1. An Integrating Photometer for X‐Ray Intensity Measurements
- Author
-
A. Many, B. S. Fraenkel, E. Alexander, and I. T. Steinberger
- Subjects
Physics ,Diffraction ,Reproducibility ,Mechanical counter ,Spots ,business.industry ,Photometer ,Ray ,law.invention ,Photometry (optics) ,Optics ,law ,Optoelectronics ,business ,Instrumentation ,Electronic circuit - Abstract
X‐ray diffraction spots on films vary in area and are uneven in density. An instrument is described, which, after calibration against a standard intensity scale imprinted on the film, scans the spot by a light ray, and transforms transmitted light pulses into linear functions of intensity by electronic means. A figure, proportional to the intensity of the spot, is obtained on a mechanical counter. The integrating process is fully automatic, and measurement of one spot takes about a minute. Reproducibility depends on the relative intensity of the measured spot, and can be raised up to 1 percent.
- Published
- 1953