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The optical and electrical properties of pristine and Al doped ZnO thin films on quartz substrate deposited using pulsed laser deposition (PLD) technique were studied. Photoluminescence (PL) study shows that emission peak shifts towards lower wavelength, which confirms that band gap increases using Al doping. 3% and 6% Al doped ZnO films shows n-type behavior with 19.2 cm²/Vs and 9.59 cm²/Vs hall mobility. Carrier concentration and electrical resistivity of 3% and 6% Al doped films were -7.588 x 10+20 cm−3, 0.0004274 Ohm-cm and 28.75 cm−3,0.0005749 Ohmcm respectively. [ABSTRACT FROM AUTHOR]

Thin films of Zn1-xCdxO (x = 0, 0.05, 0.1) were deposited on glass substrate by pulsed laser deposition technique. The structural and optical properties of the prepared thin film samples were investigated using X-Ray Diffraction (XRD), Atomic force Microscopy, UV-visible and Photoluminescence spectroscopy. XRD results confirm that deposited films were oriented along c-axis and contain wurtzite crystalline symmetry. XRD and AFM result reveled that, the grain size decreases with increasing Cd concentration. UV-visible spectroscopy results reveal high transmittance for all the thin film samples. A reduction in the optical band gap energy with increasing Cd composition was observed through the Tauc plot method. [ABSTRACT FROM AUTHOR]

Various phases of yttrium manganese oxide (YMO) thin films have been synthesized on different substrates from a single target of h-YMnO3. It is observed that the phase stability and crystallinity of YMO thin films depend on the substrate used and oxygen partial pressure (OPP). (110) oriented and polycrystalline growth of h-YMnO3 are observed on the Al2O3 (0001) and NGO (110) substrates respectively, when grown in OPP ≈ 10-6 Torr. While for similar OPP value, growth of mixed phases (h-YMnO3 and o-YMn2O5) is observed on Si (001) substrate. Oriented growth of O-YMn2O5 phase film on Si (001) substrate is observed first time, when deposited at OPP value of 225 and 350 mTorr. +3 and mixed oxidation states (+3 and +4) of Mn were confirmed by x-ray photoelectron spectroscopy in pure YMnO3 phase and YMn2O5 phase respectively. [ABSTRACT FROM AUTHOR]