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X-ray scatter dark field imaging based on the Talbot-Lau interferometer allows for the measurement of ultra–small angle x-ray scattering. The latter is related to the variations in the electron density in the sample at the sub- and micron-scale. Therefore, information on features of the object below the detector resolution can be revealed. In this article, it is demonstrated that scatter dark field imaging is particularly adapted to the study of a material’s porosity. An interferometer, optimized for x-ray energies around 50 keV, enables the investigation of aluminum welding with conventional laboratory x-ray tubes. The results show an unprecedented contrast between the pool and the aluminum workpiece. Our conclusions are confirmed due to micro-tomographic three-dimensional reconstructions of the same object with a microscopic resolution.

In weakly absorbing materials such as polymers and soft tissue, x-ray phase sensitive imaging methods can provide substantially enhanced contrast compared to classical, absorption based radiography. For specific applications, the latter can be applied in a dual energy scheme that helps to identify, discriminate and/or quantify materials. In this paper, we report on a new method that combines the idea of dual energy with x-ray phase contrast imaging and thus provides material sensitivity among poor absorbers. The dual energy modality cannot be applied in common phase contrast imaging schemes because of their demand for limited bandwidth or even monochromatic x-ray sources. Our new interferometric method based on diffraction gratings can overcome this shortcoming and thus simultaneously deliver x-ray phase contrast images for two distinct x-ray energy intervals. It has been shown that high quality images can be obtained with the dual energy phase setup. Energy spectra with 40 kV and 70 kV were applied to ob...

The sensitivity of x-ray radiographic images, meaning the minimal detectable change in the thickness or in the index of refraction of a sample, is directly related to the uncertainty of the measurement method. In the following work, we report on the recent development of quantitative descriptions for the stochastic error of grating-based differential phase contrast imaging (DPCi). Our model includes the noise transfer characteristics of the x-ray detector and the jitter of the phase steps. We find that the noise in DPCi depends strongly on the phase stepping visibility and the sample properties. The results are supported by experimental evidence acquired with our new instrument with a field of view of 50x70 mm(2). Our conclusions provide general guidelines to optimize grating interferometers for specific applications and problems.