1. Application of Image Recognition Algorithms for Statistical Description of Nano- and Microstructured Surfaces.
- Author
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Mărăscu, V., Chițescu, I., Barna, V., Ioniță, M. D., Lazea-Stoyanova, A., Mitu, B., and Dinescu, G.
- Subjects
IMAGE recognition (Computer vision) ,ALGORITHMS ,MICROSTRUCTURE ,SCANNING electron microscopy ,HOUGH transforms - Abstract
In this paper we propose a statistical approach for describing the self-assembling of sub-micronic polystyrene beads on silicon surfaces, as well as the evolution of surface topography due to plasma treatments. Algorithms for image recognition are used in conjunction with Scanning Electron Microscopy (SEM) imaging of surfaces. In a first step, greyscale images of the surface covered by the polystyrene beads are obtained. Further, an adaptive thresholding method was applied for obtaining binary images. The next step consisted in automatic identification of polystyrene beads dimensions, by using Hough transform algorithm, according to beads radius. In order to analyze the uniformity of the self-assembled polystyrene beads, the squared modulus of 2-dimensional Fast Fourier Transform (2- D FFT) was applied. By combining these algorithms we obtain a powerful and fast statistical tool for analysis of micro and nanomaterials with aspect features regularly distributed on surface upon SEM examination. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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