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10. Time-dependent current-voltage characteristics of Al/p-CdTe/Pt x-ray detectors

Author

Leonardo Abbene, Gaetano Gerardi, A.A. Turturici, Fabio Principato, Principato, F, Gerardi, G, Turturici, A A, and Abbene, L

Subjects
X-ray spectroscopy, Schottky contact, X-ray and gamma ray detectors, Materials science, business.industry, Settore FIS/01 - Fisica Sperimentale, Contact resistance, X-ray detector, General Physics and Astronomy, Schottky diode, Biasing, Thermionic emission, Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin), Settore FIS/03 - Fisica Della Materia, CdTe detector, Polarization, Optoelectronics, Gamma spectroscopy, business, Polarization (electrochemistry)
Abstract

Current-voltage (I-V) characteristics of Schottky Al/p-CdTe/Pt detectors were investigated in dark and at different temperatures. CdTe detectors with Al rectifying contacts, very appealing for high resolution x-ray and gamma ray spectroscopy, suffer from bias-induced polarization phenomena which cause current increasing with the time and severe worsening of the spectroscopic performance. In this work, we studied the time-dependence of the I-V characteristics of the detectors, both in reverse and forward bias, taking into account the polarization effects. The I-V measurements, performed at different time intervals between the application of the bias voltage and the measurement of the current, and the measured current transients show as the electrical instability manifests itself even in time intervals shorter (i.e.

Published
2012
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