of MINECO (Grant SEV-2017-0706). We acknowledge S. Gottlieb, M. Fernández-Regúlez and F. Pérez-Murano for providing us with the silicon and block copolymer samples. Work at TUM was supported by the Deutsche Forschungsgemeinschaft (Research grants ES 349/1-2 and HE 3454/18-2). BAJL acknowledges a Research Fellowship from the Alexander von Humboldt Foundation and a Marie Skłodowska-Curie Individual Fellowship under grant ClusterDynamics (no. 703972) from the EU Horizon 2020 Programme.

Published
2019
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4. Development and tests of a new prototype detector for the XAFS beamline at Elettra Synchrotron in Trieste

Author

Joseph Niemela, N. Zampa, Claudio Piemonte, Dario Giuressi, Marco Bruschi, Nicola Zorzi, Luca Olivi, Gianluigi Zampa, L. P. Rignanese, Giuseppe Baldazzi, A. Sbrizzi, J. Bufon, Ralf Hendrik Menk, A. Rachevski, M. Ahangarianabhari, Pierluigi Bellutti, S. Schillani, Sergio Fabiani, Chiara Guazzoni, S. Ciano, Andrea Vacchi, V Garcia, G. Giacomini, Antonino Picciotto, M. Dos Santos, Maria Liz Crespo, Irina Rashevskaya, Andrea Castoldi, M. Gandola, Sergio Carrato, Andres Cicuttin, Giuseppe Bertuccio, Giuseppe Cautero, Fabiani, S., Ahangarianabhari, M., Baldazzi, Giuseppe, Bellutti, P., Bertuccio, G., Bruschi, M., Bufon, J., Carrato, S., Castoldi, A., Cautero, G., Ciano, S., Cicuttin, A., Crespo, M. L., Santos, M. Do, Gandola, M., Giacomini, G., Giuressi, D., Guazzoni, C., Menk, R. H., Niemela, J., Olivi, L., Picciotto, A., Piemonte, C., Rashevskaya, I., Rachevski, A., Rignanese, LUIGI PIO, Sbrizzi, Antonio, Schillani, S., Vacchi, A., Garcia, V. Villaverde, Zampa, G., Zampa, N., Zorzi, N., Dell'Oro S.,D'Angelo M.,Di Stefano M.,Cattani G.,Migliaccio M.,Agostini F.,Antolini C.,Bossa M.,Fragione G.,Pagnanini L., F. Agostini ... [et al.], Baldazzi, G., Bufon, Jernej, Carrato, Sergio, Cautero, Giuseppe, Ciano, Stefano, Giuressi, Dario, Menk, RALF HENDRIK, Niemela, JOSEPH JAMES, Piemonte, Claudio, Rashevskaya, Irina, Rignanese, L. P., Sbrizzi, A., Vacchi, Andrea, Zampa, Gianluigi, and Zampa, Nicola

Subjects
History, Materials science, Physics - Instrumentation and Detectors, Silicon drift detector, Physics::Instrumentation and Detectors, FOS: Physical sciences, Fluorescence, Education, law.invention, Physics and Astronomy (all), Optics, law, Synchrotron, X-ray absorption spectroscopy, X-ray diffraction, Silicon Drift Detector, ASIC, Digital Signal Processing, Silicon Drift Detector, Spectroscopy, Absorption (electromagnetic radiation), Monochromator, X-ray spectroscopy, sezele, business.industry, Detector, Instrumentation and Detectors (physics.ins-det), Fluorescence, Silicon Drift Detector, Synchrotron, Computer Science Applications, Beamline, business
Abstract

The XAFS beamline at Elettra Synchrotron in Trieste combines X-ray absorption spectroscopy and X-ray diffraction to provide chemically specific structural information of materials. It operates in the energy range 2.4-27 keV by using a silicon double reflection Bragg monochromator. The fluorescence measurement is performed in place of the absorption spectroscopy when the sample transparency is too low for transmission measurements or the element to study is too diluted in the sample. We report on the development and on the preliminary tests of a new prototype detector based on Silicon Drift Detectors technology and the SIRIO ultra low noise front-end ASIC. The new system will be able to reduce drastically the time needed to perform fluorescence measurements, while keeping a short dead time and maintaining an adequate energy resolution to perform spectroscopy. The custom-made silicon sensor and the electronics are designed specifically for the beamline requirements., Comment: Proceeding of the 6YRM 12th-14th Oct 2015 - L'Aquila (Italy). Accepted for publication on Journal of Physics: Conference Series

Published
2016
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