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FexSey films were prepared on GaAs(001) substrates by a selenization of Fe films using molecular beam epitaxy equipment. Structural and magnetic properties of FexSey thin films during their selenization process were studied. The selenized films obtained consisted of polycrystalline grains of 100–700 nm. A magnetic anisotropy of in-plane/perpendicular to the films was weakened by increasing the selenization ratio of the samples, which was interesting in contrast to the fact that the grain size of the films became larger.

FeSe thin films were prepared on GaAs(100) substrate by the selenization of Fe films using molecular-beam epitaxy. FeSe compound thin films were obtained at a substrate temperature above 380 degrees C. From the depth profiles of Fe and Se in the selenized film measured by Auger electron spectroscopy, it was confirmed that an FeSe layer with a constant ratio of Fe/Se was formed. The measured composition ratio of Fe/Se in the film was 1/3. It was different from the composition in Fe3Se4 or Fe7Se8, which is a stable bulk FeSe compound. From the measured M-H curve, it was found that the obtained FeSe film consisted of two phases with different magnetic properties. (C) 1997 American Institute of Physics.

p‐type GaAs with doping levels of up to 5.8×1020 cm−3 has been grown by metalorganic molecular‐beam epitaxy (MOMBE) using carbon (C) as a dopant. The mobility and minority‐carrier diffusion length of the C‐doped MOMBE layers were comparable to those of Be‐doped MBE layers. The diffusion coefficient of C at 900 °C was estimated to be 6×10−15 cm2 /s which is about two orders of magnitude less than that of Be (1×10−12 cm2 /s). In addition, the lattice constant of C‐doped GaAs was found to be 5.6533 A which completely matches that of the substrate, while the lattice constant of Be‐doped GaAs decreases to 5.6467 A at a doping level of 2×1020 cm−3 as reported by Lievin et al. [Inst. Phys. Conf. Ser. No. 79, 595 (1985)].