1. Negative-U System of Carbon Vacancy in 4H-SiC
- Author
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Tien Son, Nguyen, Trinh, Xuan Thang, Løvlie, L S, Svensson, B. G., Kawahara, K., Suda, J., Kimoto, T., Umeda, T., Isoya, J., Makino, T., Ohshima, T., Janzén, Erik, Tien Son, Nguyen, Trinh, Xuan Thang, Løvlie, L S, Svensson, B. G., Kawahara, K., Suda, J., Kimoto, T., Umeda, T., Isoya, J., Makino, T., Ohshima, T., and Janzén, Erik
- Abstract
Using electron paramagnetic resonance (EPR), energy levels of the carbon vacancy (V-C) in 4H-SiC and its negative-U properties have been determined. Combining EPR and deep-level transient spectroscopy we show that the two most common defects in as-grown 4H-SiC-the Z(1/2) lifetime-limiting defect and the EH7 deep defect-are related to the double acceptor (2 - vertical bar 0) and single donor (0 vertical bar +) levels of V-C, respectively., Funding Agencies|Swedish Energy Agency||Swedish Research Council VR/Linne Environment LiLI-NFM||Knut and Alice Wallenberg Foundation||Norwegian Research Council||JSPS|21226008
- Published
- 2012
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