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Your search keyword '"SCANNING electron microscopes"' showing total 4 results

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Start Over You searched for: Descriptor "SCANNING electron microscopes" Remove constraint Descriptor: "SCANNING electron microscopes" Search Limiters Peer Reviewed Remove constraint Search Limiters: Peer Reviewed Topic deformations (mechanics) Remove constraint Topic: deformations (mechanics) Publisher american institute of physics Remove constraint Publisher: american institute of physics
4 results on '"SCANNING electron microscopes"'

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1. Spherical nanoindentation and Vickers microhardness study of the deformation of poled BaTiO3 single crystals.

2. Deformation and fracture behavior of composite structured Ti-Nb-Al-Co(-Ni) alloys.

3. In situ nanomechanical testing in focused ion beam and scanning electron microscopes.

4. Elevated temperature, nano-mechanical testing in situ in the scanning electron microscope.

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