11 results on '"Griffith, J. E"'
Search Results
2. Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
3. Dimensional metrology with scanning probe microscopes
4. Edge position measurement with a scanning probe microscope
5. Line profile measurement with a scanning probe microscope
6. Scanning probe metrology
7. Tip–sample forces in scanning probe microscopy in air and vacuum
8. Characterization of scanning probe microscope tips for linewidth measurement
9. A scanning tunneling microscope with a capacitance-based position monitor
10. Steps on Si(001)
11. Tunneling microscopy of steps on vicinal Ge(001) and Si(001) surfaces
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.