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In this paper, we study terahertz generation through optical rectification in reflection at normal incidence in a dielectric nonlinear crystal. We first analyze, with a nonlinear optical model, the sample parameters (thickness, absorption at both laser and terahertz wavelengths, etc.) for which a terahertz optical rectification reflection scheme is preferable to the common transmission scheme. Then, we report our experimental observations of a reflected terahertz signal generated at the surface of a ZnTe crystal. The reflected terahertz signal shares all the characteristics of a signal generated in transmission but is not limited by absorption losses in the crystal, thereby providing a broader bandwidth. At high pump laser power, the signal exhibits saturation, which is caused by the decrease of the nonlinear susceptibility due to photocarriers generated by two-photon absorption. This reflection scheme could be of great importance for terahertz microscopy of opaque materials like, e.g., humid samples or samples exhibiting strong absorption bands or to study samples for which the transmitted signal cannot be recorded. [ABSTRACT FROM AUTHOR]

We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells. [ABSTRACT FROM AUTHOR]