6 results on '"Off, J."'
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2. Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
3. Strain and composition dependence of the E1(TO) mode in hexagonal Al1−xInxN thin films
4. Photoelectric properties of the 0.44 eV deep level-to-band transition in gallium nitride investigated by optical admittance spectroscopy
5. Characterization of InGaN thin films using high-resolution x-ray diffraction
6. Intra- and interwell transitions in GaInN/GaN multiple quantum wells with built-in piezoelectric fields
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