1. Precise resistance measurement of quantum anomalous Hall effect in magnetic heterostructure film of topological insulator
- Author
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Shuji Nakamura, Atsushi Tsukazaki, Masashi Kawasaki, Minoru Kawamura, Masataka Mogi, Yuma Okazaki, Ryutaro Yoshimi, Yoshinori Tokura, Shintaro Takada, Kei S. Takahashi, Nobu-Hisa Kaneko, and Takehiko Oe
- Subjects
010302 applied physics ,Materials science ,Physics and Astronomy (miscellaneous) ,Condensed matter physics ,Doping ,Quantum anomalous Hall effect ,Heterojunction ,02 engineering and technology ,Condensed Matter::Mesoscopic Systems and Quantum Hall Effect ,021001 nanoscience & nanotechnology ,01 natural sciences ,Magnetic field ,Condensed Matter::Materials Science ,Quantization (physics) ,Topological insulator ,0103 physical sciences ,0210 nano-technology ,Drain current - Abstract
The accuracy of Hall resistance in the quantum anomalous Hall effect has been studied at zero magnetic field using Crx(Bi,Sb) 2 − x Te3-based magnetic heterostructure films of topological insulators. The measured deviation of the Hall resistance from its theoretical value h / e 2 was less than 2 ppm when the source drain current was 30 nA. This result has verified that the quantization of the Hall resistance is very accurate in the magnetic heterostructure films and in the previously reported uniformly doped films.
- Published
- 2020
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