1. Dielectrophoretic assembly of high-density arrays of individual graphene devices for rapid screening
- Author
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Ralph Krupke, A. Bonetti, Simone Dehm, Calogero Sciascia, Andrea C. Ferrari, Aravind Vijayaraghavan, Antonio Lombardo, Lombardo, Antonio [0000-0003-3088-6458], Ferrari, Andrea [0000-0003-0907-9993], and Apollo - University of Cambridge Repository
- Subjects
Materials science ,GRAPHITE ,DISPERSIONS ,Scanning electron microscope ,General Physics and Astronomy ,FOS: Physical sciences ,02 engineering and technology ,Carbon nanotube ,010402 general chemistry ,FILMS ,01 natural sciences ,law.invention ,bottom-up ,symbols.namesake ,RAMAN-SPECTROSCOPY ,law ,Electric field ,Mesoscale and Nanoscale Physics (cond-mat.mes-hall) ,General Materials Science ,Deposition (law) ,dielectrophoresis ,directed assembly ,Condensed Matter - Materials Science ,WALLED CARBON NANOTUBES ,Condensed Matter - Mesoscale and Nanoscale Physics ,business.industry ,Graphene ,graphene ,General Engineering ,Materials Science (cond-mat.mtrl-sci) ,Dielectrophoresis ,021001 nanoscience & nanotechnology ,OXIDE SHEETS ,0104 chemical sciences ,CHEMICAL-VAPOR-DEPOSITION ,ELECTRONIC-STRUCTURE ,LARGE-AREA ,Electrode ,symbols ,Optoelectronics ,0210 nano-technology ,Raman spectroscopy ,business - Abstract
We establish the use of dielectrophoresis for the directed parallel assembly of individual flakes and nanoribbons of few-layer graphene into electronic devices. This is a bottom-up approach where source and drain electrodes are prefabricated and the flakes are deposited from a solution using an alternating electric field applied between the electrodes. These devices are characterized by scanning electron microscopy, atomic force microscopy, Raman spectroscopy and electron transport measurements. They are shown to be electrically active and their current carrying capacity and subsequent failure mechanism is revealed. Akin to carbon nanotubes, we show that the dielectrophoretic deposition is self-limiting to one flake per device and is scalable to ultra-large-scale integration densities, thereby enabling the rapid screening of a large number of devices., Comment: ACS Nano, (2009) In Press
- Published
- 2009