1. Proton distribution visualization in perovskite nickelate devices utilizing nanofocused X-rays
- Author
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Boyan Stoychev, Oleg Shpyrko, Richard Tran, Tae Joon Park, Xiaojing Huang, Zhen Zhang, Peter O. Sprau, Shriram Ramanathan, Yong S. Chu, Hai-Tian Zhang, Shyue Ping Ong, Qi Wang, Alex Frano, Nelson Hua, Ajith Pattammattel, Evgeny Nazaretski, Hanfei Yan, Mathew J. Cherukara, Ivan A. Zaluzhnyy, and Martin V. Holt
- Subjects
Diffraction ,Condensed Matter - Materials Science ,Valence (chemistry) ,Materials science ,Physics and Astronomy (miscellaneous) ,Absorption spectroscopy ,Proton ,Doping ,Valency ,Materials Science (cond-mat.mtrl-sci) ,FOS: Physical sciences ,Crystal structure ,Molecular physics ,Condensed Matter::Materials Science ,General Materials Science ,Condensed Matter::Strongly Correlated Electrons ,Perovskite (structure) - Abstract
We use a 30-nm x-ray beam to study the spatially resolved properties of a ${\mathrm{SmNiO}}_{3}$-based nanodevice that is doped with protons. The x-ray absorption spectra supported by density-functional theory simulations show partial reduction of nickel valence in the region with high proton concentration, which leads to the insulating behavior. Concurrently, x-ray diffraction reveals only a small lattice distortion in the doped regions. Together, our results directly show that the knob which proton doping modifies is the electronic valency and not the crystal lattice. The studies are relevant to ongoing efforts to disentangle structural and electronic effects across metal-insulator phase transitions in correlated oxides.
- Published
- 2021
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