10 results on '"LING, C. H."'
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2. Origin of temperature-sensitive hole current at low gate voltage regime in ultrathin gate oxide
3. A model for minority carrier lifetime variation in the oxide–silicon structure following 253.7 nm ultraviolet irradiation
4. An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
5. Structural and electrical studies of radio frequency sputtered hydrogenated amorphous silicon carbide films
6. Study of rf-sputtered yttrium oxide films on silicon by capacitance measurements
7. Structural properties of amorphous silicon carbide films by plasma-enhanced chemical vapor deposition
8. Trap generation at Si/SiO2interface in submicrometer metal‐oxide‐semiconductor transistors by 4.9 eV ultraviolet irradiation
9. Analysis of the variation in the field‐dependent behavior of thermally oxidized tantalum oxide films
10. Observation of a high‐resistance to a low‐resistance transition in a silicon bicrystal
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