4 results on '"Iiyama, M."'
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2. A noncontact cryogenic microwave measurement system for superconducting device characterization
3. Allinsitudeposition and characterization of YBa2Cu3O7−xthin films by low‐energy electron diffraction and low‐energy ion scattering spectroscopy
4. Low-energy ion scattering spectroscopy observations of c-axis-oriented YBa2Cu3O7−x thin films: Effects of in-vacuum annealing
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